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    • 1. 发明申请
    • GAS ANALYZER
    • 气体分析仪
    • US20100076712A1
    • 2010-03-25
    • US12595821
    • 2008-04-02
    • Junji AokiHirokazu KitauraBoumsellek Said
    • Junji AokiHirokazu KitauraBoumsellek Said
    • B01D59/44H01J49/00G01L27/00
    • H01J49/0009G01L21/30H01J41/02H01J41/10H01J49/0027
    • A gas analyzer using a quadrupole mass spectrometric method etc. is provided with an ionizer 211 to ionize a sample gas, a first ion detector 212 and a second ion detector 213 each configured to detect a respective ion from ionizer 211, and each being disposed a respective distance from the ionizer 211 on an opposite side of the ionizer 211, the respective distances being different from each other, a filter 214 interposed between the ionizer 211 and the first ion detector 212 to selectively allow ions from the ionizer 211 to pass therethrough, and an arithmetic device 3 to correct a partial pressure PP1 of a specific component obtained from the first ion detector 212 and selected by the filter 214 by using a first total pressure TP1 of the sample gas obtained from the first ion detector 212 and a second total pressure TP2 of the sample gas obtained from the second ion detector 213.
    • 使用四极质谱法的气体分析仪等设置有离子化器211以离子化样品气体,第一离子检测器212和第二离子检测器213,每个被配置为检测来自离子发生器211的各离子,并且每个离子化 在离子交换器211的相对侧上离离电离器211的相应距离,各自的距离彼此不同,插入在离子发生器211和第一离子检测器212之间的滤波器214,以选择性地允许来自离子发生器211的离子通过, 以及算术装置3,其通过使用从第一离子检测器212获得的样品气体的第一总压TP1和第二总量来校正由第一离子检测器212获得并由过滤器214选择的特定成分的分压PP1, 从第二离子检测器213获得的样品气体的压力TP2。