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1. 发明专利

JP5064489B2 Microscope and microscopic examination method for determining the surface contours of the object 有权
公开(公告)号：JP5064489B2
公开(公告)日：2012-10-31
申请号：JP2009506950
申请日：2007-04-17
申请人：カールツァイスマイクロイメージングゲーエムベーハーCarl Zeiss MicroImaging GmbH
发明人：ヴィンテロー、ヨハネス
IPC分类号： G02B21/00 , G01B11/24
CPC分类号： G02B21/0064 , G01B11/24

2. 发明专利

JP5037512B2 Apparatus and method for optically detecting decomposed sample depth 有权
公开(公告)号：JP5037512B2
公开(公告)日：2012-09-26
申请号：JP2008532627
申请日：2006-09-14
申请人：カールツァイスマイクロイメージングゲーエムベーハーCarl Zeiss MicroImaging GmbH
发明人：ヴォレシェンスキー、ラルフ
IPC分类号： G01N21/17
CPC分类号： G01N21/6458 , G01N2021/1782 , G01N2021/1787 , G01N2201/0635 , G02B21/008

3. 发明专利

JP2012078802A Microscope and microscopy 有权
标题翻译：显微镜和显微镜
公开(公告)号：JP2012078802A
公开(公告)日：2012-04-19
申请号：JP2011189560
申请日：2011-08-31
申请人： Carl Zeiss Microimaging Gmbh , カールツァイスマイクロイメージングゲーエムベーハーCarl Zeiss MicroImaging GmbH
发明人： TIMO AMFT , THOMAS KALKBRENNER , DANIEL SCHUBERT
IPC分类号： G02B21/06 , G02B21/14
CPC分类号： G02B21/0068 , G02B21/0092 , G02B21/241 , G02B26/06 , G02F1/0136 , G02F1/11 , G02F1/116
摘要： PROBLEM TO BE SOLVED: To provide a microscope whose polarization state is switched and a microscopy.SOLUTION: This microscope includes: at least one illumination light beam whose phase is modulated by a modulation frequency in a certain partial area along a cross-section thereof; a microscope objective lens for converging an illumination light beam to a sample; a detection optical path; and at least one demodulation means. At least one polarization changing element is installed in an illumination optical path, and a phase plate having at least two areas whose phase influence degrees are different is post-positioned in the polarization changing element. In a second embodiment, this microscope includes: at least one illumination light beam; a microscope objective lens for converging the illumination light beam to the sample; and a detection optical path having at least one modulator. The illumination light beam is mutually distributed to at least two optical paths, and an element for forming a field mode which is different from the first optical path is installed in one of the optical paths, and the two optical paths having different field modes are superimposed at a focal point.
摘要翻译：要解决的问题：提供一种其极化状态切换的显微镜和显微镜。该显微镜包括：至少一个照明光束，其相位沿着其横截面在某一部分区域中被调制频率调制; 用于将照明光束会聚到样品的显微镜物镜; 检测光路; 和至少一个解调装置。至少一个偏振改变元件安装在照明光路中，并且具有相位影响程度不同的至少两个区域的相位板被定位在偏振改变元件中。在第二实施例中，该显微镜包括：至少一个照明光束; 用于将照明光束会聚到样品的显微镜物镜; 以及具有至少一个调制器的检测光路。照明光束相互分配到至少两个光路，并且用于形成与第一光路不同的场模式的元件安装在光路之一中，并且具有不同场模的两个光路被叠加在协调中心版权所有（C）2012，JPO＆INPIT

