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1. 发明申请

US20060193970A1 Rigid flexible printed circuit board and method of fabricating same 失效
标题翻译：刚性柔性印刷电路板及其制造方法
公开(公告)号：US20060193970A1
公开(公告)日：2006-08-31
申请号：US11214965
申请日：2005-08-29
申请人： Bum Myung , Dong Kim , Young Park , Young Yoon , Dek Yang
发明人： Bum Myung , Dong Kim , Young Park , Young Yoon , Dek Yang
IPC分类号： C23C26/00
CPC分类号： H05K3/4691 , C23C26/00 , C23C28/00 , C23C28/023 , H05K3/4652 , H05K2201/0187 , H05K2201/0355 , H05K2201/0382 , H05K2201/09109 , H05K2203/063 , Y10T29/49155
摘要： A rigid flexible printed circuit board (PCB) and a method of fabricating the same. Since a polyimide copper clad laminate is not used during the fabrication of the rigid flexible PCB, an increase in cost resulting from use of the polyimide copper clad laminate and poor reliability of adhesion at an interface between different materials are avoided.
摘要翻译：一种刚性柔性印刷电路板（PCB）及其制造方法。由于在刚性柔性PCB的制造期间不使用聚酰亚胺覆铜层压板，所以避免了使用聚酰亚胺覆铜层压板所产生的成本的增加以及在不同材料之间的界面处的粘附可靠性差。

2. 发明申请

US20060092755A1 Semiconductor test apparatus and control method therefor 失效
标题翻译：半导体测试装置及其控制方法
公开(公告)号：US20060092755A1
公开(公告)日：2006-05-04
申请号：US11303191
申请日：2005-12-16
申请人： Kazuhiko Sato , Sae-Bum Myung , Hiroyuki Chiba
发明人： Kazuhiko Sato , Sae-Bum Myung , Hiroyuki Chiba
IPC分类号： G11C8/18
CPC分类号： G01R31/31928 , G11C29/56 , G11C29/56004 , G11C2029/5606
摘要： There is provided a semiconductor test apparatus including: a first waveform generating means that generates a common pattern waveform corresponding to common information common to each of a plurality of semiconductor devices; a plurality of second waveform generating means that generates individual pattern waveforms corresponding to a plurality of individual information individually prepared in response to each of the plurality of semiconductor devices; and a waveform switching unit that selectively performs an operation of inputting the common pattern waveform generated from the first waveform generating means in common and an operation of inputting the individual pattern waveforms respectively generated from the plurality of second waveform generating means individually, into each of the plurality of semiconductor devices.
摘要翻译：提供了一种半导体测试装置，包括：第一波形发生装置，其产生与多个半导体器件中的每一个共用的公共信息相对应的公共图案波形; 多个第二波形发生装置，其产生对应于响应于所述多个半导体器件中的每一个单独准备的多个个别信息的各个图形波形; 以及波形切换单元，其选择性地执行输入从第一波形发生装置产生的公共模式波形的共同操作和将从多个第二波形产生装置分别产生的各个模式波形分别输入到多个半导体器件。

3. 发明授权

US07356435B2 Semiconductor test apparatus and control method therefor 失效
标题翻译：半导体测试装置及其控制方法
公开(公告)号：US07356435B2
公开(公告)日：2008-04-08
申请号：US11303191
申请日：2005-12-16
申请人： Kazuhiko Sato , Sae-Bum Myung , Hiroyuki Chiba
发明人： Kazuhiko Sato , Sae-Bum Myung , Hiroyuki Chiba
IPC分类号： G06F19/00
CPC分类号： G01R31/31928 , G11C29/56 , G11C29/56004 , G11C2029/5606
摘要： There is provided a semiconductor test apparatus including: a first waveform generating means that generates a common pattern waveform corresponding to common information common to each of a plurality of semiconductor devices; a plurality of second waveform generating means that generates individual pattern waveforms corresponding to a plurality of individual information individually prepared in response to each of the plurality of semiconductor devices; and a waveform switching unit that selectively performs an operation of inputting the common pattern waveform generated from the first waveform generating means in common and an operation of inputting the individual pattern waveforms respectively generated from the plurality of second waveform generating means individually, into each of the plurality of semiconductor devices.
摘要翻译：提供了一种半导体测试装置，包括：第一波形发生装置，其产生与多个半导体器件中的每一个共用的公共信息相对应的公共图案波形; 多个第二波形发生装置，其产生对应于响应于所述多个半导体器件中的每一个单独准备的多个个别信息的各个图形波形; 以及波形切换单元，其选择性地执行输入从第一波形发生装置产生的公共模式波形的共同操作和将从多个第二波形发生装置分别产生的各个模式波形分别输入到多个半导体器件。

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