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1. 发明申请

US20090243648A1 OPTIMAL LOCAL SUPPLY VOLTAGE DETERMINATION CIRCUIT 失效
标题翻译：最佳的本地电源电压测定电路
公开(公告)号：US20090243648A1
公开(公告)日：2009-10-01
申请号：US12055569
申请日：2008-03-26
申请人： Kerry Bernstein , David S. Wolpert
发明人： Kerry Bernstein , David S. Wolpert
IPC分类号： H03K19/00
CPC分类号： G01R31/3004
摘要： A test circuit that compares test results between two tests with different local supply voltages is provided. The output of each stage of the logic circuits is stored in a first register of each test circuit. Each test is performed with a critical test vector and a local supply voltage that decreases from test to test. The outputs of successive tests are compared in each test circuit. The tests are performed iteratively with successive reduction in the value of the local supply voltage until at least one stage of the logic circuits produces non-matching results between the first and second register. The voltage immediately before producing such non-matching results is the minimum operational voltage for the local voltage island.
摘要翻译：提供了一种测试电路，用于比较两种测试与不同本地电源电压之间的测试结果。逻辑电路的每个级的输出被存储在每个测试电路的第一寄存器中。每个测试都用临界测试矢量和从测试到测试的局部电源电压进行。在每个测试电路中比较连续测试的输出。迭代地执行测试，连续减小本地电源电压的值，直到至少一级的逻辑电路在第一和第二寄存器之间产生不匹配的结果。在产生这种不匹配结果之前的电压是本地电压岛的最小工作电压。

2. 发明授权

US07898285B2 Optimal local supply voltage determination circuit 失效
标题翻译：最佳本地电源电压确定电路
公开(公告)号：US07898285B2
公开(公告)日：2011-03-01
申请号：US12055569
申请日：2008-03-26
申请人： Kerry Bernstein , David S. Wolpert
发明人： Kerry Bernstein , David S. Wolpert
IPC分类号： H03K19/00
CPC分类号： G01R31/3004
摘要： A test circuit that compares test results between two tests with different local supply voltages is provided. The output of each stage of the logic circuits is stored in a first register of each test circuit. Each test is performed with a critical test vector and a local supply voltage that decreases from test to test. The outputs of successive tests are compared in each test circuit. The tests are performed iteratively with successive reduction in the value of the local supply voltage until at least one stage of the logic circuits produces non-matching results between the first and second register. The voltage immediately before producing such non-matching results is the minimum operational voltage for the local voltage island.
摘要翻译：提供了一种测试电路，用于比较两种测试与不同本地电源电压之间的测试结果。逻辑电路的每个级的输出被存储在每个测试电路的第一寄存器中。每个测试都用临界测试矢量和从测试到测试的局部电源电压进行。在每个测试电路中比较连续测试的输出。迭代地执行测试，连续减小本地电源电压的值，直到至少一级的逻辑电路在第一和第二寄存器之间产生不匹配的结果。在产生这种不匹配结果之前的电压是本地电压岛的最小工作电压。

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