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    • 8. 发明授权
    • Bi-material assembly adhesively bonded at the ends and fabrication method
    • 双材料组装在端部粘结并制作方法
    • US06460753B1
    • 2002-10-08
    • US09703292
    • 2000-11-01
    • Ephraim Suhir
    • Ephraim Suhir
    • H01L2150
    • H01L23/34H01L2924/0002Y10T428/24826H01L2924/00
    • A bi-material assembly comprising two adherends, adhesively bonded. The assembly is adhesively bonded in an area consisting of a length of 2l at each end of the bonded assembly. The interface of the adherends is not completed bonded so that 2l is less than half of the assembly length. Each bonded area has an inner edge. The inner edge local interfacial shearing stress is substantially equal in magnitude to the inner edge global interfacial shearing stress causing the strength of the bi-material bonded assembly to be substantially the same as a like structure wherein 2l substantially equals half the assembly length. Further are a method of fabricating a bi-material assembly, and a semiconductor device and fabrication method.
    • 一种双组分材料,包括两个被粘合的粘合剂。 组合体在粘合组件的每个端部处由21l的长度组成的区域粘合。 被粘物的界面未完成粘合,使得21l小于组装长度的一半。 每个粘合区域都有一个内边缘。 内边缘局部界面剪切应力的大小与内边缘总体界面剪切应力基本相等,导致双材料粘合组件的强度与类似结构基本相同,其中2l基本上等于组件长度的一半。 另外是制造双材料组件的方法,以及半导体器件和制造方法。
    • 9. 发明授权
    • Interconnected optical devices having enhanced reliability
    • 具有增强的可靠性的互连光学器件
    • US06327411B1
    • 2001-12-04
    • US09357457
    • 1999-07-20
    • Ephraim Suhir
    • Ephraim Suhir
    • G02B602
    • G02B6/43G02B6/02395G02B6/4402
    • This invention is predicated on applicant's discovery that the conventional polymer coatings are often too thin to prevent buckling and subsequent bending of optical interconnection fiber, and that this buckling and the consequent induced bending can be eliminated by increasing the thickness of the fiber polymer coating. Applicant has further discovered that a thicker coating that might be insufficient to prevent buckling, reduces stress should buckling occur, thereby improving the reliability and quality of the waveguide. The optimal (minimum) polymer thickness for buckling prevention can be calculated in terms of the properties of the fiber and tube materials and the thermal history of the device. Increased thicknesses less than this optimal thickness can nonetheless reduce stress should buckling occur.
    • 本发明基于申请人的发现,传统的聚合物涂层通常太薄而不能防止光学互连纤维的屈曲和随后的弯曲,并且通过增加纤维聚合物涂层的厚度可以消除该屈曲和随之而来的诱导弯曲。 申请人进一步发现,较厚的涂层可能不足以防止翘曲,减少应力会发生弯曲,从而提高波导的可靠性和质量。 用于防止翘曲的最佳(最小)聚合物厚度可以根据纤维和管材料的性质以及装置的热历史来计算。 增加的厚度小于这个最佳厚度,尽管如此,可以降低压应力。
    • 10. 发明授权
    • Method and apparatus for evaluation and improvement of mechanical and thermal properties of CNT/CNF arrays
    • 用于评估和改进CNT / CNF阵列的机械和热性能的方法和装置
    • US08048688B2
    • 2011-11-01
    • US11618441
    • 2006-12-29
    • Ephraim SuhirYuan XuYi Zhang
    • Ephraim SuhirYuan XuYi Zhang
    • H01L21/66
    • G01N3/08B82Y30/00G01N2203/028H01L2924/01006H01L2924/01013H01L2924/01027H01L2924/01029H01L2924/01042H01L2924/14
    • A method and apparatus for the evaluation and improvement of the mechanical and thermal properties of carbon-nanotube (CNT) and carbon nanofiber (CNF) arrays grown on a substrate is disclosed. The Young's modulus of a CNT/CNF material is measured by applying an axial compressive force on the CNT/CNF array and measuring the applied forces and the induced displacements. Also disclosed are the evaluation of the nonlinear stress-strain relationship of the CNT/CNF material, increasing of the Young's modulus and decreasing the thermal resistance by application of a compressive load, the application of rapid thermal annealing to improve the quality of the CNT/CNF material and to reduce the interfacial thermal resistance, improvement of the bonding strength of the CNT/CNF array to a substrate, evaluation of the bonding strength of the CNT/CNF array to a substrate, evaluation of the shearing force at failure, and an analytical stress model that enables one to predict the interfacial shearing stress from the measured force.
    • 公开了一种用于评价和改善在衬底上生长的碳纳米管(CNT)和碳纳米纤维(CNF)阵列的机械和热性质的方法和装置。 CNT / CNF材料的杨氏模量通过在CNT / CNF阵列上施加轴向压力并测量所施加的力和诱发的位移来测量。 还公开了CNT / CNF材料的非线性应力 - 应变关系的评估,通过施加压缩载荷提高杨氏模量和降低热阻,应用快速热退火来提高CNT / CNF材料并降低界面热阻,改善CNT / CNF阵列与基片的结合强度,评估CNT / CNF阵列与基片的接合强度,评估破坏时的剪切力,以及 分析应力模型,可以从测量的力量预测界面剪切应力。