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1. 发明授权

US06417682B1 Semiconductor device testing apparatus and its calibration method 有权
标题翻译：半导体器件测试仪器及其校准方法
公开(公告)号：US06417682B1
公开(公告)日：2002-07-09
申请号：US09314887
申请日：1999-05-19
申请人： Toshikazu Suzuki , Hiroyuki Nagai , Noriyoshi Kozuka , Yukio Ishigaki , Shigeru Matsumura , Takashi Sekizuka , Hiroyuki Shiotsuka , Hiroyuki Hama , Eiichi Sekine
发明人： Toshikazu Suzuki , Hiroyuki Nagai , Noriyoshi Kozuka , Yukio Ishigaki , Shigeru Matsumura , Takashi Sekizuka , Hiroyuki Shiotsuka , Hiroyuki Hama , Eiichi Sekine
IPC分类号： G01R3102
CPC分类号： G01R31/3191 , G01R31/31905 , G01R31/31924 , G01R35/00
摘要： A calibration method for calibrating a semiconductor testing apparatus before mounting semiconductor devices for performing a testing of electric characteristics thereof, the testing apparatus having a driver which generates and outputs a signal, and a socket with a plurality of terminals for receiving pins and transferring signals therethrough. The calibration method includes mounting a test board having a plurality of pins onto the socket and connecting each of the pins of the test board with a respective terminal of the socket, transferring the signal of the driver to the terminals of the test board, detecting the signal of the driver that has reached the test board, and setting an output timing of the signal of the driver based on the signal detected.
摘要翻译：一种用于在安装用于执行其电特性的测试的半导体器件之前校准半导体测试装置的校准方法，具有产生和输出信号的驱动器的测试装置以及具有用于接收引脚和传输信号的多个端子的插座。校准方法包括将具有多个引脚的测试板安装到插座上，并将测试板的每个引脚与插座的相应端子连接，将驱动器的信号传送到测试板的端子，检测已经到达测试板的驱动器的信号，以及基于检测到的信号来设置驱动器的信号的输出定时。

2. 发明授权

US5862088A Apparatus and method for testing a memory 失效
标题翻译：用于测试存储器的装置和方法
公开(公告)号：US5862088A
公开(公告)日：1999-01-19
申请号：US60400
申请日：1998-04-14
申请人： Hiroshi Takemoto , Eiichi Sekine
发明人： Hiroshi Takemoto , Eiichi Sekine
IPC分类号： G01R31/28 , G11C29/00 , G11C29/44 , G11C13/00
CPC分类号： G11C29/72 , G11C29/44
摘要： In a memory testing apparatus wherein a plurality of function tests are continuously carried out for a semiconductor memory and a decision as to whether or not a failure relieving analysis of the memory should be performed is rendered upon completion of each function test, a failure cell counter 15 is provided at the rear stage of a failure analysis memory 13. When a failure memory cell is detected in a memory under test MUT in each function test, the number of failure cells of the memory under test is counted by the failure cell counter. A main controller controls operations of the memory testing apparatus ST such that a failure relieving analysis of the memory under test is performed only when the number of failure memory cells detected in the function test performed this time is greater than the number of failure memory cells detected in the preceding function test.
摘要翻译：在对半导体存储器连续执行多个功能测试的存储器测试装置中，以及在完成每个功能测试时是否应当执行对存储器的故障缓解分析的决定，故障单元计数器 15在故障分析存储器13的后级设置。当在每个功能测试中在被测试存储器MUT中检测到故障存储单元时，通过故障单元计数器对被测存储器的故障单元数进行计数。主控制器控制存储器测试装置ST的操作，使得仅当在该次执行的功能测试中检测到的故障存储器单元的数量大于检测到的故障存储器单元的数量时，才执行对被测存储器的故障解除分析在上述功能测试中。

3. 发明授权

US4878743A Automotive mirror using electrochromic element 失效
标题翻译：汽车镜使用电致变色元件
公开(公告)号：US4878743A
公开(公告)日：1989-11-07
申请号：US203139
申请日：1988-06-07
申请人： Toyoshi Aikawa , Eiichi Sekine
发明人： Toyoshi Aikawa , Eiichi Sekine
IPC分类号： G02F1/15 , B60R1/04 , B60R1/08 , G02F1/163
CPC分类号： G02F1/155 , B60R1/088 , G02F1/1533 , G02F1/163
摘要： In an automotive mirror using an electrochromic element, the electrochromic element comprises a first electrode made of a transparent conductive layer laminated on a substantially rectangular glass substrate, two EC (electrochromic) layers disposed opposing each other with a solid electrolyte layer placed between them, a second electrode made of a reflective metal film and an insulative/protective layer disposed outside the second electrode. There are formed on the first electrode longitudinally and laterally in positions off the adjoining EC layer, strip-shaped metal films considerably superior in conductivity to the first electrode. The power supply to the first electrode is made through a pair of terminal fixtures electrically connected to the strip-shaped metal films in locations near a set of diagonally opposing corners of the glass substrate, and the power supply to the second electrode is made to another pair of terminal fixtures electrically connected to a pair of electrode portions extended to the insulative areas, respectively, near the other set of diagonally opposing corners of the glass substrate. Therefore, at start of the power supply, the voltage drop depending upon the position on the first electrode is markedly reduced, and the colored areas of the two EC laters can quickly shift to the center of the mirror surface from the regions near the strip-shaped metal films, whereby the entire mirror surface can get colored to a predetermined extent in a considerably reduced time.
摘要翻译：在使用电致变色元件的汽车镜中，电致变色元件包括由层叠在基本上矩形的玻璃基板上的透明导电层制成的第一电极，设置在它们之间的固体电解质层相对设置的两个EC（电致变色）层，由反射金属膜制成的第二电极和设置在第二电极外部的绝缘/保护层。在第一电极的纵向和横向上形成在邻近的EC层的位置，带状金属膜的电导率相对于第一电极显着优异。通过在玻璃基板的一组对角相对的角附近的位置处电连接到带状金属膜的一对端子固定件来制造到第一电极的电源，并且向第二电极的电源供给另一个电连接到一对延伸到绝缘区域的电极部分的一对端子固定件分别靠近玻璃基板的另一组对角相对的角部。因此，在电源开始时，取决于第一电极上的位置的电压降明显降低，并且两个EC缓冲器的着色区域能够从带状部分附近的区域迅速地转移到镜面的中心，从而整个镜面可以在相当短的时间内被着色到预定的程度。

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