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1. 发明申请

US20090237501A1 METHOD AND AN APPARATUS FOR LOCALIZATION OF SINGLE DYE MOLECULES IN THE FLUORESCENT MICROSCOPY 有权
标题翻译：用于荧光显微镜中单分子分子的定位的方法和装置
公开(公告)号：US20090237501A1
公开(公告)日：2009-09-24
申请号：US12404488
申请日：2009-03-16
申请人： Paul Lemmer , Christoph Cremer , David Baddeley , Heinz Eipel
发明人： Paul Lemmer , Christoph Cremer , David Baddeley , Heinz Eipel
IPC分类号： H04N7/18
CPC分类号： G01N21/6458 , G01N21/6428 , G01N2021/6441 , G02B21/0076 , G02B21/16 , G02B21/367 , G02B27/58
摘要： A method and apparatus are provided for obtaining a sub-resolution spatial information of a sample labeled with at least one type fluorescent label. The sub-resolution spatial information has localization information about the positions of fluorescent molecules of the at least one type fluorescent label in at least one spatial direction. The method acquires localization image data by employing fluorescence localization microscopy. The acquired localization image data is processed to obtain the localization information about the positions of fluorescent molecules of the at least one type fluorescent label in at least one spatial direction. The step of processing includes determining in each of the detected images of the series the positions of the barycenters of the detected fluorescence emission distributions from the single fluorescent molecules of the one or more fluorescent labels in at least one spatial direction.
摘要翻译：提供一种方法和装置，用于获得用至少一种类型的荧光标签标记的样品的亚分辨率空间信息。子分辨率空间信息具有关于至少一个类型的荧光标记在至少一个空间方向上的荧光分子的位置的定位信息。该方法采用荧光定位显微镜获取定位图像数据。处理获取的定位图像数据以获得关于至少一个类型的荧光标记物的荧光分子在至少一个空间方向上的位置的定位信息。处理步骤包括在至少一个空间方向上确定该系列的每个检测到的图像中的一个或多个荧光标记的单个荧光分子的检测的荧光发射分布的重心的位置。

2. 发明授权

US08212866B2 Method and an apparatus for localization of single dye molecules in the fluorescent microscopy 有权
标题翻译：荧光显微镜中单染料分子的定位方法和装置
公开(公告)号：US08212866B2
公开(公告)日：2012-07-03
申请号：US12404488
申请日：2009-03-16
申请人： Paul Lemmer , Christoph Cremer , David Baddeley , Heinz Eipel
发明人： Paul Lemmer , Christoph Cremer , David Baddeley , Heinz Eipel
IPC分类号： H04N7/18
CPC分类号： G01N21/6458 , G01N21/6428 , G01N2021/6441 , G02B21/0076 , G02B21/16 , G02B21/367 , G02B27/58
摘要： A method and apparatus are provided for obtaining a sub-resolution spatial information of a sample labeled with at least one type fluorescent label. The sub-resolution spatial information has localization information about the positions of fluorescent molecules of the at least one type fluorescent label in at least one spatial direction. The method acquires localization image data by employing fluorescence localization microscopy. The acquired localization image data is processed to obtain the localization information about the positions of fluorescent molecules of the at least one type fluorescent label in at least one spatial direction. The step of processing includes determining in each of the detected images of the series the positions of the barycenters of the detected fluorescence emission distributions from the single fluorescent molecules of the one or more fluorescent labels in at least one spatial direction.
摘要翻译：提供一种方法和装置，用于获得用至少一种类型的荧光标签标记的样品的亚分辨率空间信息。子分辨率空间信息具有关于至少一个类型的荧光标记在至少一个空间方向上的荧光分子的位置的定位信息。该方法采用荧光定位显微镜获取定位图像数据。处理获取的定位图像数据以获得关于至少一个类型的荧光标记物的荧光分子在至少一个空间方向上的位置的定位信息。处理步骤包括在至少一个空间方向上确定该系列的每个检测到的图像中的一个或多个荧光标记的单个荧光分子的检测的荧光发射分布的重心的位置。

3. 发明授权

US08155409B2 Wave field microscope with sub-wavelength resolution and methods for processing microscopic images to detect objects with sub-wavelength dimensions 有权
标题翻译：具有亚波长分辨率的波场显微镜和用于处理微观图像以检测具有亚波长尺寸的物体的方法
公开(公告)号：US08155409B2
公开(公告)日：2012-04-10
申请号：US12148230
申请日：2008-04-17
申请人： Christoph Cremer , David Baddeley , Jurgen Reymann , Udo Birk
发明人： Christoph Cremer , David Baddeley , Jurgen Reymann , Udo Birk
IPC分类号： G06K9/00
CPC分类号： G06K9/00127 , B82Y20/00 , B82Y35/00 , G06T5/002 , G06T5/20 , G06T7/0002 , G06T2207/10056
摘要： The invention relates to a computer implemented method for processing of microscopic images to detect objects of interest. The method includes subjecting the microscopic image to a bandpass filtering to obtain a filtered image, wherein the bandpass filtering is such as to suppress the noise and any objects which are larger than a predetermined size; and processing the filtered image at a plurality of progressively decreasing threshold levels. The processing at each threshold level includes detecting the objects of interest using an object labelling algorithm and removing the detected objects detected at a given threshold level from the working image before proceeding to the next threshold level.
摘要翻译：本发明涉及一种用于处理微观图像以检测感兴趣物体的计算机实现方法。该方法包括使微观图像进行带通滤波以获得滤波图像，其中带通滤波是为了抑制噪声和大于预定尺寸的任何物体; 以及以多个逐渐降低的阈值水平处理所述滤波图像。在每个阈值级别的处理包括使用对象标记算法检测感兴趣的对象，并且在进行到下一个阈值水平之前，从工作图像中去除在给定阈值水平检测到的检测对象。

4. 发明申请

US20090263002A1 Wave field microscope with sub-wavelength resolution and methods for processing microscopic images to detect objects with sub-wavelength dimensions 有权
标题翻译：具有亚波长分辨率的波场显微镜和用于处理微观图像以检测具有亚波长尺寸的物体的方法
公开(公告)号：US20090263002A1
公开(公告)日：2009-10-22
申请号：US12148230
申请日：2008-04-17
申请人： Christoph Cremer , David Baddeley , Jurgen Reymann , Udo Birk
发明人： Christoph Cremer , David Baddeley , Jurgen Reymann , Udo Birk
IPC分类号： G06K9/00 , G06K9/40
CPC分类号： G06K9/00127 , B82Y20/00 , B82Y35/00 , G06T5/002 , G06T5/20 , G06T7/0002 , G06T2207/10056
摘要： The invention relates to a computer implemented method for processing of microscopic images to detect objects of interest. The method includes subjecting the microscopic image to a bandpass filtering to obtain a filtered image, wherein the bandpass filtering is such as to suppress the noise and any objects which are larger than a predetermined size; and processing the filtered image at a plurality of progressively decreasing threshold levels. The processing at each threshold level includes detecting the objects of interest using an object labelling algorithm and removing the detected objects detected at a given threshold level from the working image before proceeding to the next threshold level.
摘要翻译：本发明涉及一种用于处理微观图像以检测感兴趣物体的计算机实现方法。该方法包括使微观图像进行带通滤波以获得滤波图像，其中带通滤波是为了抑制噪声和大于预定尺寸的任何物体; 以及以多个逐渐降低的阈值水平处理所述滤波图像。在每个阈值级别的处理包括使用对象标记算法检测感兴趣的对象，并且在进行到下一个阈值水平之前，从工作图像中去除在给定阈值水平检测到的检测对象。

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