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1. 发明专利

CA2118338A1 OPTICAL MEMORY MEDIUM AND WRITE AND READ APPARATUS USING THE SAME 未知
公开(公告)号：CA2118338A1
公开(公告)日：1995-04-20
申请号：CA2118338
申请日：1994-10-18
申请人： FUJIHIRA MASAMICHI , MURAMATSU HIROSHI , CHIBA NORIO , ATAKA TATSUAKI
发明人： FUJIHIRA MASAMICHI , MURAMATSU HIROSHI , CHIBA NORIO , ATAKA TATSUAKI
IPC分类号： G11B11/12 , G01Q60/18 , G01Q60/26 , G01Q80/00 , G11B7/12 , G11B7/135 , G11B7/1384 , G11B7/244 , G11B7/253 , G11B9/00 , G11B9/14 , G11B11/00 , G11B7/00
摘要： There is disclosed an optical memory medium comprising a flat plate coated with a thin film of a photolytic residual group. Also disclosed is an optical recording apparatus comprising an optical probe having a microscopic aperture on a probe end thereof, a light source, X-Y-Z position control means, and a controller for controlling the apparatus as a whole. Further disclosed is an apparatus for reading the optical memory medium comprising a friction detecting probe, an XY-Z position control means and a controller for controlling the apparatus as a whole. Information may also be written and read at high densities less than the wavelength of light using an apparatus for writing to and reading from an optical memory piezoelectric medium comprising a piezoelectric element coated with a thin film of a photolytic residual group, an optical probe having a microscopic aperture on the probe end thereof, a light source, an X-Y-Z position controller and a sensor for measuring the resonance characteristics of the piezoelectric element and a controller for controlling the apparatus as a whole.

2. 发明专利

CA2101386A1 FINE SURFACE OBSERVING APPARATUS 未知
公开(公告)号：CA2101386A1
公开(公告)日：1994-01-29
申请号：CA2101386
申请日：1993-07-27
申请人： FUJIHIRA MASAMICHI , ATAKA TATSUAKI , MURAMATSU HIROSHI
发明人： FUJIHIRA MASAMICHI , ATAKA TATSUAKI , MURAMATSU HIROSHI
IPC分类号： G01B9/04 , G01B11/30 , G01N37/00 , G01Q30/20 , G01Q60/18 , G01Q60/22 , G02B21/06 , G02B21/00
摘要： An optical scan type tunnel microscope based on a new principle, having higher resolution, is provided. The apparatus of the invention is comprised of at least an optical fiber 3 whose head portion is covered by an energy acceptor 6, a prism on which a sample which contains an energy donator 7 or is covered by the energy donator 7 is placed, a XY-axis transfer mechanism 9, XY-axis control mechanism 10, Z-axis transfer mechanism 11, Z-axis control mechanism 12, light source 13, optical system 14, and optical detecting system 15, and high resolution surface observation may be carried out by utilizing a phenomenon that a distance dependency of energy transfer efficiency from the energy donator excited by light to the energy acceptor is caused neighboring region as compare to intensity distribution of evanescent light. - 1 7

3. 发明专利

DE69226228D1 未知
公开(公告)号：DE69226228D1
公开(公告)日：1998-08-20
申请号：DE69226228
申请日：1992-09-29
申请人： SEIKO INSTR INC , FUJIHIRA MASAMICHI
发明人： FUJIHIRA MASAMICHI , ATAKA TATSUAKI , SAKUHARA TOSHIHIRO
IPC分类号： G01B11/30 , G01Q20/02 , G01Q20/04 , G01Q60/18 , G02B6/00 , G11B7/005 , G11B11/00 , G02B21/00 , G11B9/00 , G01N27/00 , G01B7/34
摘要： A high resolution observation apparatus of material features with a photon scanning microscope. The apparatus detects evanescent light which depends on surface feature of a sample (2) and detects detailed distribution of optical constants of the sample (2). Namely, the apparatus makes it possible to detect detailed distribution of transparency or refractive index within a sample material in higher resolution than the wavelength of the incident light which is irradiated to the sample material coated on the top surface of an optical prism (1). The apparatus includes means (7) for maintaining a predetermined distance between the sample and an optical fiber tip or means (11) for detecting a positioning signal. This positioning signal can be derived from the evanescent wave of one of a plurality of wavelengths of the incident light or signals which correspond to scanning tunnel current (STM), atomic force (AFM), magnetic force, frictional force, ultrasonic wave, heat, ionic conductivity and other physical parameters are used. The apparatus can be utilized as ultra-high density optical read and write memory system. Further, it becomes possible to detect fluorescent condition of the sample (2).

