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    • 2. 发明申请
    • DIGITAL HOLOGRAPHIC MICROSCOPE FOR 3D IMAGING AND PROCESS USING IT
    • 用于3D成像的数字全息显微镜和使用它的过程
    • WO2004102111A1
    • 2004-11-25
    • PCT/BE2004/000075
    • 2004-05-17
    • UNIVERSITE LIBRE DE BRUXELLESDUBOIS, FrankYOURASSOWSKY, Catherine
    • DUBOIS, FrankYOURASSOWSKY, Catherine
    • G01B9/02
    • G01B9/021G01B9/04G02B21/16G02B21/22G02B21/36G03H1/0005G03H1/0443G03H1/0493G03H1/0866G03H2001/005G03H2001/0454G03H2222/24
    • The present invention is related to a compact microscope able to work in digital holography for obtaining high quality 3D images of samples, including fluorescent samples and relatively thick samples such as biological samples, said microscope comprising illumination means (1, 41) at least partially spatially coherent for illuminating a sample (2) to be studied and a differential interferometer (5) for generating interfering beams from said sample (2) on the sensor (33) of an electronic imaging device(7), said interferometer (5) comprising namely tilting means (17) for tilting by a defined angle one the interfering beams (28 or 29) relatively to the other, said tilting resulting into a defined shift (27) of said interfering beam on the sensor of the electronic imaging device (7), said shift (27) being smaller than spatial coherence width of each beam, said microscope being able to be quasi totally preadjusted independently from the samples so that minimum additional adjustments are required for obtaining reliable 3D images of samples.
    • 本发明涉及能够在数字全息术中工作以获得样品的高质量3D图像的紧凑型显微镜,包括荧光样品和相对厚的样品例如生物样品,所述显微镜包括至少部分空间上的照明装置(41,41) 用于照射要研究的样品(2)的相干性和用于在电子成像装置(7)的传感器(33)上产生来自所述样品(2)的干扰光束的差分干涉仪(5),所述干涉仪(5)包括 倾斜装置(17),用于相对于另一个倾斜一定角度的干涉光束(28或29),所述倾斜导致所述干涉光束在电子成像装置(7)的传感器上的限定位移(27) ,所述偏移(27)小于每个光束的空间相干宽度,所述显微镜能够独立于样本被准全部预调整,使得最小额外的调整是必需的 用于获取样品的可靠3D图像。
    • 5. 发明申请
    • HOLOGRAPHIC MICROSCOPY AND METHOD TO INVESTIGATE NANO-SIZED OBJECTS
    • 全息显微镜和调查纳米尺寸对象的方法
    • WO2010037861A1
    • 2010-04-08
    • PCT/EP2009/062854
    • 2009-10-02
    • UNIVERSITE LIBRE DE BRUXELLESDUBOIS, Frank
    • DUBOIS, Frank
    • G03H1/08G02B1/10G03H1/00
    • G03H1/0443G02B21/10G02B21/18G03H1/0005G03H1/0866G03H2001/0033G03H2001/005G03H2001/0456G03H2001/0471G03H2210/55G03H2240/56
    • Method for detecting a three dimensional object smaller than 300nm comprising the steps of : - providing a light source producing a first light beam (1), said light source being at least partially coherent; - splitting said first light beam (1) into an object beam (2) and a reference beam (6) by means of a first beam splitter (BS1); - producing a image of the light source in a light source image plane by means of a first microscope objective (L1), in the optical path of the object beam (2); - positioning the three dimensional object to be detected in an object cell (3) in the optical path of the object beam (2), between said first beam splitter (BS1) and said first microscope objective (L1); - recombining object beam (2) and said reference beam (6) into a recombined beam (8) by use of optical means; - placing an optical stop (4) in said light source image plane of said microscope objective (L1) on the optical axis of said microscope objective (L1); - focusing said recombined beam (8) onto said recording means (5) with focusing means (L3); recording interf erometric signals produced by the interaction between the reference beam and the object beam with recording means (5), - reconstructing a three dimensional picture of the three dimensional object to be detected from said interf erometric signal, thereby detecting said three dimensional object.
    • 用于检测小于300nm的三维物体的方法,包括以下步骤: - 提供产生第一光束(1)的光源,所述光源至少部分相干; - 通过第一分束器(BS1)将所述第一光束(1)分解成物体光束(2)和参考光束(6); - 在物光束(2)的光路中通过第一显微镜物镜(L1)在光源像平面中产生光源的图像; - 将待检测的三维物体定位在目标光束(2)的光路中,所述第一分束器(BS1)和所述第一显微镜物镜(L1)之间的物体单元(3)中。 - 通过使用光学装置将目标光束(2)和所述参考光束(6)重新组合成复合光束(8); - 在所述显微镜物镜(L1)的光轴上将光学停止件(4)放置在所述显微镜物镜(L1)的所述光源像面中; - 聚焦装置(L3)将所述重组束(8)聚焦到所述记录装置(5)上; 通过记录装置(5)记录由参考光束和物体光束之间的相互作用产生的界面色度信号, - 从所述介面色度信号重建待检测的三维物体的三维图像,从而检测所述三维物体。