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    • 4. 发明授权
    • Bending test apparatus
    • 弯曲试验装置
    • US4573360A
    • 1986-03-04
    • US586038
    • 1984-03-05
    • Akiyoshi Yoneda
    • Akiyoshi Yoneda
    • G01N3/00G01N3/20
    • G01N3/20
    • The present invention relates to a bending test apparatus comprising a first bending device mounted on a vertically slidable rack. Test piece gripping means are mounted on arms attached to sector gears arranged such that when the first bending device and the rack are moved vertically downward toward the test piece, the rack engages with the sector gears so as to upwardly and inwardly swing the gripping devices. A pair of slidable devices for further bending the test piece are arranged on opposite sides of the first testing device and are adapted to converge on the test piece to further bend it after it has been previously bent by the first bending device.
    • 弯曲试验装置技术领域本发明涉及一种弯曲试验装置,其包括安装在可垂直滑动的支架上的第一弯曲装 试件夹紧装置安装在附接到扇形齿轮的臂上,所述臂布置成使得当第一弯曲装置和支架垂直向下移动朝向试验片时,齿条与扇形齿轮啮合,从而向上和向内摆动夹紧装置。 用于进一步弯曲测试件的一对滑动装置设置在第一测试装置的相对侧上,并适于会聚在测试件上,以便在预先被第一弯曲装置弯曲之后使其进一步弯曲。