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    • 5. 发明申请
    • Single chip device, and method and system for testing the same
    • 单芯片器件,以及用于测试的方法和系统
    • US20050289251A1
    • 2005-12-29
    • US10971101
    • 2004-10-25
    • Chin-Chou LeeChun-Huang Lin
    • Chin-Chou LeeChun-Huang Lin
    • G01R31/317G06F13/10
    • G01R31/31715G06F11/3672
    • A single chip device includes a first transmission interface connected to an external testing device, a second transmission interface connected to the testing device, and a processor unit coupled to the first and second transmission interfaces and operable in one of a normal operating mode, where data transmission between the single chip device and the testing device is performed at a first transmission rate via the first transmission interface, and a testing mode, where data transmission between the single chip device and the testing device is performed at a second transmission rate different from the first transmission rate via the second transmission interface. A method and system for testing the single chip device are also disclosed.
    • 单芯片装置包括连接到外部测试装置的第一传输接口,连接到测试装置的第二传输接口,以及耦合到第一和第二传输接口的处理器单元,可在正常操作模式之一操作,其中数据 通过第一传输接口以第一传输速率执行单片设备与测试设备之间的传输,以及测试模式,其中以与第一传输接口不同的第二传输速率执行单个芯片设备与测试设备之间的数据传输 通过第二传输接口的第一传输速率。 还公开了用于测试单芯片器件的方法和系统。