4. 发明专利

JP2012504252A Improved method and apparatus for microscopy equipped with structured illumination 有权
公开(公告)号：JP2012504252A
公开(公告)日：2012-02-16
申请号：JP2011528231
申请日：2009-09-22
申请人：カールツァイスマイクロイメージングゲーエムベーハーCarl Zeiss MicroImaging GmbH
发明人：ヴォレシェンスキー、ラルフ , クラムペルト、ゲルハルト , クレッペ、インゴ , ケンペ、ミヒャエル
IPC分类号： G02B21/06 , G01N21/64 , G02B21/36
CPC分类号： G02B21/0032 , G01N21/6458 , G02B21/0072 , G02B21/0076 , G02B21/008 , G02B21/367 , G02B27/58
摘要： In structured illumination microscopy, the multiple recording of images with different phase positions of the structuring requires a high stability in the optical arrangement and sample throughout the entire measuring process. Also, the structuring must be projected into the sample in a highly homogeneous manner. The current invention optimizes recording of individual images in order to achieve the best possible resolution in the result image even in problematic samples. An optimization of this kind can be carried out in different ways, for example, by determining an optimal adjustment for at least one illumination parameter or recording parameter or by pulsed illumination such that an excitation from a triplet state of the fluorescent dye to a higher triplet state is reduced, or by illuminating the sample with depletion light for depopulating a triplet state of the fluorescent dye, which reduces bleaching.

5. 发明专利

JP2011040721A High sensitivity detector apparatus 有权
标题翻译：高灵敏度检测仪器
公开(公告)号：JP2011040721A
公开(公告)日：2011-02-24
申请号：JP2010148946
申请日：2010-06-30
申请人： Carl Zeiss Microimaging Gmbh , カールツァイスマイクロイメージングゲーエムベーハーCarl Zeiss MicroImaging GmbH
发明人： BATHE WOLFGANG , GOELLES MICHAEL , MIRKO LIEDTKE
IPC分类号： H01L27/14 , G01J1/04 , G02B21/00
CPC分类号： G01J1/04 , G01J1/02 , G01J1/0209 , G01J1/0407 , G01J1/0411 , G01J1/0422 , G01J3/02 , G01J3/0205 , G01J3/0208 , G01J3/0216 , G01J3/0256 , G02B5/045 , G02B21/0064 , G02B21/008 , H01L27/14625 , H01L27/14806 , H01L31/02325
摘要： PROBLEM TO BE SOLVED: To facilitate improving the sensitivity of a detector apparatus with a high cost-effectiveness using a new light deflection element, by overcoming the problem wherein in order to improve the sensitivity of the detector apparatus, the detector apparatus is made to focus falling light on a light receiving region of a detector, and a light deflection element in a form of a lens array with spherical elements is used for that purpose, however, the manufacturing cost of such a lens array is high, especially when the lens array is manufactured in small quantities.
SOLUTION: The detector apparatus includes a light deflection element 305 having light incident surfaces 305b for falling light to deflect on a light receiving region 304 of a detector and change the angle. The light incident surfaces 305b of the light deflection element are tilted and are formed in a form of a flat plane. The detector apparatus is especially suitable for detecting light emitted from a sample in microscopes, especially, laser scanning microscopes.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：为了利用新的光偏转元件来提高具有高成本效益的检测器装置的灵敏度，通过克服其中为了提高检测器装置的灵敏度的问题，检测器装置是使得将落下的光聚焦在检测器的光接收区域上，并且使用具有球形元件的透镜阵列形式的光偏转元件用于该目的，然而，这种透镜阵列的制造成本高，特别是当透镜阵列的制造量很少。解决方案：检测器设备包括具有光入射表面305b的光偏转元件305，用于使光线落在检测器的光接收区域304上以偏转并改变角度。光偏转元件的光入射面305b倾斜并形成为平面的形式。检测器装置特别适用于在显微镜，特别是激光扫描显微镜中检测从样品发出的光。版权所有（C）2011，JPO＆INPIT

7. 发明专利

JP2010540999A Method and apparatus for capturing illuminated sample optically 审中-公开
公开(公告)号：JP2010540999A
公开(公告)日：2010-12-24
申请号：JP2010526212
申请日：2008-09-26
申请人：カールツァイスマイクロイメージングゲーエムベーハーCarl Zeiss MicroImaging GmbH
发明人：ヴォレシェンスキー、ラルフ , ケンペ、ミハエル , シュヴェルトナー、ミハエル
IPC分类号： G02B21/14
CPC分类号： G02B21/06 , G02B21/0032 , G02B27/58
摘要： Method for optically detecting an illuminated sample, wherein the illumination light impinges on the sample in spatially structured fashion in at least one plane and a plurality of images of the sample with different positions of the structure on the sample are recorded by means of a detector, from which images an optical sectional image and/or an image having an increased resolution is calculated, characterized in that a diffraction pattern is generated in the direction of the sample in or in the vicinity of an objective pupil or a conjugate plane with respect to the two and said deflection pattern is assigned in or in the vicinity of the objective pupil or a conjugate plane with respect to the two, a structured phase plate having regions having different phase delays, which is moved in order to set, for at least one diffraction order, different phase angles of the illumination light on the sample, wherein advantageously via a displaceable diaphragm a selection of diffraction orders is effected which is arranged in or in the vicinity of the objective pupil or a conjugate plane with respect to the two.

