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1. 发明专利

JP2005164565A Defect detection method for flat panel light- related plate element in low and high resolution images 审中-公开
标题翻译：低分辨率高分辨率图像平板光相关板元件缺陷检测方法
公开(公告)号：JP2005164565A
公开(公告)日：2005-06-23
申请号：JP2004020904
申请日：2004-01-29
申请人： 3B System Inc , 3ビーシステムインコーポレーテッド
发明人： KUWAKU DON MIN , SEON YOUNG CHUL , CHIOI DOUU HYUN , PARK KIRU HOU , KIM UU SEO , JUN CHAN JI , OU JON WAN , LEE KYUU BON
IPC分类号： G01N21/88 , G01M11/00 , G06T1/00
摘要： PROBLEM TO BE SOLVED: To provide a defect detection method for a flat panel light-related plate in low and high resolution images by using a computer vision technology and high speed image processing algorithm.
SOLUTION: In this defect detection on the low resolution image, the image is smoothed by dividing it into blocks for correcting erroneous detection due to overall luminance change, and when the result of comparison of the image with a critical value shows deviation from the range, an abnormal pixel is determined. If at least two or more abnormal pixels are gathered, a speckle is determined. In defect detection on the high resolution image, the pattern is removed when the image includes a periodical pattern, and when the result of comparison of the image with the critical value shows deviation from the range, an abnormal pixel is determined. The adjacent abnormal pixels are grouped, and if the image of the adjacent pixels corresponds to a defect with a defect pixel number and below a predetermined luminance standard, it is processed as a point defect. If the grouped pixels correspond to a defect with the defect pixel number and above the predetermined luminance standard, it is processed as a foreign matter defect.
COPYRIGHT: (C)2005,JPO&NCIPI
摘要翻译：要解决的问题：通过使用计算机视觉技术和高速图像处理算法来提供低分辨率图像中的平板灯相关板的缺陷检测方法。解决方案：在低分辨率图像的缺陷检测中，通过将图像分割成用于校正由于整体亮度变化引起的错误检测的块来平滑图像，并且当图像与临界值的比较结果显示偏离该范围，异常像素被确定。如果聚集了至少两个以上的异常像素，则确定散斑。在高分辨率图像的缺陷检测中，当图像包括周期性图案时，图案被去除，并且当图像与临界值的比较结果显示偏离该范围时，确定异常像素。相邻的异常像素被分组，并且如果相邻像素的图像对应于具有缺陷像素数并且低于预定亮度标准的缺陷，则其被处理为点缺陷。如果分组的像素对应于具有缺陷像素数并且高于预定亮度标准的缺陷，则其被处理为异物缺陷。版权所有（C）2005，JPO＆NCIPI

2. 发明专利

JP2006203944A Structure with rfid chip and antenna 有权
标题翻译： RFID芯片和天线的结构
公开(公告)号：JP2006203944A
公开(公告)日：2006-08-03
申请号：JP2006103510
申请日：2006-04-04
申请人： 3B System Inc , 3ビーシステムインコーポレーテッド
发明人： HYUN WON GYU , CHUN BYEONG UK
IPC分类号： G06K19/07 , H04B5/02 , G06K17/00 , G06K19/077 , G06K19/10 , H01Q1/24 , H01Q7/00 , H01Q7/06 , H01Q21/08
摘要： PROBLEM TO BE SOLVED: To enable it to realize a radio frequency transmission with a RF chip and a structure of an antenna correspondingly one to one through a large number sets of remote antennas of the large number of reader machines or reed/light machines, constituting a plurality of reader machines or reed/light machines connected with two or more remote antennas. SOLUTION: In the RF communication module with a first antenna and the RF chip and a structure of the antenna with a second antenna for communication, the second antenna consists of a single loop formed in at least two fields of the structure of the RF chip and the antenna, and is connected with one radio frequency chip. COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：为了使其能够通过大量读取机的大量远程天线或芦苇/光线实现与RF芯片的射频传输和天线的结构相对应地一一对应机器，构成与两个或更多个远程天线连接的多个读取机或芦苇/光机。解决方案：在具有第一天线和RF芯片的RF通信模块和具有用于通信的第二天线的天线的结构中，第二天线由形成在该结构的至少两个场中的单个环路 RF芯片和天线，并与一个射频芯片连接。版权所有（C）2006，JPO＆NCIPI

