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    • 6. 发明专利
    • Tin plating method
    • 电镀方法
    • JP2004124249A
    • 2004-04-22
    • JP2003057560
    • 2003-03-04
    • Shipley Co Llcシップレーカンパニー エル エル シーShipley Company,L.L.C.
    • EGLI ANDRE
    • C25D7/12C25D3/30C25D3/32C25D7/00H05K3/24
    • H05K3/244C25D3/30C25D3/32C25D7/00C25D7/12Y10T428/12708Y10T428/12715Y10T428/12722
    • PROBLEM TO BE SOLVED: To provide a deposit extremely reduced in whisker formation in tin and tin alloy plating of copper lead frames etc., and to provide a method of depositing a tin layer or film reduced in the tendency to the formation of the whiskers. SOLUTION: The layer of the tin or tin alloy is electrodeposited on a substrate in such a manner that the crystal face forming an angle 5 to 22° with the crystal face adjacent to the tin or tin alloy layer or the face equivalent thereto does not substantially exist. Also, the tin or tin layer reduced in the formation of the whiskers is obtained by forming the layer in such a manner that the ratio of the peak intensity corresponding to the crystal face forming the angle 5 to 22° or the face equivalent thereto to the total peak intensity of all the peaks observed in X-ray diffraction spectra is ≤10%. The tin or tin alloy layer and an electronic device having the same are obtained by the above method. COPYRIGHT: (C)2004,JPO
    • 要解决的问题:为了提供在铜引线框架等的锡和锡合金电镀中晶须形成极少的沉积物,并且提供沉积锡层或膜形成方法, 晶须。 解决方案:将锡或锡合金层电沉积在基板上,使得晶体面与锡或锡合金层相邻的晶面或与其相当的面形成5°至22°的角度 基本上不存在 此外,形成晶须所减少的锡或锡层可以通过以与以下相同的方式形成该层来获得:将与晶面相对应的峰强度的比率形成为5度至22度的角度或与其相当的晶面相对于 在X射线衍射光谱中观察到的所有峰的总峰强度为≤10%。 锡或锡合金层及具有该锡或锡合金层的电子器件通过上述方法获得。 版权所有(C)2004,JPO