4. 发明专利

CA2079752A1 HIGH RESOLUTION OBSERVATION APPARATUS WITH PHOTON HIGH RESOLUTION OBSERVATION APPARATUS WITH PHOTON SCANNING MICROSCOPE SCANNING MICROSCOPE 未知
公开(公告)号：CA2079752A1
公开(公告)日：1993-04-04
申请号：CA2079752
申请日：1992-10-02
申请人： FUJIHIRA MASAMICHI , ATAKA TATSUAKI , SAKUHARA TOSHIHIRO
发明人： FUJIHIRA MASAMICHI , ATAKA TATSUAKI , SAKUHARA TOSHIHIRO
IPC分类号： G01B11/30 , G01Q20/02 , G01Q20/04 , G01Q60/18 , G02B6/00 , G11B7/005 , G11B11/00 , G01B5/20 , G01B7/28
摘要： A high resolution apparatus for the observation of the properties of a sample material has a photon scanning microscope. The apparatus detects evanescent light emitted from the sample, the intensity of which depends on the surface structure of the sample and the specific distribution of the optical properties thereof. The apparatus provides for the detailed detection of the transparency or refractive index of a sample material in a higher resolution than the wavelength of the incident light, which is irradiated onto the sample material that is applied onto the top surface of an optical prism. The apparatus includes means for maintaining an optical fiber tip, or other means for detecting a positioning signal, at a preselected distance from the sample. Furthermore, the apparatus provides for the detection of fluorescence of the sample.

5. 发明授权

EP0535611B1 Optical scanning tunneling microscope 失效
标题翻译：光学扫描隧道显微镜
公开(公告)号：EP0535611B1
公开(公告)日：1998-07-15
申请号：EP92116681.5
申请日：1992-09-29
申请人： Fujihira, Masamichi , SEIKO INSTRUMENTS INC.
发明人： Fujihira, Masamichi , Ataka, Tatsuaki, c/o Seiko Instruments Inc. , Sakuhara, Toshihiro, c/o Seiko Instruments Inc.
IPC分类号： G02B21/00 , G11B9/00 , G01N27/00 , G01B7/34
CPC分类号： G01N21/552 , G01N21/645 , G01N21/648 , G01Q60/04 , G01Q60/06 , G01Q60/16 , G01Q60/20 , G01Q60/22 , G01Q60/38 , G01Q80/00 , G11B7/005 , G11B11/007 , Y10S977/862

6. 发明专利

CA2118338C OPTICAL MEMORY MEDIUM AND WRITE AND READ APPARATUS USING THE SAME 未知
公开(公告)号：CA2118338C
公开(公告)日：2001-08-07
申请号：CA2118338
申请日：1994-10-18
申请人： FUJIHIRA MASAMICHI , MURAMATSU HIROSHI , CHIBA NORIO , ATAKA TATSUAKI
发明人： FUJIHIRA MASAMICHI , MURAMATSU HIROSHI , CHIBA NORIO , ATAKA TATSUAKI
IPC分类号： G11B11/12 , G01Q60/18 , G01Q60/26 , G01Q80/00 , G11B7/12 , G11B7/135 , G11B7/1384 , G11B7/244 , G11B7/253 , G11B9/00 , G11B9/14 , G11B11/00 , G11B7/00
摘要： There is disclosed an optical memory medium comprising a flat plate coated with a thin film of a photolytic residual group. Also disclosed is an optical recording apparatus comprising an optical probe having a microscopic apertur e on a probe end thereof, a light source, X-Y-Z position control means, and a controller for controlling the apparatus as a whole. Further disclosed is an apparatus for reading the optical memory medium comprising a friction detecting probe, an X- Y-Z position control means and a controller for controlling the apparatus as a whole. Information may also be written and read at high densities less than the wavelength of light using an apparatus for writing to and reading from an optical memory piezoelectric medium comprising a piezoelectric element coated with a thin film of a photolytic residual group, an optical probe having a microscopic aperture on the probe end thereof, a light source, an X-Y-Z position controller and a sensor for measuring the resonance characteristics of the piezoelectric element and a controller for controlling the apparatus as a whole.

