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    • 5. 发明申请
    • HYGROMETER AND TEMPERATURE-HUMIDITY CHAMBER PROVIDED WITH SAME
    • 同时提供的温度计和温度 - 湿度室
    • US20150068283A1
    • 2015-03-12
    • US14391025
    • 2013-03-06
    • ESPEC CORP.
    • Satoru Yamauchi
    • G01N19/10
    • G01N19/10G01N25/66
    • A hygrometer includes a heat transfer section extending from a measurement space toward an outside space separated from the measurement space, a heat release amount control unit that causes heat to be released to the outside space from the heat transfer section such that an amount of heat released to the outside space is made constant, and a computation device that calculates a humidity of the measurement space. The computation device calculates the humidity from a heat transfer section temperature and a measurement space temperature using a relational expression based on a heat balance in the heat transfer section when condensation is occurring in a portion, of the heat transfer section, located within the measurement space in a state where the amount of heat released to the outside space from the heat transfer section is made constant by the heat release amount control unit.
    • 湿度计包括从测量空间向与测量空间分离的外部空间延伸的传热部分,散热量控制单元,其使热量从传热部分释放到外部空间,使得热量释放 使外部空间恒定,计算装置计算测量空间的湿度。 计算装置使用位于测量空间内的传热部的部分发生冷凝时基于热传递部的热平衡的关系式,根据传热部温度和测量空间温度来计算湿度 在通过散热量控制单元将从传热部排出到外部空间的热量保持恒定的状态。
    • 8. 发明授权
    • Apparatus and method for power cycle test
    • 动力循环试验装置及方法
    • US09453872B2
    • 2016-09-27
    • US13944686
    • 2013-07-17
    • ESPEC CORP.
    • Michiya Kusaka
    • G01R31/26
    • G01R31/2619
    • Provided is a power cycle test apparatus that eliminates the need to measure a thermal resistance in a power cycle test and that pursues power saving in the evaluation of IGBT reliability by exactly applying a required thermal stress through the automatic adjustment of a stress current. The power cycle test apparatus performs a power cycle test for an IGBT to be tested by applying a thermal stress to the IGBT to be tested through the intermittent application of a stress current thereto. The apparatus applies the stress current to the IGBT to be tested and thereafter applies a current for measurement to the IGBT to be tested to measure a collector-emitter voltage of the IGBT to be tested. The apparatus further obtains a junction temperature of the IGBT to be tested from the measured collector-emitter voltage and a temperature coefficient of the IGBT to be tested.
    • 提供了一种功率循环测试装置,其消除了在功率循环测试中测量热阻的需要,并且通过在应力电流的自动调整中精确地施加所需的热应力来追求节能以评估IGBT的可靠性。 动力循环试验装置通过向应力电流的间歇施加对待测试的IGBT施加热应力来对要测试的IGBT进行功率循环试验。 该装置将应力电流施加到要测试的IGBT,然后将待测电流用于测量的IGBT,以测量待测IGBT的集电极 - 发射极电压。 该装置还从所测得的集电极 - 发射极电压和待测IGBT的温度系数中获得待测IGBT的结温。
    • 9. 发明授权
    • Environmental chamber
    • 环境室
    • US09329118B2
    • 2016-05-03
    • US14089257
    • 2013-11-25
    • ESPEC CORP.
    • Osamu MatsugumaKensuke Akamatsu
    • G01N17/00F24F5/00
    • G01N17/002
    • An environmental chamber includes a testing tub in which a testing space is formed. The testing tub has a front wall, a left sidewall, a right sidewall, a rear wall, and a ceiling part, and is divided into a lower tub part and an upper tub part by a dividing surface extended in a direction inclined downwardly and frontwardly. The left and right sidewalls are respectively divided into two portions by the dividing surface. An inner surface of the upper tub part includes at least a part of an inner surface of each of the ceiling part, the front wall, the left sidewall, and the right sidewall. The upper tub part is supported by the lower tub part to be able to open the testing space.
    • 环境室包括其中形成测试空间的测试槽。 测试槽具有前壁,左侧壁,右侧壁,后壁和顶部,并且通过沿向下和向下倾斜的方向延伸的分隔表面被分为下部桶部分和上部桶部分 。 左侧壁和右侧壁分别由分割面分成两部分。 上槽部的内表面包括顶板部,前壁,左侧壁和右侧壁中的每一个的内表面的至少一部分。 上桶部分由下槽部分支撑以能够打开测试空间。
    • 10. 发明申请
    • CONTACT-TYPE TESTING DEVICE AND ENVIRONMENTAL TEST METHOD
    • 接触式试验装置和环境试验方法
    • US20150129575A1
    • 2015-05-14
    • US14535837
    • 2014-11-07
    • ESPEC CORP.
    • Hideki Tanaka
    • G01R31/28H05B3/22G01R31/00H05B3/68
    • G01R31/2874G01R31/003G01R31/2875H05B3/22
    • A contact-type testing device that has a heating plate capable of being heated and in which a desired test is conducted while a test object is in contact with the heating plate, the contact-type testing device including: a heating member that heats the heating plate, wherein the heating member includes: a plurality of strips of heat generation bodies; and a power feeding section that feeds electricity to the heat generation bodies, wherein the heat generation bodies are distributed in a planar manner, and a group or all of the heat generation bodies are parallel-connected, wherein a part or all of the heat generation bodies have a steep temperature/resistance characteristic, and resistance values of the heat generation bodies increase with temperature, and wherein the heating member is disposed to face the heating plate, and a gap is provided between the heating plate and the heating member.
    • 一种接触型测试装置,其具有能够被加热的加热板,并且在测试对象与所述加热板接触的同时进行期望的测试,所述接触型测试装置包括:加热部件,其加热 板,其中所述加热构件包括:多个发热体条; 以及向所述发热体供电的供电部,其中所述发热体以平面方式分布,并且所述一组或全部所述发热体并联,其中,所述发热体的一部分或全部 主体具有陡峭的温度/电阻特性,并且发热体的电阻值随温度升高,并且其中加热部件设置成面对加热板,并且在加热板和加热部件之间设置间隙。