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    • 1. 发明申请
    • METHODS FOR THE FABRICATION OF BACK CONTACTED PHOTOVOLTAIC CELLS
    • 用于制造反接触光伏电池的方法
    • WO2013020867A1
    • 2013-02-14
    • PCT/EP2012/065013
    • 2012-08-01
    • IMECHORZEL, JörgURENA DE CASTRO, Angel
    • HORZEL, JörgURENA DE CASTRO, Angel
    • H01L31/0224H01L21/768
    • H01L21/76898H01L31/02245H01L31/022458H01L31/068H01L31/0682Y02E10/547
    • A method is described for fabricating back-contacted photovoltaic cells using a crystalline semiconductor substrate of a first conductivity type (e.g. n-type), the substrate having at the front side a p-type emitter region 32. Electrical contacts 34 are formed through the substrate as follows: at the rear side of the substrate 31 a dielectric layer 33 is formed, comprising a pattern of openings at predetermined locations where the electrical contacts are to be made; a layer 36 comprising a predetermined amount of a dopant metal of the second type, e.g. Al, is formed at least at the predetermined locations; the substrate is then heated to a peak temperature substantially higher than the eutectic temperature of the semiconductor-material/dopant-metal alloy, leading to the formation of a melt comprising the dopant metal and the semiconductor material. Finally, the substrate is cooled to ambient temperature, thereby forming electrical contacts comprising eutectic regions 34 extending from the rear side of the substrate at least to the emitter region 32. In alternative versions the eutectic can be etched away, leaving vias.
    • 描述了使用第一导电类型(例如n型)的晶体半导体衬底制造背接触光伏电池的方法,该衬底在正面具有p型发射极区32.电触点34通过 基板如下:在基板31的后侧,形成电介质层33,其包括在要形成电触点的预定位置处的开口图案; 层36,其包含预定量的第二类型的掺杂金属,例如。 至少形成在预定位置处; 然后将衬底加热到​​明显高于半导体材料/掺杂剂 - 金属合金的共晶温度的峰值温度,导致形成包括掺杂剂金属和半导体材料的熔体。 最后,将衬底冷却至环境温度,从而形成包括从衬底的后侧至少延伸到发射极区域32的共晶区域34的电触点。在替代形式中,共晶体可被蚀刻掉,留下通孔。
    • 2. 发明申请
    • SEMICONDUCTOR DEVICE WITH SELECTIVELY DIFFUSED REGIONS
    • 具有选择性扩张区域的半导体器件
    • WO1998028798A1
    • 1998-07-02
    • PCT/EP1997007246
    • 1997-12-22
    • IMEC VZWHORZEL, JörgHONORE, MiaNIJS, JohanSZLUFCIK, Jozef
    • IMEC VZW
    • H01L31/0224
    • H01L31/1804H01L31/022425Y02E10/547Y02P70/521
    • The present invention describes a method of manufacturing a semiconductor device, comprising a semiconductor substrate (2) in the shape of a slice, the method comprising the steps of: step 1) selectively applying a pattern of a solids-based dopant source to a first major surface of said semiconducting substrate (2); step 2) diffusing the dopant atoms from said solids-based dopant source into said substrate (2) by a controlled heat treatment step in a gaseous environment surrounding said semi-conducting substrate (2), the dopant from said solids-based dopant source diffusing directly into said substrate (2) to form a first diffusion region (12) and, at the same time, diffusing said dopant from said solids-based dopant source indirectly via said gaseous environment into said substrate (2) to form a second diffusion region (15) in at least some areas of said substrate (2) not covered by said pattern; and step 3) forming a metal contact pattern (20) substantially in alignment with said first diffusion region (12) without having etched said second diffusion region (15) substantially.
    • 本发明描述了一种制造半导体器件的方法,包括半导体衬底(2),其形状为切片,该方法包括以下步骤:步骤1)选择性地将基于固体的掺杂剂源的图案施加到第一 所述半导体衬底(2)的主表面; 步骤2)通过在围绕所述半导体衬底(2)的气态环境中的受控热处理步骤将掺杂剂原子从所述基于固体的掺杂剂源扩散到所述衬底(2)中,所述基于固体的掺杂剂源扩散 直接进入所述衬底(2)以形成第一扩散区(12),并且同时将所述掺杂剂从所述固体基掺杂剂源经由所述气态环境间接扩散到所述衬底(2)中以形成第二扩散区 (15)在所述衬底(2)的至少一些未被所述图案覆盖的区域中; 和步骤3)形成基本上与所述第一扩散区域(12)对准的金属接触图案(20),而没有基本上蚀刻所述第二扩散区域(15)。