会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Confocal measuring microscope with automatic focusing
    • 共焦测量显微镜具有自动对焦
    • US4844617A
    • 1989-07-04
    • US146046
    • 1988-01-20
    • Herman F. KeldermanMichael E. FeinAlan E. LohArnold AdamsArmand P. Neukermans
    • Herman F. KeldermanMichael E. FeinAlan E. LohArnold AdamsArmand P. Neukermans
    • G01B9/04G01J3/02G01J3/18G01J3/28G02B21/00
    • G01B9/04G01J3/02G01J3/0229G01J3/0243G01J3/0248G02B21/006G01J3/18G01J3/2803
    • A confocal measuring microscope including a spectrometer and autofocus system sharing common optical elements in which the intensity of light entering the spectrometer from a particular spot on a workpiece is used to determine a focus condition for the same spot. The microscope includes at least one light source, an illumination field stop, and a microscope objective that images the stop onto a workpiece supported by a movable platform. The objective also forms an image of the illuminated portion of the object. An aperture in a second stop and intersecting the image plane passes light from part of the image to the spectrometer, while viewing optics are used to view the image. In one embodiment, a detector is placed at the zero order position, while in another embodiment a laser is placed at the zero order position. In the later embodiment an integrator circuit connected to the detector array replaces the zero order detector for measuring the total intensity of light entering the spectrometer. A best focus condition occurs when the total intensity is a maximum for a positive confocal configuration, i.e. where source and detector are on opposite sides of their respective field stops from said workpiece, and a minimum for a negative confocal configuration, i.e. where the source and workpiece are on the same side of a reflective illumination field stop with aperture. The movable platform may be scanned axially to achieve and maintain object focus as the object is scanned transversely.
    • 共焦测量显微镜包括分光光度计和自动聚焦系统,共享共同的光学元件,其中使用从工件上的特定光点进入光谱仪的光的强度来确定同一光斑的聚焦条件。 显微镜包括至少一个光源,照明场停止器和将停止点图像到由可移动平台支撑的工件上的显微镜物镜。 该目的也形成对象的被照亮部分的图像。 在第二个停止点和与图像平面相交的孔将光从图像的一部分传递到光谱仪,而观察光学元件用于观看图像。 在一个实施例中,检测器被放置在零级位置,而在另一个实施例中,激光被放置在零级位置。 在后面的实施例中,连接到检测器阵列的积分器电路取代了用于测量进入光谱仪的光的总强度的零级检测器。 当总强度为正共焦配置的最大值时,即源和检测器位于其与所述工件相应的场停止位置的相对侧上,并且对于共焦焦配置为最小,即源和 工件位于具有孔径的反射照明场停止的同一侧。 当物体被横向扫描时,可移动平台可被轴向地扫描以实现和维持物体焦点。