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    • 3. 发明授权
    • Method and device for determining the output power of a semiconductor laser diode
    • 用于确定半导体激光二极管的输出功率的方法和装置
    • US06853657B2
    • 2005-02-08
    • US10364003
    • 2003-02-10
    • Hans-Ludwig AlthausGerhard Kuhn
    • Hans-Ludwig AlthausGerhard Kuhn
    • H01S5/06H01S5/068H01S3/00
    • H01S5/06808H01S5/0617
    • The invention relates to a method and device for determining the output power of a semiconductor laser diode being operated with a diode current. A defined measuring current, which is less than the threshold current of the semiconductor laser diode, is conducted in a conducting direction through the semiconductor laser diode. The forward voltage drop across the semiconductor laser diode is measured, and the temperature of the laser-active region of the semiconductor laser diode is determined from the measured forward voltage by using at least one calibration curve. The invention makes a simple and precise determination of the output power possible without requiring an additional measuring device, for example, a monitor diode.
    • 本发明涉及一种用于确定用二极管电流工作的半导体激光二极管的输出功率的方法和装置。 定义的测量电流小于半导体激光二极管的阈值电流,通过半导体激光二极管在导通方向上进行。 测量半导体激光二极管上的正向压降,并且通过使用至少一个校准曲线从所测量的正向电压确定半导体激光二极管的激光器有源区域的温度。 本发明能够简单且精确地确定输出功率,而不需要额外的测量装置,例如监视二极管。
    • 9. 发明授权
    • Method for adjusting coupling optics and the end of a waveguide relative
to a semiconductor laser
    • 用于调节耦合光学器件和波导相对于半导体激光器的端部的方法
    • US4746195A
    • 1988-05-24
    • US711415
    • 1985-03-13
    • Franz AuracherRudolf KeilJulius WittmannHans-Ludwig AlthausGerhard Kuhn
    • Franz AuracherRudolf KeilJulius WittmannHans-Ludwig AlthausGerhard Kuhn
    • G01M11/00G02B6/30G02B6/42G02B6/00G01B11/00H01S3/18
    • G01M11/31G01M11/33G02B6/30G02B6/4219Y10S359/90
    • A method and apparatus for positioning a laser diode with respect to a coupling optic for a waveguide to obtain the optimum light transmission characterized by providing a reflecting reference plane or surface extending perpendicular to the axis of the waveguide adjacent the coupling optic, projecting light through the waveguide and coupling optic onto the reflecting surface, measuring the amount of light reflected into the waveguide and adjusting the axial position of the waveguide and optic relative to the reflecting surface to obtain the optimum value, then placing the semiconductor with the facet in the reference plane and either operating the semiconductor to provide light for coupling into the waveguide and adjusting the relative positions in a transverse plane to the axis of the waveguide to obtain the optimum transmission or operating the semiconductor laser as a detector and coupling light into the waveguide at a point spaced from the laser to project into the detector and making adjustments in the transverse direction to obtain the optimum reading. The reflecting surface can be either a separate reflecting device or the facet of the laser. The apparatus includes two members each having an abutting surface with one of the members positioning the waveguide with the coupling optic to lie along an axis perpendicular to the abutting surface and the other member positioning the semiconductor laser with the facet lying in the plane of the abutting surface.
    • 一种用于相对于用于波导的耦合光学器件定位激光二极管以获得最佳光透射的方法和装置,其特征在于提供一个反射参考平面或垂直于邻近耦合光学器件的波导的轴线延伸的表面, 波导和耦合光学元件到反射表面上,测量反射到波导中的光量并且相对于反射表面调节波导和光学器件的轴向位置以获得最佳值,然后将具有小面的半导体放置在参考平面 并且操作半导体以提供用于耦合到波导中的光并且调整与波导的轴线的横向平面中的相对位置,以获得最佳传输或将半导体激光器作为检测器操作,并将光在一点上耦合到波导中 与激光器间隔开投影到探测器中 在横向上进行调整以获得最佳读数。 反射表面可以是单独的反射装置或激光的小面。 该装置包括两个构件,每个构件具有邻接表面,其中一个构件将波导与耦合光学器件定位成垂直于邻接表面的轴线,而另一个构件定位半导体激光器,其中小面位于邻接的平面中 表面。