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1. 发明授权

US08560142B2 Adaptive cooling using selectable target useful life 有权
标题翻译：自适应冷却使用可选择的目标使用寿命
公开(公告)号：US08560142B2
公开(公告)日：2013-10-15
申请号：US12976442
申请日：2010-12-22
申请人： Saida Benlarbi , David Stortz , Dmitri Garaschenko
发明人： Saida Benlarbi , David Stortz , Dmitri Garaschenko
IPC分类号： G05D23/00
CPC分类号： G06F1/206 , H05K7/20563 , H05K7/207
摘要： A method and system is disclosed for controlling cooling unit operational settings according to a desired useful life target. The method and system includes an adaptive cooling controller which uses system configuration information to associate a particular cooling unit with particular sub-equipment locations, and further uses configuration information to associate cooling unit activity with respective sensors. At a given cooling unit setting, the adaptive cooling controller determines from sensor readings in the associated sub-equipment whether a cooling unit setting change is required according to the configuration information for the sub-equipment in conjunction with a useful life target. The method and system is particularly useful for overcoming the difficulty with accommodating sub-equipment changes of cooling unit controllers known in the art.
摘要翻译：公开了一种根据期望的使用寿命目标来控制冷却单元操作设置的方法和系统。该方法和系统包括自适应冷却控制器，其使用系统配置信息将特定冷却单元与特定子设备位置相关联，并且还使用配置信息将冷却单元活动与相应传感器相关联。在给定的冷却单元设置下，自适应冷却控制器根据相关子设备中的传感器读数来确定是否需要根据子设备的配置信息结合使用寿命目标来改变冷却单元设置。该方法和系统对于克服本领域已知的冷却单元控制器的子设备变化的困难特别有用。

2. 发明申请

US20120160444A1 ADAPTIVE COOLING USING SELECTABLE TARGET USEFUL LIFE 有权
标题翻译：自适应冷却使用可选择的目标有用的生活
公开(公告)号：US20120160444A1
公开(公告)日：2012-06-28
申请号：US12976442
申请日：2010-12-22
申请人： Saida Benlarbi , David Stortz , Dmitri Garaschenko
发明人： Saida Benlarbi , David Stortz , Dmitri Garaschenko
IPC分类号： F28F27/00
CPC分类号： G06F1/206 , H05K7/20563 , H05K7/207
摘要： A method and system is disclosed for controlling cooling unit operational settings according to a desired useful life target. The method and system includes an adaptive cooling controller which uses system configuration information to associate a particular cooling unit with particular sub-equipment locations, and further uses configuration information to associate cooling unit activity with respective sensors. At a given cooling unit setting, the adaptive cooling controller determines from sensor readings in the associated sub-equipment whether a cooling unit setting change is required according to the configuration information for the sub-equipment in conjunction with a useful life target. The method and system is particularly useful for overcoming the difficulty with accommodating sub-equipment changes of cooling unit controllers known in the art.
摘要翻译：公开了一种根据期望的使用寿命目标来控制冷却单元操作设置的方法和系统。该方法和系统包括自适应冷却控制器，其使用系统配置信息将特定冷却单元与特定子设备位置相关联，并且还使用配置信息将冷却单元活动与相应传感器相关联。在给定的冷却单元设置下，自适应冷却控制器根据相关子设备中的传感器读数来确定是否需要根据子设备的配置信息结合使用寿命目标来改变冷却单元设置。该方法和系统对于克服本领域已知的冷却单元控制器的子设备变化的困难特别有用。

3. 发明申请

US20070011575A1 Autonomous method and apparatus for mitigating soft-errors in integrated circuit memory storage devices at run-time 失效
标题翻译：用于在运行时减轻集成电路存储器件中的软错误的自动方法和装置
公开(公告)号：US20070011575A1
公开(公告)日：2007-01-11
申请号：US11177381
申请日：2005-07-11
申请人： Toby Koktan , Robert Morton , David Graham , James Wisener , David Motz , Saida Benlarbi , David Stortz
发明人： Toby Koktan , Robert Morton , David Graham , James Wisener , David Motz , Saida Benlarbi , David Stortz
IPC分类号： G11C29/00
CPC分类号： G06F11/1048
摘要： Apparatus and methods for autonomously identifying and mitigating soft-errors affecting integrated circuit memory storage devices are provided. A soft-error mitigation process is invoked upon finding that an integrated circuit memory device is affected by a parity error. In a staged approach, unused memory regions of the integrated circuit memory device are reinitialized; if a redundant deployment prevails, the subsystem corresponding to the affected integrated circuit memory device is reset; memory regions having copies of contents thereof stored at remote locations are rewritten with obtained copies of the contents; and memory regions storing contents which are generated at run-time are reinitialized. Directed parity error scans are employed at each stage. If the parity error persists, one of the apparatus, and the subsystem corresponding to the affected silicon memory device is reset during a maintenance window. Advantages are derived from a run-time soft-error mitigation process which increases availability, and reduces maintenance overheads and the need for hardware replacement.
摘要翻译：提供了自动识别和减轻影响集成电路存储器存储设备的软错误的装置和方法。在发现集成电路存储器件受奇偶校验错误影响时，会调用软错误缓解过程。在分级方法中，集成电路存储器件的未使用的存储器区域被重新初始化; 如果冗余部署占优，则与受影响的集成电路存储器件对应的子系统复位; 具有存储在远程位置的内容的副本的存储器区域被重写为内容的所获得的副本; 并且存储在运行时生成的内容的存储区域被重新初始化。在每个阶段采用定向奇偶校验错误扫描。如果奇偶校验错误仍然存在，则在维护窗口期间，重置与受影响的硅存储器件相对应的装置和子系统之一。优点来自运行时软错误缓解过程，从而提高可用性，并减少维护开销以及硬件更换的需要。

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