会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • SYSTEM AND METHOD FOR THREE-DIMENSIONAL INSPECTION USING PATTERNED LIGHT PROJECTION
    • 用于使用图案化光投影进行三维检测的系统和方法
    • WO0016071A8
    • 2000-06-15
    • PCT/US9912706
    • 1999-06-07
    • ACUITY IMAGING LLCHALLERMAN GREGORY RLUDLOW JONATHAN ESTERN HOWARD K
    • HALLERMAN GREGORY RLUDLOW JONATHAN ESTERN HOWARD K
    • G01N21/88G01B11/24
    • G01N21/88G01N21/8806
    • An inspection system (10) is used to obtain three-dimensional information pertaining to an article (12) having elements with specular surfaces, such as the solder balls on a BGA device. The system includes patterned light projector (20) which projects a pattern at an oblique angle ( alpha ) with respect to the plane of the article (12) and an image detector (24) disposed generally above the article (12). The light projector (20) includes an extended light source (30) and a light patterning member (32) disposed such that the light pattern is in focus in an image plane parallel to the plane of the article (12), satisfying the Scheimpflug condition. The spacing of the lines is preferably greater than a spacing or pitch of the specular elements. An image processor (26) is coupled to the image detector (24) to receive the image and measure the lateral shift of the lines to determine height information using triangulation.
    • 使用检查系统(10)来获得与具有镜面的元件(例如BGA装置上的焊球)的物品(12)有关的三维信息。 该系统包括图案化的光投射器(20)和图像检测器(24),图案化的光投射器(20)相对于物品(12)的平面以倾斜角度(α)投影图案,图像检测器(24)大致设置在物品(12)上方。 光投射器(20)包括延伸光源(30)和光构图构件(32),光构图构件(32)布置成使得光图案在与物品(12)的平面平行的图像平面内聚焦,满足Scheimpflug条件 。 线的间距优选地大于镜面元件的间距或间距。 图像处理器(26)耦合到图像检测器(24)以接收图像并测量线的横向偏移以使用三角测量来确定高度信息。
    • 2. 发明专利
    • DE69826837D1
    • 2004-11-11
    • DE69826837
    • 1998-01-29
    • ACUITY IMAGING LLC NASHUA
    • KING JOSEPHLUDLOW EDMUNDSCHURR GEORGE
    • G01B11/03G01N21/88G01N21/956G06T1/00H05K13/08G06T7/00
    • The present invention relates to inspection systems and methods, and in particular to a method for inspecting surfaces and objects using a ring illumination apparatus. A reflected image from the inspected surface or object includes a pattern of reflected image elements representing a pattern of illuminated reflective elements on an article. The method comprises the steps of: locating this pattern of reflected image elements in the reflected image; dividing at least one reflected image element into a plurality of pixels, each pixel having a gray scale value corresponding to an intensity level of reflected light in the reflected image element; positioning at least one vector across the reflected image element; examining a series of pixels along said at least one vector in order to determine at least one dimension or feature of the reflected image element; and determining inspection information pertaining to the illuminated reflective element represented by said at least one reflected image element using said determined at least one dimension or feature.
    • 7. 发明专利
    • INSPECTION METHOD
    • CA2282498A1
    • 1998-09-03
    • CA2282498
    • 1998-01-29
    • ACUITY IMAGING LLC
    • KING STEVEN JOSEPHLUDLOW JONATHAN EDMUNDSCHURR GEORGE
    • G01B11/03G01N21/88G01N21/956G06T1/00H05K13/08
    • An inspection system (10) and method use a ring illumination apparatus (20) to illuminate one or more reflective elements (12), such as solder balls on an electronic component (14) or other protruding surfaces or objects. The ring illumination apparatus (20) includes a substantially ring-shaped light source (24) that provides a substantially even illumination across the one or more reflective elements (12). An illumination detection device (30) detects light beams (32) reflecting off of the illuminated reflective elements (12) for forming a reflected image. A method of processing the reflected image includes locating one or more points on each reflected image element (110) representing an illuminated reflective element. The points on the reflected image elements are used to locate the pattern of the reflected image elements and/or to fit an outline (120) around each image element corresponding to a known percentage of the true dimensions of each solder ball or other reflective element. The inspection system and method thereby determine various characteristics (130) such as the absence/presence, location, pitch, size and shape of each reflective element.
    • 10. 发明申请
    • DATA RESAMPLER FOR DATA PROCESSING SYSTEM
    • 数据处理系统数据恢复器
    • WO9927455B1
    • 1999-07-08
    • PCT/US9824063
    • 1998-11-12
    • ACUITY IMAGING LLC
    • GREENBERG MICHAEL PWILT MICHAEL J
    • G06F12/08G06T1/60G06T3/00G06T3/40G06F13/00
    • G06T3/4007
    • A data resampler for a data processing system for logically adjacent data samples includes a memory subsystem (120a) for storing samples to be rendered, a digital differential analyzer (401) for generating an interpolation corner address for a set of interpolation fractions. The resampler also includes a fetch unit (402) which receives the interpolation corner address and generates four source addresses of samples to be fetched from the memory subsystem (120a). The resampler also includes a first FIFO memory (90d) for holding the generated interpolation fractions and a second FIFO memory (90a) for holding pixel data. The resampler further includes an interpolation unit (403), which computes rendered result pixels, assembles the result pixels into memory words, and outputs the words via a third FIFO memory (90c).
    • 用于逻辑相邻数据样本的数据处理系统的数据重新采样器包括用于存储要渲染的采样的存储器子系统(120a),用于生成一组插值分数的内插角地址的数字差分分析器(401)。 重采样器还包括获取单元(402),其接收插值角地址并生成要从存储器子系统(120a)取出的样本的四个源地址。 重采样器还包括用于保持产生的插值分数的第一FIFO存储器(90d)和用于保持像素数据的第二FIFO存储器(90a)。 再采样器还包括计算渲染结果像素的内插单元(403),将结果像素组装成存储字,并通过第三FIFO存储器(90c)输出字。