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    • 1. 发明申请
    • SYSTEM AND METHOD FOR THREE-DIMENSIONAL INSPECTION USING PATTERNED LIGHT PROJECTION
    • 用于使用图案化光投影进行三维检测的系统和方法
    • WO0016071A8
    • 2000-06-15
    • PCT/US9912706
    • 1999-06-07
    • ACUITY IMAGING LLCHALLERMAN GREGORY RLUDLOW JONATHAN ESTERN HOWARD K
    • HALLERMAN GREGORY RLUDLOW JONATHAN ESTERN HOWARD K
    • G01N21/88G01B11/24
    • G01N21/88G01N21/8806
    • An inspection system (10) is used to obtain three-dimensional information pertaining to an article (12) having elements with specular surfaces, such as the solder balls on a BGA device. The system includes patterned light projector (20) which projects a pattern at an oblique angle ( alpha ) with respect to the plane of the article (12) and an image detector (24) disposed generally above the article (12). The light projector (20) includes an extended light source (30) and a light patterning member (32) disposed such that the light pattern is in focus in an image plane parallel to the plane of the article (12), satisfying the Scheimpflug condition. The spacing of the lines is preferably greater than a spacing or pitch of the specular elements. An image processor (26) is coupled to the image detector (24) to receive the image and measure the lateral shift of the lines to determine height information using triangulation.
    • 使用检查系统(10)来获得与具有镜面的元件(例如BGA装置上的焊球)的物品(12)有关的三维信息。 该系统包括图案化的光投射器(20)和图像检测器(24),图案化的光投射器(20)相对于物品(12)的平面以倾斜角度(α)投影图案,图像检测器(24)大致设置在物品(12)上方。 光投射器(20)包括延伸光源(30)和光构图构件(32),光构图构件(32)布置成使得光图案在与物品(12)的平面平行的图像平面内聚焦,满足Scheimpflug条件 。 线的间距优选地大于镜面元件的间距或间距。 图像处理器(26)耦合到图像检测器(24)以接收图像并测量线的横向偏移以使用三角测量来确定高度信息。
    • 2. 发明申请
    • Flexible processing hardware architecture
    • 灵活的处理硬件架构
    • US20020019924A1
    • 2002-02-14
    • US09977413
    • 2001-10-15
    • Acuity Imaging, LLC
    • David C. DaviesMichael P. GreenbergMichael J. WiltJohn E. Agapakis
    • G06F015/00G06F015/76
    • G06F13/4027G06T1/60G06T5/20
    • A flexible, reconfigurable processing system architecture allows for the implementation of a variety of processing system configurations to be implemented on a single device, which is preferably a PCI bus add-in extension board with an attached daughter card attached and electrically connected thereto through a PCI Mezzanine type connector, and which is plugged into a personal computer PCI expansion slot. The architecture uses the PCI bus, for example, as the local CPU bus for an embedded processor, which not only allows for flexibility in system configuration but also allows PCI devices to be hidden from the host CPU to allow for proper system startup. The architecture further permits an embedded processing CPU to be re-booted when the secondary PCI bus host bus bridge fails to respond without affecting host CPU or other secondary PCI bus peripheral devices. The architecture provides a method of loading an embedded system CPU's local memory with operating system and diagnostic code without the use of ROM or FLASH memory. A system and method of reserving memory is also disclosed which utilizes a dummy or surrogate board with little of no functionality but which has a class code of a common device such as an Ethernet card. The primary system BIOS will read the class code and reserve memory based on the surrogate card. The driver of the non-standard card such as an embedded processor, can then use the memory apace allocated to the surrogate card by the BIOS.
    • 灵活的可重新配置的处理系统架构允许实现在单个设备上实施的各种处理系统配置,其优选地是PCI总线附加扩展板,附加的子卡通过PCI连接并与其电连接 夹层式连接器,并插入个人计算机PCI扩展槽。 该架构使用PCI总线作为嵌入式处理器的本地CPU总线,这不仅允许系统配置的灵活性,而且允许从主机CPU隐藏PCI设备以允许正确的系统启动。 当辅助PCI总线主机总线桥接器无法响应而不影响主机CPU或其他辅助PCI总线外围设备时,架构还允许重新引导嵌入式处理CPU。 该架构提供了一种使用操作系统和诊断代码加载嵌入式系统CPU本地存储器的方法,而无需使用ROM或FLASH存储器。 还公开了一种保留存储器的系统和方法,其利用具有很少功能但具有诸如以太网卡的公共设备的类代码的虚拟或替代板。 主系统BIOS将读取类代码,并根据代理卡预留内存。 非标准卡的驱动程序(如嵌入式处理器)可以使用由BIOS分配给替代卡的内存空间。
    • 3. 发明专利
    • DE69826837D1
    • 2004-11-11
    • DE69826837
    • 1998-01-29
    • ACUITY IMAGING LLC NASHUA
    • KING JOSEPHLUDLOW EDMUNDSCHURR GEORGE
    • G01B11/03G01N21/88G01N21/956G06T1/00H05K13/08G06T7/00
    • The present invention relates to inspection systems and methods, and in particular to a method for inspecting surfaces and objects using a ring illumination apparatus. A reflected image from the inspected surface or object includes a pattern of reflected image elements representing a pattern of illuminated reflective elements on an article. The method comprises the steps of: locating this pattern of reflected image elements in the reflected image; dividing at least one reflected image element into a plurality of pixels, each pixel having a gray scale value corresponding to an intensity level of reflected light in the reflected image element; positioning at least one vector across the reflected image element; examining a series of pixels along said at least one vector in order to determine at least one dimension or feature of the reflected image element; and determining inspection information pertaining to the illuminated reflective element represented by said at least one reflected image element using said determined at least one dimension or feature.
    • 8. 发明专利
    • INSPECTION METHOD
    • CA2282498A1
    • 1998-09-03
    • CA2282498
    • 1998-01-29
    • ACUITY IMAGING LLC
    • KING STEVEN JOSEPHLUDLOW JONATHAN EDMUNDSCHURR GEORGE
    • G01B11/03G01N21/88G01N21/956G06T1/00H05K13/08
    • An inspection system (10) and method use a ring illumination apparatus (20) to illuminate one or more reflective elements (12), such as solder balls on an electronic component (14) or other protruding surfaces or objects. The ring illumination apparatus (20) includes a substantially ring-shaped light source (24) that provides a substantially even illumination across the one or more reflective elements (12). An illumination detection device (30) detects light beams (32) reflecting off of the illuminated reflective elements (12) for forming a reflected image. A method of processing the reflected image includes locating one or more points on each reflected image element (110) representing an illuminated reflective element. The points on the reflected image elements are used to locate the pattern of the reflected image elements and/or to fit an outline (120) around each image element corresponding to a known percentage of the true dimensions of each solder ball or other reflective element. The inspection system and method thereby determine various characteristics (130) such as the absence/presence, location, pitch, size and shape of each reflective element.