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    • 2. 发明授权
    • Method and apparatus for determining the location of points on a three
dimensional thing
    • 用于确定三维物体上的点的位置的方法和装置
    • US4430796A
    • 1984-02-14
    • US345806
    • 1982-02-03
    • Haruki Nakagawa
    • Haruki Nakagawa
    • G01B21/00G01B7/004G01B7/28G01B21/04G01B21/20
    • G01B7/004G01B21/04G01B7/28
    • This invention discloses a method and an apparatus in which coordinates of points on a plurality of sections of a three dimensional thing are measured based on a plurality of different coordinate systems and then transformed into those in a single reference coordinate system. The coordinates of the section adjacent to the reference section are transformed into coordinates in the reference coordinate system which is used to measure the coordinates of the points on the reference section through the following processes: measuring the coordinates of at least three reference points on the overlapped portion between the reference section and the adjacent section based on the reference coordinate system and the second coordinate system which is used to measure the coordinates of the points on the adjacent section; determining the positional relation between the two systems above using the measured coordinates of the reference points; and then, transforming the coordinates of the points on the adjacent section defined by the second coordinate system into those in the reference section using the above positional relation. The coordinates of points in the other sections are subjected to similar processes to express them in the reference system.
    • 本发明公开了一种方法和装置,其中,基于多个不同的坐标系,测量三维物体的多个部分上的点的坐标,然后变换为单个参考坐标系中的点的坐标。 与参考部分相邻的部分的坐标被转换为参考坐标系中的坐标,该坐标系用于通过以下过程来测量参考部分上的点的坐标:测量重叠的至少三个参考点的坐标 基于参考坐标系的参考部分和相邻部分之间的部分,以及用于测量相邻部分上的点的坐标的第二坐标系; 使用所测量的参考点的坐标确定上述两个系统之间的位置关系; 然后使用上述位置关系将由第二坐标系定义的相邻部分上的点的坐标变换成参考部分中的点的坐标。 对其他部分的点的坐标进行类似的处理,以便在参考系统中表达它们。