7. 发明专利

DE69226228T2 未知
公开(公告)号：DE69226228T2
公开(公告)日：1998-11-19
申请号：DE69226228
申请日：1992-09-29
申请人： SEIKO INSTR INC , FUJIHIRA MASAMICHI
发明人： FUJIHIRA MASAMICHI , ATAKA TATSUAKI , SAKUHARA TOSHIHIRO
IPC分类号： G01B11/30 , G01Q20/02 , G01Q20/04 , G01Q60/18 , G02B6/00 , G11B7/005 , G11B11/00 , G02B21/00 , G11B9/00 , G01N27/00 , G01B7/34
摘要： A high resolution observation apparatus of material features with a photon scanning microscope. The apparatus detects evanescent light which depends on surface feature of a sample (2) and detects detailed distribution of optical constants of the sample (2). Namely, the apparatus makes it possible to detect detailed distribution of transparency or refractive index within a sample material in higher resolution than the wavelength of the incident light which is irradiated to the sample material coated on the top surface of an optical prism (1). The apparatus includes means (7) for maintaining a predetermined distance between the sample and an optical fiber tip or means (11) for detecting a positioning signal. This positioning signal can be derived from the evanescent wave of one of a plurality of wavelengths of the incident light or signals which correspond to scanning tunnel current (STM), atomic force (AFM), magnetic force, frictional force, ultrasonic wave, heat, ionic conductivity and other physical parameters are used. The apparatus can be utilized as ultra-high density optical read and write memory system. Further, it becomes possible to detect fluorescent condition of the sample (2).

8. 发明专利

CA2120975A1 SCANNING NEAR-FIELD OPTIC/ATOMIC-FORCE MICROSCOPE, PROBE FOR USE IN SAME, AND METHOD OF FABRICATING SAID PROBE 未知
公开(公告)号：CA2120975A1
公开(公告)日：1994-10-13
申请号：CA2120975
申请日：1994-04-11
申请人： MURAMATSU HIROSHI , ATAKA TATSUAKI , CHIBA NORIO , FUJIHIRA MASAMICHI
发明人： MURAMATSU HIROSHI , ATAKA TATSUAKI , CHIBA NORIO , FUJIHIRA MASAMICHI
IPC分类号： G01B11/30 , G01B7/34 , G01B11/14 , G01B11/24 , G01N37/00 , G01Q60/06 , G01Q60/18 , G01Q60/22 , G01Q60/38 , G01Q70/10 , G02B6/24 , G02B21/00 , H01J37/28
摘要： - An apparatus capable of measuring the topography and the optical characteristics of the surface of a sample at high resolution irrespective of the transmittance and the conductivity of the sample is realized. The apparatus comprises a probe, a light source for illuminating a sample with light, a photoelectric converter device and optics for receiving light transmitted through the sample or light reflected by the sample, a laser emitting laser light for detecting deflections of the probe, a condenser lens for directing the laser light to the rear surface of the probe, a detection system for detecting reflected light, a rough-motion mechanism and a fine-motion mechanism for moving the sample and the probe relative to each other, a control means for controlling the distance between the sample and the probe, and a computer for controlling the whole apparatus. The probe has a front end portion and a lightpropagating body continuous with the front end portion. The front end portion and the light-propagating body are shaped like a hook. The apparatus observes the topography and the optical characteristics of the surface of the sample.

