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1. 发明申请

US20060246611A1 Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment 审中-公开
标题翻译：用于控制半导体器件测试设备中探针尖端砂磨的方法和设备
公开(公告)号：US20060246611A1
公开(公告)日：2006-11-02
申请号：US11476448
申请日：2006-06-28
申请人： Kwang-Yung Cheong , Jun-Sung Kim , Byung-Wook Choi
发明人： Kwang-Yung Cheong , Jun-Sung Kim , Byung-Wook Choi
IPC分类号： H01L21/66 , G01R31/26
CPC分类号： G01R27/205 , G01R1/06711 , G01R3/00 , G01R35/00
摘要： In a method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment, resistance values of pads of a probed chip are measured and stored. If a maximum resistance value among the stored resistance values is greater than a contact resistance reference value, a consecutive fail counting value and an accumulated fail counting value are increased. An automatic sanding command is generated to activate automatic sanding of a probe tip, when at least one of the consecutive fail counting value and the accumulated fail counting value is greater than a respective counting reference value. In this manner, false negative readings in the testing of semiconductor devices as the result of increased contact resistance between a probe tip and a pad in an EDS test are reduced and therefore device yield is improved.
摘要翻译：在半导体器件测试设备中用于控制探针尖端砂磨的方法和装置中，测量和存储探测芯片的焊盘的电阻值。如果所存储的电阻值中的最大电阻值大于接触电阻基准值，则连续的故障计数值和累计故障计数值增加。当连续故障计数值和累积故障计数值中的至少一个大于相应的计数参考值时，产生自动打磨命令以激活探头尖端的自动打磨。以这种方式，在EDS测试中由于探针尖端和焊盘之间的接触电阻增加而导致的半导体器件测试中的假阴性读数降低，因此器件产量提高。

2. 发明授权

US07094615B2 Method of controlling probe tip sanding in semiconductor device testing equipment 失效
标题翻译：半导体器件测试设备中探针尖端砂磨的控制方法
公开(公告)号：US07094615B2
公开(公告)日：2006-08-22
申请号：US10649250
申请日：2003-08-26
申请人： Kwang-Yung Cheong , Jun-Sung Kim , Byung-Wook Choi
发明人： Kwang-Yung Cheong , Jun-Sung Kim , Byung-Wook Choi
IPC分类号： G01R31/26 , H01L21/66
CPC分类号： G01R27/205 , G01R1/06711 , G01R3/00 , G01R35/00
摘要： In a method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment, resistance values of pads of a probed chip are measured and stored. If a maximum resistance value among the stored resistance values is greater than a contact resistance reference value, a consecutive fail counting value and an accumulated fail counting value are increased. An automatic sanding command is generated to activate automatic sanding of a probe tip, when at least one of the consecutive fail counting value and the accumulated fail counting value is greater than a respective counting reference value. In this manner, false negative readings in the testing of semiconductor devices as the result of increased contact resistance between a probe tip and a pad in an EDS test are reduced and therefore device yield is improved.
摘要翻译：在半导体器件测试设备中用于控制探针尖端砂磨的方法和装置中，测量和存储探测芯片的焊盘的电阻值。如果所存储的电阻值中的最大电阻值大于接触电阻基准值，则连续的故障计数值和累计故障计数值增加。当连续故障计数值和累积故障计数值中的至少一个大于相应的计数参考值时，产生自动打磨命令以激活探头尖端的自动打磨。以这种方式，在EDS测试中由于探针尖端和焊盘之间的接触电阻增加而导致的半导体器件测试中的假阴性读数降低，因此器件产量提高。

3. 发明授权

US06384085B1 Material separated from Ecklonia cava, method for extracting and purifying the same, and use thereof as antioxidants 失效
标题翻译：从Ecklonia cava分离的材料，其提取和纯化方法，并将其用作抗氧化剂
公开(公告)号：US06384085B1
公开(公告)日：2002-05-07
申请号：US09629342
申请日：2000-08-01
申请人： Bong-Ho Lee , Byung-Wook Choi , Geon-Seek Ryu , Sang-Keun Kim , Hyeon-Cheol Shin
发明人： Bong-Ho Lee , Byung-Wook Choi , Geon-Seek Ryu , Sang-Keun Kim , Hyeon-Cheol Shin
IPC分类号： A61K3105
CPC分类号： A61K31/357
摘要： Disclosed are novel materials separated from Ecklonia cava, a method for extracting and purifying the same, and the use thereof for antioxidants. The method comprises extracting antioxidative ingredients from powdered Ecklonia cava one or more times with an organic solvent; fractionating the antioxidative ingredients one or more times in solvents; and purifying the solvent fractions by chromatography. Superior in scavenging activity and thermal stability, the extract from Ecklonia cava can be used as antioxidants and is suitable in commercialization.
摘要翻译：公开了从Ecklonia cava分离的新型材料，其提取和纯化方法，以及其用于抗氧化剂的用途。该方法包括用有机溶剂一次或多次从粉状的Ecklonia cava提取抗氧化成分; 将抗氧化成分在溶剂中分一次或多次; 并通过色谱法纯化溶剂级分。清澈活性和热稳定性优异，Ecklonia cava的提取物可用作抗氧化剂，适用于商业化。

4. 发明授权

US06774145B1 Material separated from Ecklonia cava, method for extracting and purifying the same, and use thereof as antioxidants 失效
标题翻译：从Ecklonia cava分离的材料，其提取和纯化方法，并将其用作抗氧化剂
公开(公告)号：US06774145B1
公开(公告)日：2004-08-10
申请号：US09629341
申请日：2000-08-01
申请人： Bong-Ho Lee , Byung-Wook Choi , Geon-Seek Ryu , Sang-Keun Kim , Hyeon-Cheol Shin
发明人： Bong-Ho Lee , Byung-Wook Choi , Geon-Seek Ryu , Sang-Keun Kim , Hyeon-Cheol Shin
IPC分类号： A61K3103
CPC分类号： A61K31/343 , A61K36/05
摘要： Disclosed are novel materials separated from Ecklonia cava, a method for extracting and purifying the same, and the use thereof for antioxidants. The method comprises extracting antioxidative ingredients from powdered Ecklonia cava one or more times with an organic solvent; fractionating the antioxidative ingredients one or more times in solvents; and purifying the solvent fractions by chromatography. Superior in scavenging activity and thermal stability, the extract from Ecklonia cava can be used as antioxidants and is suitable in commercialization.
摘要翻译：公开了从Ecklonia cava分离的新型材料，其提取和纯化方法，以及其用于抗氧化剂的用途。该方法包括用有机溶剂一次或多次从粉状的Ecklonia cava提取抗氧化成分; 将抗氧化成分在溶剂中分一次或多次; 并通过色谱法纯化溶剂级分。清澈活性和热稳定性优异，Ecklonia cava的提取物可用作抗氧化剂，适用于商业化。

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