8. 发明专利

JP2010540993A Microscope and microscopic method of operation 有权
公开(公告)号：JP2010540993A
公开(公告)日：2010-12-24
申请号：JP2010526176
申请日：2008-07-24
申请人：カールツァイスマイクロイメージングゲーエムベーハーCarl Zeiss MicroImaging GmbH
发明人：インゴクレッペ , ミルコリートケ
IPC分类号： G02B21/00 , G01N21/64
CPC分类号： G02B21/06 , G02B21/0076
摘要：本発明は、試料の様々な点に励起光が集束または送出され、励起光の強度が点固有に変更され、少なくとも１つのスペクトル域内で前記試料によって反射された光の強度が点固有かつ定量的に測定される顕微鏡を操作する方法に関する。本発明による方法は、前記試料の固有点に送出された励起光の強度および／または分光組成が、調整装置によって自動的に、前記点によってスペクトル域内で反射された光の推定強度または実際強度に関する前記試料の測定データから予め得られた情報に基づいて、画素ドウェル時間中にこの点によってスペクトル域内で反射された光の強度の積分が所定の値期間内にあるように調整さることを特徴とする。本発明は、また、顕微鏡に関する。

9. 发明专利

JP2010519579A Confocal laser microscope 有权
公开(公告)号：JP2010519579A
公开(公告)日：2010-06-03
申请号：JP2009550230
申请日：2008-02-09
申请人：カールツァイスマイクロイメージングゲーエムベーハーCarl Zeiss MicroImaging GmbH
发明人：ヴィルヘルム、ステファン , フーゼ、ディーター
IPC分类号： G02B21/06 , G01N21/64 , G02B19/00
CPC分类号： G02B21/0032 , G02B6/262
摘要： A confocal laser microscope has at least one laser whose illumination light is transmitted in direction of the microscope objective by at least one light-conducting fiber. The light-conducting fiber can be plugged in at a housing which preferably comprises the scanning head of the microscope, and a holder is provided which can be plugged into the housing and into which the light-conducting fiber projects and which is provided at its end remote of the fiber with first optics for transmitting the laser light exiting divergently from the fiber in direction of at least partially displaceable collimating optics in the housing. At least second optics are advantageously arranged between the first optics and the collimating optics.

10. 发明专利

JP2009510498A Microscopy method and microscope 有权
公开(公告)号：JP2009510498A
公开(公告)日：2009-03-12
申请号：JP2008532626
申请日：2006-09-14
申请人：カールツァイスマイクロイメージングゲーエムベーハーCarl Zeiss MicroImaging GmbH
发明人：ヴォレシェンスキー、ラルフ , ケンペ、ミハエル
IPC分类号： G02B21/00 , G01J3/36
CPC分类号： G02B21/002
摘要：検査試料の所定の深度にある画像エリアの画像を生成するための顕微鏡検査方法であって、それぞれ画像エリアの一部を、試料との相互作用により試料放射を発生させる合焦した照明用光線束で照明する複数の照明工程と、発生した試料放射を検出する検出工程と、検出した試料放射を基に画像を生成する評価工程とを含む方法が提供される。各照明工程中に第１および第２の検出工程を実施し、その第１の検出工程では焦点内および焦点外で発生した試料放射を検出し、第２の検出工程では、焦点内で発生した第１の検出工程より少ない割合の試料放射および焦点外で発生した試料放射を検出し、かつ評価工程において、第１の検出工程で検出した試料放射の焦点外の割合を減らすために、第２の検出工程で検出した試料放射を利用する。

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