会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • Nitride semiconductor device and method of manufacturing the same
    • 氮化物半导体器件及其制造方法
    • US20080296627A1
    • 2008-12-04
    • US12155070
    • 2008-05-29
    • Kentaro WatanabeShunsuke MinatoGiichi Marutsuki
    • Kentaro WatanabeShunsuke MinatoGiichi Marutsuki
    • H01L21/28H01L29/06
    • H01L21/28017H01L21/6835H01L21/743H01L33/0079H01L33/32H01L33/38H01L33/387H01L33/40H01L2221/6835H01L2933/0016
    • In the nitride semiconductor device using the silicon substrate, the metal electrode formed on the silicon substrate has both ohmic contact property and adhesion, so that the nitride semiconductor device having excellent electric properties and reliability is obtained. The nitride semiconductor device includes a silicon substrate (2), a nitride semiconductor layer (10) formed on the silicon substrate (2), and metal electrodes (8, 8′) formed in contact with the silicon substrate (2). The metal electrodes (8, 8′) has first metal layers (4, 4′) which are formed in a shape of discrete islands and in contact with the silicon substrate (2), and second metal layers (6, 6′) which are in contact with the silicon substrate (2) exposed among the islands of the first metal layers (4, 4′) and are formed to cover the first metal layers (4, 4′). Further, the second metal layers (6, 6′) are made of a metal capable of forming ohmic contact with silicon, and the first metal layers (4, 4′) are made of an alloy containing a metal and silicon, in which the metal is different than that in the second metal layer (6,6′).
    • 在使用硅衬底的氮化物半导体器件中,形成在硅衬底上的金属电极具有欧姆接触性和粘合性,从而获得具有优异的电性能和可靠性的氮化物半导体器件。 氮化物半导体器件包括硅衬底(2),形成在硅衬底(2)上的氮化物半导体层(10)和与硅衬底(2)接触形成的金属电极(8,8')。 金属电极(8,8')具有形成离散岛状并与硅衬底(2)接触的第一金属层(4,4'),以及第二金属层(6,6'),其中 与在第一金属层(4,4')的岛之间暴露的硅衬底(2)接触并形成以覆盖第一金属层(4,4')。 此外,第二金属层(6,6')由能够与硅形成欧姆接触的金属制成,并且第一金属层(4,4')由含有金属和硅的合金制成,其中 金属与第二金属层(6,6')不同。
    • 4. 发明授权
    • Nitride semiconductor device
    • 氮化物半导体器件
    • US08299501B2
    • 2012-10-30
    • US12155070
    • 2008-05-29
    • Kentaro WatanabeShunsuke MinatoGiichi Marutsuki
    • Kentaro WatanabeShunsuke MinatoGiichi Marutsuki
    • H01L21/28
    • H01L21/28017H01L21/6835H01L21/743H01L33/0079H01L33/32H01L33/38H01L33/387H01L33/40H01L2221/6835H01L2933/0016
    • In the nitride semiconductor device using the silicon substrate, the metal electrode formed on the silicon substrate has both ohmic contact property and adhesion, so that the nitride semiconductor device having excellent electric properties and reliability is obtained. The nitride semiconductor device includes a silicon substrate (2), a nitride semiconductor layer (10) formed on the silicon substrate (2), and metal electrodes (8, 8′) formed in contact with the silicon substrate (2). The metal electrodes (8, 8′) has first metal layers (4, 4′) which are formed in a shape of discrete islands and in contact with the silicon substrate (2), and second metal layers (6, 6′) which are in contact with the silicon substrate (2) exposed among the islands of the first metal layers (4, 4′) and are formed to cover the first metal layers (4, 4′). Further, the second metal layers (6, 6′) are made of a metal capable of forming ohmic contact with silicon, and the first metal layers (4, 4′) are made of an alloy containing a metal and silicon, in which the metal is different than that in the second metal layer (6,6′).
    • 在使用硅衬底的氮化物半导体器件中,形成在硅衬底上的金属电极具有欧姆接触性和粘合性,从而获得具有优异的电性能和可靠性的氮化物半导体器件。 氮化物半导体器件包括硅衬底(2),形成在硅衬底(2)上的氮化物半导体层(10)和与硅衬底(2)接触形成的金属电极(8,8')。 金属电极(8,8')具有形成离散岛状并与硅衬底(2)接触的第一金属层(4,4'),以及第二金属层(6,6'),其中 与在第一金属层(4,4')的岛之间暴露的硅衬底(2)接触并形成以覆盖第一金属层(4,4')。 此外,第二金属层(6,6')由能够与硅形成欧姆接触的金属制成,并且第一金属层(4,4')由含有金属和硅的合金制成,其中 金属与第二金属层(6,6')不同。