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1. 发明授权

US4850211A Method of controlling elimination of roll eccentricity in rolling mill and device for carrying out the method 失效
标题翻译：轧机轧辊偏心度控制方法及其实施方法
公开(公告)号：US4850211A
公开(公告)日：1989-07-25
申请号：US43546
申请日：1987-04-28
申请人： Kunio Sekiguchi , Hajime Kai , Masaru Miyokawa , Kenji Ueda
发明人： Kunio Sekiguchi , Hajime Kai , Masaru Miyokawa , Kenji Ueda
IPC分类号： B21B37/18 , B21B37/00 , B21B37/66
CPC分类号： B21B37/66
摘要： A rolling load signal is detected during a few rotations of a top and a bottom backup roll at different detection time points at which the top and bottom backup rolls are out of phase from each other and then are analyzed by Fourier analysis so as to detect the amplitudes and phases of the eccentricity of the top and bottom backup rolls separately, whereby the roll gap is controlled and the separately detected eccentricity of the top and bottom backup rolls is thus obtained. Even when there is a difference in roll eccentricity frequency between the top and bottom backup rolls and even when external disturbances exist due to the aging of the roll eccentricity and to the estimated errors of the mill constant M and the plasticity coefficient Q of a piece of metal to be rolled, the roll eccentricity can be suitably adjusted so that the roll eccentricity can be detected with a high degree of accuracy and then eliminated.
摘要翻译：在顶部和底部支撑辊彼此不同相的不同检测时间点的顶部和底部支撑辊的几次旋转期间检测到滚动负载信号，然后通过傅里叶分析来分析，以便检测单独的顶部和底部支承辊的偏心度的振幅和相位，由此控制辊间隙，从而获得单独检测到的顶部和底部支承辊的偏心率。即使当顶部和底部支承辊之间的辊偏心率存在差异，并且即使当由于辊偏心率的老化导致的外部干扰以及轧机常数M的估计误差和一块的可塑性系数Q 要轧制的金属，可以适当地调节辊偏心度，使得可以以高精度检测辊偏心度，然后消除。

2. 发明授权

US4813021A Semiconductor memory device with delayed precharge signals 失效
标题翻译：具有延迟预充电信号的半导体存储器件
公开(公告)号：US4813021A
公开(公告)日：1989-03-14
申请号：US735724
申请日：1985-05-20
申请人： Hajime Kai , Kiyofumi Ochii
发明人： Hajime Kai , Kiyofumi Ochii
IPC分类号： G11C11/417 , G11C5/06 , G11C7/12 , G11C7/00
CPC分类号： G11C7/12 , G11C5/063
摘要： A semiconductor memory device includes memory cells arranged in a matrix array, a plurality of pairs of bit lines, each pair of bit lines being connected to the memory cells on the same column, a plurality of pairs of switching MOS transistors, each pair of MOS transistors being connected between a power source terminal and each pair of bit lines, and a precharge control circuit for supplying a control signal to the gates of the switching MOS transistors. This memory device further includes delay circuits connected in series with each other, and the delay circuits delay the control signal from the precharge control circuit and supply the control signal to the gates of the switching MOS transistors at different timings.
摘要翻译：半导体存储器件包括以矩阵阵列布置的存储单元，多对位线，每对位线连接到同一列上的存储单元，多对开关MOS晶体管，每对MOS 连接在电源端子和每对位线之间的晶体管，以及用于向开关MOS晶体管的栅极提供控制信号的预充电控制电路。该存储装置还包括彼此串联连接的延迟电路，并且延迟电路延迟来自预充电控制电路的控制信号，并以不同的定时将控制信号提供给开关MOS晶体管的栅极。

3. 发明授权

US4763273A Apparatus for detecting eccentricity of roll in rolling mill 失效
标题翻译：检测轧机轧辊偏心率的装置
公开(公告)号：US4763273A
公开(公告)日：1988-08-09
申请号：US889265
申请日：1986-07-25
申请人： Yoshiharu Anbe , Toshimi Mineura , Hajime Kai , Sumiyasu Kodama , Takao Dobashi
发明人： Yoshiharu Anbe , Toshimi Mineura , Hajime Kai , Sumiyasu Kodama , Takao Dobashi
IPC分类号： B21B37/66 , B21B37/00
CPC分类号： B21B37/66
摘要： An apparatus for detecting a roll eccentricity in a rolling mill includes mark pulse generators each provided for upper and lower rolls from which an eccentricity is to be detected, the mark pulse generator generating one pulse per one rotation of the roll, sampling pulse generators each provided for the upper and lower rolls for generating n pulses per one rotation of the roll, and a rolling pressure detector for the rolls.After a mark pulse is generated, the rolling pressure signal outputted from the rolling pressure detector is first stored at the output timings of the sampling pulses. Next, a difference of the rolling pressure signals outputted from the rolling pressure detector is subjected to a Fourier transformation, the rolling pressure signals corresponding to those obtained after and before the relative phases of the upper and lower rolls are changed. The resultant values together with rotary angles and relative phases are used to output an eccentricity quantities independently for each roll.
摘要翻译：一种用于检测轧机中的轧辊偏心度的装置包括标记脉冲发生器，每个标记脉冲发生器设置用于要检测偏心的上辊和下辊，标记脉冲发生器每一转一圈产生一个脉冲，每个提供采样脉冲发生器用于每卷一卷旋转产生n个脉冲的上辊和下辊以及用于轧辊的轧制压力检测器。在产生标记脉冲之后，首先在采样脉冲的输出定时存储从轧制压力检测器输出的轧制压力信号。接下来，对从轧制压力检测器输出的轧制压力信号的差进行傅立叶变换，与上下辊的相对相位之间和之后获得的轧制压力信号相对应。所得到的值与旋转角度和相对相位一起用于为每个辊子独立地输出偏心量。

4. 发明申请

US20070257337A1 Shield substrate, semiconductor package, and semiconductor device 审中-公开
标题翻译：屏蔽衬底，半导体封装和半导体器件
公开(公告)号：US20070257337A1
公开(公告)日：2007-11-08
申请号：US11713098
申请日：2007-03-02
申请人： Shinichiro Yanase , Hajime Kai , Makoto Funazuka , Toshiaki Matsumoto
发明人： Shinichiro Yanase , Hajime Kai , Makoto Funazuka , Toshiaki Matsumoto
IPC分类号： H01L23/552
CPC分类号： H01L23/552 , H01L2924/0002 , H01L2924/00
摘要： To provide a shield substrate, semiconductor package and semiconductor device which can give improved resistance to thermal stress. The shield substrate according to this invention is provided with a conductive film on which slits each having a shape through which electromagnetic wave noise does not leak are formed. These slits are rectangular slits formed in an array on the conductive film. In accordance with this configuration, the length of the straight line on the conductive film is interrupted by the slits, and thermal stress generated on the conductive film is interrupted by the slits. Thus, the thermal stress on the conductive film will not be excessively concentrated at one point, thereby preventing crack or flake-off from occurring on the conductive film.
摘要翻译：提供可以提供改善的耐热应力的屏蔽衬底，半导体封装和半导体器件。根据本发明的屏蔽基板设置有导电膜，在该导电膜上形成有各自具有电磁波噪声不会泄漏的形状的狭缝。这些狭缝是在导电膜上形成为阵列的矩形狭缝。根据该结构，导电膜上的直线的长度被狭缝中断，导电膜上产生的热应力被狭缝中断。因此，导电膜上的热应力在一点处不会过度集中，从而防止在导电膜上发生裂纹或剥落。

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