9. 发明公开

EP0535611A1 High resolution observation apparatus with photon scanning tunneling microscope 失效
标题翻译： Photonen-Abtast-Tunnel-Mikroskop的HochauflösenderBeobachtungsapparat mit。
公开(公告)号：EP0535611A1
公开(公告)日：1993-04-07
申请号：EP92116681.5
申请日：1992-09-29
申请人： Fujihira, Masamichi , SEIKO INSTRUMENTS INC.
发明人： Fujihira, Masamichi , Ataka, Tatsuaki, c/o Seiko Instruments Inc. , Sakuhara, Toshihiro, c/o Seiko Instruments Inc.
IPC分类号： G02B21/00 , G11B9/00 , G01N27/00 , G01B7/34
CPC分类号： G01N21/552 , G01N21/645 , G01N21/648 , G01Q60/04 , G01Q60/06 , G01Q60/16 , G01Q60/20 , G01Q60/22 , G01Q60/38 , G01Q80/00 , G11B7/005 , G11B11/007 , Y10S977/862
摘要： A high resolution observation apparatus of material features with a photon scanning microscope. The apparatus detects evanescent light which depends on surface feature of a sample (2) and detects detailed distribution of optical constants of the sample (2). Namely, the apparatus makes it possible to detect detailed distribution of transparency or refractive index within a sample material in higher resolution than the wavelength of the incident light which is irradiated to the sample material coated on the top surface of an optical prism (1). The apparatus includes means (7) for maintaining a predetermined distance between the sample and an optical fiber tip or means (11) for detecting a positioning signal. This positioning signal can be derived from the evanescent wave of one of a plurality of wavelengths of the incident light or signals which correspond to scanning tunnel current (STM), atomic force (AFM), magnetic force, frictional force, ultrasonic wave, heat, ionic conductivity and other physical parameters are used. The apparatus can be utilized as ultra-high density optical read and write memory system. Further, it becomes possible to detect fluorescent condition of the sample (2).
摘要翻译：具有光子扫描显微镜的材料特征的高分辨率观察装置。该装置检测取决于样品（2）的表面特征的ev逝光，并检测样品（2）的光学常数的详细分布。也就是说，该装置可以以比照射到涂覆在光学棱镜（1）的顶表面上的样品材料的入射光的波长更高的分辨率来检测样品材料内的透明度或折射率的详细分布。该装置包括用于保持样品和光纤末端之间的预定距离的装置（7）或用于检测定位信号的装置（11）。该定位信号可以从入射光的多个波长中的一个的ev逝波或对应于扫描隧道电流（STM），原子力（AFM），磁力，摩擦力，超声波，热等的信号导出，使用离子电导率等物理参数。该装置可以用作超高密度光学读写存储器系统。此外，可以检测样品（2）的荧光条件。

10. 发明公开

EP0581217A1 Near field scanning optical microscope 失效
标题翻译：选择Nahfeld-Abtastmikroskop。
公开(公告)号：EP0581217A1
公开(公告)日：1994-02-02
申请号：EP93111856.6
申请日：1993-07-23
申请人： SEIKO INSTRUMENTS INC. , Fujihira, Masamichi
发明人： Fujihira, Masamichi , Ataka, Tatsuaki, c/o Seiko Instruments Inc. , Muramatsu, Hiroshi, c/o Seiko Instruments Inc.
IPC分类号： G02B21/00
CPC分类号： G01Q10/04 , G01Q60/22
摘要： A near field scanning optical microscope based on a new principle, having higher resolution, is provided. The apparatus of the invention is comprised of at least an optical fiber 3 whose head portion is covered by an energy acceptor 6, a prism on which a sample which contains an energy donator 7 or is covered by the energy donator 7 is placed, a XY-axis transfer mechanism 9, XY-axis control mechanism 10, Z-axis transfer mechanism 11, Z-axis control mechanism 12, light source 13, optical system 14, and optical detecting system 15, and high resolution surface observation may be carried out by utilizing a phenomenon that a distance dependency of energy transfer efficiency from the energy donator excited by light to the energy acceptor is caused neighboring region as compare to intensity distribution of evanescent light.
Energy acceptors may be monomolecular films of N,N'-dioctadecyl thiadicarbocyanin or N,N'-dioctadecyl thiacyanin pigment, donators may be monomolecular films of N,N'-dioctadecyl oxacyanin pigment.
摘要翻译：提供了一种基于新原理的近场扫描光学显微镜，具有更高的分辨率。本发明的装置至少包括一个光纤3，其光头部分被能量受体6所覆盖，其上放置有能量供给器7的样品或被能量供给器7覆盖的棱镜，XY 轴传送机构9，XY轴控制机构10，Z轴传送机构11，Z轴控制机构12，光源13，光学系统14和光学检测系统15以及高分辨率表面观察通过利用与光衰减光的强度分布相比，能量转移效率与能量受体的能量供给器的距离相关性与能量受体的距离依赖性相邻的区域。能量受体可以是N，N'-二十八烷基硫代二氰尿苷或N，N'-二十八烷基硫代胞苷酸颜料的单分子膜，供体可以是N，N'-双十八烷基硫代西林素的单分子膜。

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