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1. 发明授权

US06557133B1 Scaling logic for event based test system 失效
标题翻译：基于事件的测试系统的扩展逻辑
公开(公告)号：US06557133B1
公开(公告)日：2003-04-29
申请号：US09286226
申请日：1999-04-05
申请人： Glen A. Gomes
发明人： Glen A. Gomes
IPC分类号： G01R3128
CPC分类号： G01R31/31922 , G01R31/3191 , G01R31/31937
摘要： An event based test system having a scaling function for freely changing the timings of events for generating test signals for testing an electronics device under test (DUT) in proportion to a scale factor. The event based test system includes an event memory for storing timing data of each event formed with an integer multiple of a reference clock period and a fraction of the reference clock period wherein the timing data represents a time difference between two adjacent events, an address sequencer for generating address data for accessing the event memory, a summing and scaling logic for summing the timing data and modifying the timing data based on the scale factor to produce an overall time of each event relative to a predetermined reference point, and an event generator for generating each event based on the overall time.
摘要翻译：一种基于事件的测试系统，具有缩放功能，用于自由地改变用于产生用于测试被测电子设备（DUT）的测试信号的事件的定时，与比例因子成比例。基于事件的测试系统包括事件存储器，用于存储以参考时钟周期的整数倍和参考时钟周期的一部分形成的每个事件的定时数据，其中定时数据表示两个相邻事件之间的时间差，地址定序器用于产生用于访问所述事件存储器的地址数据，用于对所述定时数据求和并基于所述比例因子修改所述定时数据以产生相对于预定参考点的每个事件的总时间的加法和缩放逻辑，以及用于根据总体时间生成每个事件。

2. 发明授权

US06668331B1 Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory 失效
标题翻译：用于连续产生事件以建立大于可由事件存储器中的指定数据位表示的总延迟时间的装置和方法
公开(公告)号：US06668331B1
公开(公告)日：2003-12-23
申请号：US09535031
申请日：2000-03-24
申请人： Glen A. Gomes , Anthony Le , James Alan Turnquist , Rochit Rajusman , Shigeru Sugamori
发明人： Glen A. Gomes , Anthony Le , James Alan Turnquist , Rochit Rajusman , Shigeru Sugamori
IPC分类号： G06F104
CPC分类号： G01R31/31922 , G01R31/31921
摘要： An apparatus and method in an event based test system for testing an electronics device under test (DUT). The apparatus includes an event memory for storing timing data and event type data of each event wherein the timing data of a current event is expressed by a delay time from an event immediately prior thereto with use of a specified number of data bits, and an additional delay time inserted in the timing data of a specified event in such a way to establish a total delay time of the current event which is longer than that can be expressed by the specified number of data bits in the event memory. The additional delay time is inserted by replicating the timing data and the event type data of the event immediately prior to the specified event.
摘要翻译：用于测试被测电子设备（DUT）的基于事件的测试系统中的装置和方法。该装置包括用于存储每个事件的定时数据和事件类型数据的事件存储器，其中当前事件的定时数据由来自使用指定数量的数据位之前的事件的延迟时间表示，并且附加延迟时间插入到指定事件的定时数据中，以建立当前事件的总延迟时间，该延迟时间长于事件存储器中指定数量的数据位可表示的总延迟时间。通过在指定事件之前复制事件的定时数据和事件类型数据来插入附加的延迟时间。

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