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1. 发明专利

JP4809168B2 Bottle container inspection equipment 有权
公开(公告)号：JP4809168B2
公开(公告)日：2011-11-09
申请号：JP2006252602
申请日：2006-09-19
申请人：アサヒ飲料株式会社 , 丸紅テクノシステム株式会社
发明人：陽一加藤 , 浩明卜部 , 彰朗平澤
IPC分类号： G01N21/90 , B07C5/10

2. 发明专利

JP2008076081A Bottle container inspection device 有权
标题翻译：瓶装集装箱检查装置
公开(公告)号：JP2008076081A
公开(公告)日：2008-04-03
申请号：JP2006252602
申请日：2006-09-19
申请人： Asahi Soft Drinks Co Ltd , Marubeni Techno-Systems Corp , アサヒ飲料株式会社 , 丸紅テクノシステム株式会社
发明人： URABE HIROAKI , KATO YOICHI , HIRASAWA AKIRO
IPC分类号： G01N21/90 , B07C5/10
摘要： PROBLEM TO BE SOLVED: To provide a bottle container inspection device capable of performing high-speed conveyance of a bottle container, and inspecting easily the whole bottle container such as a neck part or a shell part.
SOLUTION: This bottle container inspection device 1 inspecting the bottle container B, while conveying the bottle container B having a flange F on the neck part N in the erected state with the neck part N faced upward, is equipped with a neck part grasping conveyance unit 5 for grasping the bottle neck part N and conveying it, a shell part grasping conveyance unit 7 for grasping the shell part M of the bottle container B and conveying it, a shell part inspection part 15 for inspecting the bottle shell part B, and a neck part inspection part 37 for inspecting the bottle neck part N. The neck part grasping conveyance unit 5 is provided with the shell part inspection part 15, and the shell part grasping conveyance unit 5 is provided with the neck part inspection part 37.
COPYRIGHT: (C)2008,JPO&INPIT
摘要翻译：解决的问题：提供一种能够进行瓶容器的高速输送的瓶容器检查装置，容易地检查诸如颈部或壳部的整个瓶容器。解决方案：该瓶容器检查装置1检查瓶容器B，同时在颈部N面向上方的同时以直立状态将颈部N上的具有凸缘F的瓶子B输送到颈部，用于抓住瓶颈部N并将其输送的抓取传送单元5，用于抓住瓶容器B的壳部M并将其传送的壳部抓持输送单元7，用于检查瓶壳部B的壳部检查部15 以及用于检查瓶颈部N的颈部检查部37.颈部把持输送部5设置有壳部检查部15，壳部抓持输送部5设置有颈部检查部37 版权所有（C）2008，JPO＆INPIT

3. 发明专利

JP2006167632A Heavy metal recovery system from heavy metal absorbing plant 有权
标题翻译：重金属吸收装置重金属恢复系统
公开(公告)号：JP2006167632A
公开(公告)日：2006-06-29
申请号：JP2004364882
申请日：2004-12-16
申请人： Marubeni Techno-Systems Corp , Taisei Corp , Tsukishima Kikai Co Ltd , 丸紅テクノシステム株式会社 , 大成建設株式会社 , 月島機械株式会社
发明人： YOSHIDA MITSUTAKE , SAITO YUJI , HIRONO TAKESHI , KAWAHARA MASATO , TERAJIMA KAZUHIDE , KANEKO SEIJI , SATO MASANORI , OKUDA NAOYUKI , TORIGOE HIROAKI
IPC分类号： B09B3/00 , C02F1/62 , C12P7/08 , C22B7/00 , C22B13/00 , C22B17/00 , C22B30/04
CPC分类号： Y02P10/234 , Y02P10/238
摘要： PROBLEM TO BE SOLVED: To provide a heavy metal recovery system from heavy metal absorbing plant bodies and its method reducing possibility of occurrence of various problems like scattering of heavy metals by incineration, and allowing effective utilizing of plant biomass, having less environmental load.
SOLUTION: This heavy metal recovery method from heavy metal absorbing plant bodies comprises processes for: hydrolyzing heavy metal absorbing plant to recover pentose and/or hexose; applying alcohol fermentation to the pentose and/or hexose recovered in the previous process and separating and recovering alcohol obtained in the previous process; and recovering heavy metals from residual aqueous solution after separating and recovering alcohol from the fermentation liquid.
COPYRIGHT: (C)2006,JPO&NCIPI
摘要翻译：要解决的问题：提供重金属吸收植物体的重金属回收系统及其减少发生各种问题的可能性的方法，如通过焚烧重金属的散射，并且允许有效利用植物生物质，具有较小的环境加载。解决方案：重金属吸收植物体的重金属回收方法包括：水解重金属吸收剂以回收戊糖和/或己糖的方法; 将酒精发酵应用于在先前方法中回收的戊糖和/或己糖，并分离和回收在先前方法中获得的醇; 从发酵液中分离和回收酒精后，从残留水溶液中回收重金属。版权所有（C）2006，JPO＆NCIPI

4. 发明专利

JP2009168454A Surface flaw inspection device and surface flaw inspection method 审中-公开
标题翻译：表面法兰检查装置和表面法检查方法
公开(公告)号：JP2009168454A
公开(公告)日：2009-07-30
申请号：JP2008003375
申请日：2008-01-10
申请人： Acuity:Kk , Kurabo Ind Ltd , Marubeni Techno-Systems Corp , 丸紅テクノシステム株式会社 , 倉敷紡績株式会社 , 株式会社アキュイティ
发明人： FUTAMURA TAKAFUSA , KADOTA TADASHI , KADOKAWA YASUHIKO , TSUNODA TAKASHI
IPC分类号： G01N21/95
摘要： PROBLEM TO BE SOLVED: To measure a fine flaw with respect to an inspection target, of which the surface has mirror reflection properties, using a light source having a predetermined pattern. SOLUTION: The inspection target 100 is imaged by an imaging device 5 in a state that pattern lights known in periodic formula are projected on the inspection target from surface light sources 3A and 3B while shifted by predetermined phase and the brightness values of a plurality of the taken images, which are different in the phases of the pattern lights, taken by the imaging device 5 are applied to the periodic formula of the pattern lights emitted from the surface light sources 3A and 3B at every pixel of the taken images to operate the periodic change and amplitude of the pattern lights at every pixel. An amplitude image having an amplitude value as brightness is formed on the basis of the value of the amplitude of the periodic formula of the taken images and the surface flaw of the inspection target is inspected on the basis of the amplitude image. COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：使用具有预定图案的光源来测量相对于表面具有镜面反射特性的检查对象的细小缺陷。解决方案：在周期性公式中已知的图案光从表面光源3A和3B投影到检查对象上，同时偏移了预定相位并且a的亮度值的情况下，由成像装置5对检查对象100成像将由摄像装置5拍摄的图案光的相位不同的多个拍摄图像应用于从拍摄图像的每个像素的表面光源3A和3B发射的图案光的周期公式，在每个像素处操作图案光的周期性变化和幅度。基于拍摄图像的周期性公式的幅度值，形成具有作为亮度的振幅值的振幅图像，并且基于振幅图像来检查检查对象的表面缺陷。版权所有（C）2009，JPO＆INPIT

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