3. 发明专利

JP2004274744A Rf communication system of one-to-one correspondence method between each rf chip having single antenna and reader, and structure with rf id chip and antenna 审中-公开
公开(公告)号：JP2004274744A
公开(公告)日：2004-09-30
申请号：JP2004053719
申请日：2004-02-27
申请人： 3B System Inc , 3ビーシステムインコーポレーテッド
发明人： HYUN WON GYU , CHUN BYEONG UK
IPC分类号： G06K19/07 , G06K17/00 , H01Q1/24 , H01Q7/00 , H01Q7/06 , H01Q21/08 , H04B5/02
摘要： PROBLEM TO BE SOLVED: To provide an RF communication system of a one-to-one correspondence method between RF chips each having a single antenna and readers to realize RF communication of the readers in structures each comprising the RF chip and the antenna by means of one-to-one correspondence through remote antennas of multiple of readers or multiple sets of readers / writers, the system comprising a plurality of the readers or readers / writers connected to a plurality of the remote antennas and to provide the structures each comprising the RF chip and the antenna. SOLUTION: The RF communication system is provided with: a containing section wherein the structures each comprising the RF chip and the single loop second antenna and including many RF chips and many antennas are arranged at least in a line so that the second antennas are adjacent to each other at a prescribed interval; many first antennas each respectively arranged to each second antenna so as to attain RF communication with each of the single second antennas when the structures comprising the RF chips and the antennas are arranged in the containing section; a paramagnetic material for minimizing communication interference between the first and second antennas, a signal level regulation circuit; a noise filter for eliminating noise from a power supply section; and a switching means for separately driving the first and second antennas. COPYRIGHT: (C)2004,JPO&NCIPI

4. 发明公开

KR20120031835A Apparatus for inspecting defects 无效
标题翻译：检查缺陷的装置
公开(公告)号：KR20120031835A
公开(公告)日：2012-04-04
申请号：KR20100093457
申请日：2010-09-27
申请人： 3B SYSTEM INC
发明人： LEE JE SUN , KIM GYEONG DEOK , KIM JONG WOO
IPC分类号： G01N21/88 , G01B11/24
摘要： PURPOSE: An apparatus for inspecting defects is provided to remove unnecessary noise from inspection image of defects because a target image using the light of relevant wave length does not get influenced by light of other wave lengths. CONSTITUTION: An apparatus for inspecting defects comprises a first light source(110), a second light source(120), a first camera(130), a second camera(140), a dichroic mirror(150), and an image processing part(160). The first light source makes light of first wave length irradiate to a target object(10). The second light source irradiates light of second wave length shorter than the first wave length to the target object. The first camera gets image of the target object using the light reflected by the target object after irradiating from the first light source. The second camera gets image of the target object using the light reflected by the target object after irradiating from the second light source. The dichroic mirror gets the light reflected by the target object after irradiating the first or the second light source. The image processing part combines the images getting from the first and second cameras by arranging the images by turns.
摘要翻译：目的：提供用于检查缺陷的装置，以消除缺陷检查图像中的不必要的噪音，因为使用相关波长的光的目标图像不受其他波长的光的影响。构成：用于检查缺陷的装置包括第一光源（110），第二光源（120），第一照相机（130），第二照相机（140），分色镜（150）和图像处理部分（160）。第一光源使第一波长的光照射到目标物体（10）。第二光源将比第一波长短的第二波长的光照射到目标物体。第一相机在从第一光源照射之后，使用由目标对象反射的光来获得目标对象的图像。第二相机在从第二光源照射之后，使用由目标物体反射的光来获得目标物体的图像。二向色镜在照射第一光源或第二光源之后获得由对象物体反射的光。图像处理部分通过轮流布置图像来组合来自第一和第二相机的图像。

5. 发明公开

KR20100101259A Optical apparatus for inspection 有权
标题翻译：光学检测装置
公开(公告)号：KR20100101259A
公开(公告)日：2010-09-17
申请号：KR20090019652
申请日：2009-03-09
申请人： 3B SYSTEM INC
发明人： LEE JAE SUS , CHANG KI SOO
IPC分类号： G01B11/16 , G02B5/00 , G02B13/00
CPC分类号： G02B5/12 , G01N21/8901 , G02B27/50
摘要： PURPOSE: An optical inspection device for defects is provided to accurately recognize defects of an object by obtaining an image with high-sensitivity even if mechanical vibration is generated. CONSTITUTION: An optical inspection device for defects comprises a light source(25), a retro-reflective plate(31), an imaging lens(21), a camera, and a knife edge(13). The light source irradiates light to an object. The retro-reflective plate retro-reflects reflected light to the object. The imaging lens images the reflected light. The camera photographs the light through the imaging lens. The knife edge is installed between the imaging lens and the object and is formed in a plate shape.
摘要翻译：目的：提供一种用于缺陷的光学检查装置，即使产生机械振动，也可以通过获得高灵敏度的图像来精确地识别物体的缺陷。构成：用于缺陷的光学检查装置包括光源（25），回射反射板（31），成像透镜（21），相机和刀刃（13）。光源将光照射到物体上。反光板将反射光反射回物体。成像透镜对反射光进行成像。相机通过成像镜头拍摄光线。刀刃安装在成像镜片和物体之间并形成为板状。

