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1. 发明申请

US20130133339A1 HOT/COLD TEST EQUIPMENT FOR NAND FLASH MEMORY WITH DEHUMIDIFYING FUNCTION 审中-公开
标题翻译：具有去湿功能的NAND FLASH存储器的热/冷测试设备
公开(公告)号：US20130133339A1
公开(公告)日：2013-05-30
申请号：US13558482
申请日：2012-07-26
申请人： DOO-HAN KIM
发明人： DOO-HAN KIM
IPC分类号： F25B21/02
CPC分类号： G11C29/56016 , G01R31/2862 , G01R31/2874
摘要： Disclosed herein is hot/cold test equipment for a Nand Flash Memory. The test equipment includes a mounting unit that contains the Nand Flash Memory together with a socket to test whether the memory is defective or not, a chamber provided above the mounting unit and moving up and down to come into contact with the socket and thereby provide a target temperature, and a temperature display displaying the target temperature. The chamber includes a block inserted into the socket, a thermoelectric element seated on an upper portion of the block, a water jacket seated on an upper portion of the thermoelectric element and circulating cooling water therein, and a cooling fan provided in the water jacket to blow air downwards, with a discharge hole being formed on a lower surface of the block to discharge nitrogen gas.
摘要翻译：这里公开了用于Nand闪存的热/冷测试设备。测试设备包括安装单元，其包含Nand闪存和插座以测试存储器是否有故障，一个设置在安装单元上方并且上下移动以与插座接触的室，从而提供一个目标温度和显示目标温度的温度显示。所述腔室包括插入到所述插座中的块，位于所述块的上部的热电元件，位于所述热电元件的上部上并使冷却水循环的水套，以及设置在所述水套中的冷却风扇，向下吹风，排放孔形成在块体的下表面以排出氮气。

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