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1. 发明专利

JP2011017548A Hardness measuring penetrator and method for manufacturing the same 审中-公开
标题翻译：硬度测量穿透器及其制造方法
公开(公告)号：JP2011017548A
公开(公告)日：2011-01-27
申请号：JP2009160669
申请日：2009-07-07
申请人： Hyogo College Of Medicine , Sanei Me:Kk , 学校法人兵庫医科大学 , 有限会社三栄エムイー
发明人： SHIMIZU AKIHIKO , UEHARA TADAO
IPC分类号： G01N3/42 , A61C19/04
摘要： PROBLEM TO BE SOLVED: To provide a hardness measuring penetrator capable of accurately measuring the hardness, over a large number of times of measurements.SOLUTION: The hardness measuring penetrator 10 is used for measuring the hardness of an object 90 to be measured, having an electrically conductive surface and the penetrator 10 includes its body 11 including a conductive material and the insulating chip 12 attached to the leading end of the body 11 to be pressed to the object 90 to be measured. The boundary line 14 of the body 11 and the insulating chip 12 on the outer peripheral surface 15 of the penetrator 10 is positioned within the plane B vertical to the long axis 13 of the penetrator 10. Since the penetrator 10 does not contain the film for covering the surface of the penetrator 10, peeling of the film by a large number of times of measurements and lowering of measurement accuracy accompanying the peeling of the film do not arise. The penetrator 10 can measure accurate hardness over a large number of times of measurements.
摘要翻译：要解决的问题：提供能够在大量测量中精确测量硬度的硬度测量穿透器。解决方案：硬度测量穿透器10用于测量待测物体90的硬度，具有导电表面和穿透器10包括其主体11，其包括导电材料和绝缘芯片12，该绝缘芯片12附接到主体11的前端以被压到要测量的对象90。主体11的边界线14和穿透器10的外周面15上的绝缘芯片12位于与穿透器10的长轴13垂直的平面B内。由于穿透器10不包含用于覆盖穿透器10的表面，不会出现伴随剥离膜的大量测量和降低测量精度的膜的剥离。穿透器10可以在大量测量时测量精确的硬度。

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