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    • 3. 发明申请
    • BACKSCATTER SYSTEM WITH VARIABLE SIZE OF DETECTOR ARRAY
    • 具有可变尺寸探测器阵列的背光系统
    • WO2012142456A3
    • 2013-01-17
    • PCT/US2012033585
    • 2012-04-13
    • AMERICAN SCIENCE & ENG INCSCHUBERT JEFFREY RCASON WILLIAM RANDALL
    • SCHUBERT JEFFREY RCASON WILLIAM RANDALL
    • G01N23/203G01V5/02
    • G01N23/203
    • A variable-geometry backscatter inspection system has a radiation detector array including one or more backscatter radiation detectors. The position of a second backscatter radiation detector is variable with respect to the position of a first backscatter radiation detector, so that the size of the detector array may be varied by moving the second radiation detector into or out of a predefined alignment with the first radiation detector. The system may include a movable base, and at least one of the detectors is movable with respect to the base. Methods of inspecting an object include forming a detector array by moving a second radiation detector into a predefined alignment with a first radiation detector, illuminating the object with a pencil beam of penetrating radiation, and detecting backscattered radiation with the detector array.
    • 可变几何后向散射检查系统具有包括一个或多个后向散射辐射检测器的辐射检测器阵列。 第二后向散射辐射探测器的位置相对于第一后向散射辐射探测器的位置是可变的,使得探测器阵列的尺寸可以通过将第二辐射探测器移入或移出与第一辐射 探测器。 该系统可以包括可移动基座,并且至少一个检测器可相对于基座移动。 检查物体的方法包括通过将第二辐射检测器移动到与第一辐射检测器的预定义对准中,用穿透辐射的笔形束照射物体并用检测器阵列检测背散射辐射来形成检测器阵列。
    • 5. 发明申请
    • BACKSCATTER SYSTEM WITH VARIABLE SIZE OF DETECTOR ARRAY
    • 具有可变尺寸的检测器阵列的后排系统
    • WO2012142456A2
    • 2012-10-18
    • PCT/US2012/033585
    • 2012-04-13
    • AMERICAN SCIENCE AND ENGINEERING, INC.SCHUBERT, Jeffrey, R.CASON, William, Randall
    • SCHUBERT, Jeffrey, R.CASON, William, Randall
    • G01N23/203G01V5/02
    • G01N23/203
    • A variable-geometry backscatter inspection system has a radiation detector array including one or more backscatter radiation detectors. The position of a second backscatter radiation detector is variable with respect to the position of a first backscatter radiation detector, so that the size of the detector array may be varied by moving the second radiation detector into or out of a predefined alignment with the first radiation detector. The system may include a movable base, and at least one of the detectors is movable with respect to the base. Methods of inspecting an object include forming a detector array by moving a second radiation detector into a predefined alignment with a first radiation detector, illuminating the object with a pencil beam of penetrating radiation, and detecting backscattered radiation with the detector array.
    • 可变几何反向散射检查系统具有包括一个或多个反向散射辐射检测器的辐射检测器阵列。 第二反向散射辐射检测器的位置相对于第一后向散射辐射检测器的位置是可变的,使得可以通过将第二辐射检测器移动到与第一辐射的预定义对准中来改变检测器阵列的尺寸 探测器。 该系统可以包括可移动基座,并且至少一个检测器可相对于基座移动。 检查对象的方法包括:通过将第二辐射检测器移动到与第一辐射检测器预定的对准中来形成检测器阵列,用穿透辐射的笔束照射物体,以及用检测器阵列检测反向散射的辐射。
    • 7. 发明申请
    • BACKSCATTER SYSTEM WITH VARIABLE SIZE OF DETECTOR ARRAY
    • 具有可变尺寸的检测器阵列的后排系统
    • WO2012142456A4
    • 2013-03-21
    • PCT/US2012033585
    • 2012-04-13
    • AMERICAN SCIENCE & ENG INCSCHUBERT JEFFREY RCASON WILLIAM RANDALL
    • SCHUBERT JEFFREY RCASON WILLIAM RANDALL
    • G01N23/203G01V5/02
    • G01N23/203
    • A variable-geometry backscatter inspection system has a radiation detector array including one or more backscatter radiation detectors. The position of a second backscatter radiation detector is variable with respect to the position of a first backscatter radiation detector, so that the size of the detector array may be varied by moving the second radiation detector into or out of a predefined alignment with the first radiation detector. The system may include a movable base, and at least one of the detectors is movable with respect to the base. Methods of inspecting an object include forming a detector array by moving a second radiation detector into a predefined alignment with a first radiation detector, illuminating the object with a pencil beam of penetrating radiation, and detecting backscattered radiation with the detector array.
    • 可变几何反向散射检查系统具有包括一个或多个反向散射辐射探测器的辐射探测器阵列。 第二反向散射辐射检测器的位置相对于第一后向散射辐射检测器的位置是可变的,使得可以通过将第二辐射检测器移动到与第一辐射的预定义对准中来改变检测器阵列的尺寸 探测器。 该系统可以包括可移动基座,并且至少一个检测器可相对于基座移动。 检查对象的方法包括:通过将第二辐射检测器移动到与第一辐射检测器预定的对准中来形成检测器阵列,用穿透辐射的笔束照射物体,以及用检测器阵列检测反向散射的辐射。