6. 发明申请

WO2012020932A3 DEFECT INSPECTING DEVICE AND DEFECT INSPECTING METHOD USING SAME 审中-公开
标题翻译：缺陷检查设备和使用相同的缺陷检查方法
公开(公告)号：WO2012020932A3
公开(公告)日：2012-05-31
申请号：PCT/KR2011005427
申请日：2011-07-22
申请人： 3B SYSTEM INC , LEE JE SUN , KIM GYEONG DEOK , KIM JONG WOO , CHANG KI SOO , LEE JONG SIK
发明人： LEE JE SUN , KIM GYEONG DEOK , KIM JONG WOO , CHANG KI SOO , LEE JONG SIK
IPC分类号： G01N21/88 , G01B11/30 , G02B5/12
CPC分类号： G01N21/8806 , G01B11/303 , G02B21/22
摘要： The present invention pertains to a defect inspecting device, which comprises: a first optical unit for collimating each pair of rays so as to irradiate the same to an inspection position of an object to be inspected, wherein the pair of rays overlap each other at the edges thereof so that the overlapped areas is irradiated to the inspection position, a second optical unit for collimating each pair of rays so as to irradiate the same to the inspection position, wherein the pair of rays overlap each other at the edges thereof so that the overlapped area is irradiated to the inspection position; a control section for controlling the first optical unit and the second optical unit to be lighted alternately; and a camera for photographing the image of the inspection position using the incident light which is irradiated from the first optical unit or the second optical unit and then reflected from the inspection position.
摘要翻译：本发明涉及一种缺陷检查装置，其包括：第一光学单元，用于准直每对光线，以将其照射到被检查物体的检查位置，其中所述一对光线在边缘，使得重叠区域照射到检查位置，第二光学单元，用于准直每对光线，以便将其照射到检查位置，其中该对光线在其边缘处彼此重叠，使得重叠区域照射到检查位置; 控制部分，用于交替地控制所述第一光学单元和所述第二光学单元被点亮; 以及用于使用从第一光学单元或第二光学单元照射并然后从检查位置反射的入射光来拍摄检查位置的图像的照相机。

7. 发明申请

WO2004040508A1 SMART CARD OF A COMBINATION TYPE PROVIDING WITH A STABLE CONTACTLESS COMMUNICATION APPARATUS 审中-公开
标题翻译：组合类型智能卡提供稳定的无连接通信设备
公开(公告)号：WO2004040508A1
公开(公告)日：2004-05-13
申请号：PCT/KR2003/000837
申请日：2003-04-25
申请人： 3B SYSTEM, INC. , CHOI, Beak-Young , BYUN, Su-Ryong
发明人： CHOI, Beak-Young , BYUN, Su-Ryong
IPC分类号： G06K19/077
CPC分类号： G06K19/07749 , G06K19/077 , G06K19/07769
摘要： The present invention is to provide technology on a smart card of a combination type wherein the prior art milling process removed and a lamination process is used after connection between a chip on a COB and an antenna in order to improve physical reliability of a smart card of a combination type, thereby reducing the manufacturing cost of the smart card of a combination type and being capable of taking charge of an important role in introduction of a multiple-operation system of a smart card into a market and in market extension. The smart card according to the present invention comprises three or less lines in an antenna terminal portion as shown as reference numeral (2) in Fig. 6 so as to minimize an overlapped portion(A in Fig. 4a) between the antenna terminal portion and the COB for minimizing a value C mount.
摘要翻译：本发明是提供一种组合型智能卡上的技术，其中在COB上的芯片与天线之间的连接之后，去除了现有技术的铣削过程并且使用层压工艺，以提高智能卡的智能卡的物理可靠性组合型，从而降低组合型智能卡的制造成本，并且能够在将智能卡的多操作系统引入市场和市场扩展中起重要作用。根据本发明的智能卡在图1中的附图标记（2）所示的天线端子部分中包括三条或更少线。 6，以便最小化天线端子部分和COB之间的重叠部分（图4a中的A），以使值安装最小化。

