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    • 3. 发明专利
    • Suitcase with a protective cover
    • GB2512196B
    • 2015-07-08
    • GB201402075
    • 2014-02-07
    • CHIA HUNG LAI
    • TANG TING-TING
    • A45C5/03A45C13/00
    • A suitcase with a protective cover includes a main body having two semi-sphere cases, two adaptors respectively mounted fixedly around the corresponding sides of the two semi-sphere cases, a close space formed by the two semi-sphere cases, the adaptors having at least one first adapting portion mounted along the locations around which each of the adaptors is mounted, two cover bodies, each of the cover bodies has an opening, a concave portion recessed from the opening, a positioning rim mounted around the side of the opening, the concave portion having depth being capable of having the cover bodies cover the semi-sphere cases, at least one second adapting portion mounted along the locations around which each of the positioning rims is mounted, and each cover body fixed on each corresponding semi-spheres case via the connection of the at least one first adapting portion and the second adapting portion.
    • 5. 发明授权
    • Distance adjustment system for use in solar wafer inspection machine and inspection machine provided with same
    • 用于太阳能晶片检测机和检测机的距离调整系统
    • US08461857B2
    • 2013-06-11
    • US13030134
    • 2011-02-18
    • Chia-Hung Lai
    • Chia-Hung Lai
    • G01R31/26
    • H01L31/188G01R31/2893Y02E10/50
    • The present invention relates to a distance adjustment system and a solar wafer inspection machine provided with the system. The inspection machine has a conveyer for carrying a solar wafer, an optical inspection system for inspecting the surface and color appearance of the wafer and an illumination inspection system. A holder is provided in the inspection position where the wafer is clamped along its width direction to prevent the wafer from offset. During the opto-electrical inspection, probes are brought into contact with conductive buses of the wafer and light is applied to the wafer to allow the probing of electric energy thus generated. An adjusting device is employed to adjust the clamping gap of the holder and the distance of the probes in accordance with the size of the solar wafer. The data are collected and transmitted to a sorting system for sorting the wafer.
    • 本发明涉及一种设置有该系统的距离调节系统和太阳能晶片检查机。 检查机具有用于承载太阳能晶片的输送机,用于检查晶片的表面和颜色外观的光学检查系统以及照明检查系统。 在检查位置设置保持器,其中晶片沿着其宽度方向被夹紧以防止晶片偏移。 在光电检测期间,探针与晶片的导电总线接触,并且将光施加到晶片以允许探测由此产生的电能。 根据太阳能晶片的尺寸,采用调节装置来调整支架的夹持间隙和探头的距离。 收集数据并将其传输到用于分选晶片的分选系统。
    • 6. 发明申请
    • DISTANCE ADJUSTMENT SYSTEM FOR USE IN SOLAR WAFER INSPECTION MACHINE AND INSPECTION MACHINE PROVIDED WITH SAME
    • 太阳能水轮检测机及其检测机器使用的距离调节系统
    • US20120013897A1
    • 2012-01-19
    • US13030134
    • 2011-02-18
    • Chia-Hung Lai
    • Chia-Hung Lai
    • G01N21/01G01N21/00
    • H01L31/188G01R31/2893Y02E10/50
    • The present invention relates to a distance adjustment system and a solar wafer inspection machine provided with the system. The inspection machine has a conveyer for carrying a solar wafer, an optical inspection system for inspecting the surface and color appearance of the wafer and an illumination inspection system. A holder is provided in the inspection position where the wafer is clamped along its width direction to prevent the wafer from offset. During the opto-electrical inspection, probes are brought into contact with conductive buses of the wafer and light is applied to the wafer to allow the probing of electric energy thus generated. An adjusting device is employed to adjust the clamping gap of the holder and the distance of the probes in accordance with the size of the solar wafer. The data are collected and transmitted to a sorting system for sorting the wafer.
    • 本发明涉及一种设置有该系统的距离调节系统和太阳能晶片检查机。 检查机具有用于承载太阳能晶片的输送机,用于检查晶片的表面和颜色外观的光学检查系统以及照明检查系统。 在检查位置设置保持器,其中晶片沿着其宽度方向被夹紧以防止晶片偏移。 在光电检测期间,探针与晶片的导电总线接触,并且将光施加到晶片以允许探测由此产生的电能。 根据太阳能晶片的尺寸,采用调节装置来调整支架的夹持间隙和探头的距离。 收集数据并将其传输到用于分选晶片的分选系统。