8. 发明申请

WO2011083989A3 DEFECT INSPECTION DEVICE 审中-公开
标题翻译：缺陷检测装置
公开(公告)号：WO2011083989A3
公开(公告)日：2011-11-10
申请号：PCT/KR2011000086
申请日：2011-01-06
申请人： 3B SYSTEM INC , LEE JE SUN , CHANG KI SOO , CHOI BAEK YOUNG
发明人： LEE JE SUN , CHANG KI SOO , CHOI BAEK YOUNG
IPC分类号： G01N21/88 , G01B11/30
CPC分类号： G01N21/95 , G01N2021/9513
摘要： The defect inspection device of the present example comprises: a first light source for shining a first light onto an inspection object; a retroreflective plate which retroreflects the first light reflected from the inspection object such that the first light again falls incident on the inspection object; a second light source which shines a second light onto the inspection object; and a camera which captures an image of the inspection object from the first light, which has been retroreflected and made to again fall incident on the inspection object by means of the retroreflective plate, and the second light emitted from the second light source.
摘要翻译：本实例的缺陷检查装置包括：用于将第一光照射到检查对象上的第一光源; 回射板，其使从所述检查对象反射的所述第一光回射，以使所述第一光再次入射到所述检查对象上; 将第二光照射到检查对象上的第二光源; 以及照相机，该照相机从已经被回射并且通过逆反射板再次落在检查对象上的第一光和从第二光源发射的第二光捕获检查对象的图像。

9. 发明申请

WO2010104265A2 INSPECTION DEVICE FOR DEFECT INSPECTION 审中-公开
标题翻译：检查装置缺陷检查
公开(公告)号：WO2010104265A2
公开(公告)日：2010-09-16
申请号：PCT/KR2009007560
申请日：2009-12-17
申请人： 3B SYSTEM INC , LEE JE SUN , CHANG KI SOO
发明人： LEE JE SUN , CHANG KI SOO
IPC分类号： G01B11/16 , G02B5/00 , G02B13/00
CPC分类号： G02B5/12 , G01N21/8901 , G02B27/50
摘要： The present invention comprises an inspection method for transparent or reflective inspection objects, by using a retroreflective plate as a convex lens or concave mirror in such a way that defects can be detected in a stable fashion even if the inspection object is curved or if vibration occurs during movement of the inspection object; in which displacement of parallel light passing through or reflected in a measurement field is captured by using changes which occur in an inspection field, namely changes in the density gradient in the case of transmission inspection or in the reflection angle in the case of reflection inspection. The present invention also comprises an inspection device for defect inspection, in which a knife edge is provided, horizontally to the optical axis, on the front surface of a camera lens for collecting the transmitted light or reflected light, in such a way that three-dimensional defect images can be obtained since any light which diverges from the parallel light is blocked with consequent changes in the contrast of the light due to the density gradient in the inspection field at the camera.
摘要翻译：本发明包括用于透明或反射检查对象的检查方法，通过使用回射板作为凸透镜或凹面镜，即使检查对象是弯曲的或者如果发生振动，也可以以稳定的方式检测到缺陷在检查对象移动期间; 其中通过使用在检查场中发生的变化，即传输检查的情况下的密度梯度的变化或反射检查的情况下的反射角，来捕获穿过测量场或反射到测量场的平行光的位移。本发明还包括一种用于缺陷检查的检查装置，其中在用于收集透射光或反射光的照相机镜头的前表面上提供相对于光轴水平的刀刃，因为从平行光中发散的任何光都被阻挡，从而由于照相机的检查场中的密度梯度引起的光的对比度的变化而获得三维缺陷图像。

10. 发明申请

WO2004023386A1 COMBINATION-TYPE IC CARD AND METHOD OF MANUFACTURING THE COMBINATION-TYPE IC CARD 审中-公开
标题翻译：组合型IC卡及其组合型IC卡的制造方法
公开(公告)号：WO2004023386A1
公开(公告)日：2004-03-18
申请号：PCT/KR2003/000832
申请日：2003-04-24
申请人： 3B SYSTEM, INC. , BYUN, Su-Ryong
发明人： BYUN, Su-Ryong
IPC分类号： G06K19/07
CPC分类号： G06K19/07769 , G06K19/077 , G06K19/07745 , G06K19/07749 , G06K19/0775 , H01L2224/48227 , H01L2224/48228 , H01L2224/49109 , H01L2924/01057
摘要： The present invention provides with a combination-type IC card, that can remove badness fundamentally and epochally and be manufactured easily and inexpensively. The combination-type IC card is characterized by comprising: a front sheet (50) and an intermediate sheet (60) each having an insertion opening (51 or 61) into which a board (12 or 32) and an IC chip (11a or 31a) are inserted, each contact terminal (72) of a loof antenna (70) being arranged so as to be in electrical contact with each of the loop antenna contact portions (16 or 36) of the board (12 or 32) when the board (12 or 32) and the IC chip (11a or 31a) are inserted into the insertion openings (51) and (61).
摘要翻译：本发明提供一种组合型IC卡，其可以从根本上和划时代地去除不良情况并且容易且廉价地制造。组合型IC卡的特征在于包括：前片（50）和中间片（60），每个片具有插入开口（51或61），板（12或32）和IC芯片（11a或 31a）插入时，天线（70）的每个接触端子（72）布置成与板（12或32）的每个环形天线接触部分（16或36）电接触，板（12或32）和IC芯片（11a或31a）插入到插入开口（51）和（61）中。

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