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    • 82. 发明专利
    • DE19928075B4
    • 2010-04-08
    • DE19928075
    • 1999-06-12
    • ELPIDA MEMORY INC
    • KAWAMURA MASASHI
    • H01L23/40H01L25/10H01L23/34H01L23/36H01L23/367H01L25/18
    • A memory module 10 is fitted with a "cover and heat sink" 5 having a U-shape in cross section in such a manner that the memory module 10 is inserted into a U-shaped deep recess of the "cover and heat sink" 5, and all packaged memory ICs 3 and the other components 2 mounted on each face of a printed circuit board 1 are covered by the "cover and heat sink" 5, with a silicone grease 6 being filled between the "cover and heat sink" 5 and the packaged memory ICs 3. The heat generated in each packaged memory IC 3 is conducted to the "cover and heat sink" 5 through the silicone grease 6, and the heat is radiated from the surface of the "cover and heat sink" 5 having a large surface area. In addition, since all the components 2 and 3 mounted on the printed circuit board 1 are covered with the "cover and heat sink" 5, the components 2 and 3 mounted on the printed circuit board 1 are protected from a mechanical shock. Furthermore, it is possible to discriminate whether or not the degree of the warping of the printed circuit board 1 exceeds a permissible limit. Because, if the warping of the printed circuit board exceeds a certain limit, the memory module cannot be inserted into the U-shaped deep recess of the "cover and heat sink" 5.
    • 84. 发明专利
    • DE102008028514A1
    • 2009-01-08
    • DE102008028514
    • 2008-06-16
    • ELPIDA MEMORY INC
    • KAJIGAYA KAZUHIKO
    • G11C11/4074
    • To increase the quantity of stored charges of memory cells by a simple configuration to improve the operating margin, and to allow dummy cells to be unnecessary to improve the operating margin of a DRAM without increasing the power consumption and/or the chip area. A voltage of a common plate line is changed from a first voltage to a second voltage lower than the first voltage while a word line is a third voltage which makes the word line a selected state. The voltage of the word line is changed into a fourth voltage which makes the memory cell a non-selected state and is lower than the third voltage and higher than a fifth voltage which makes the word line a non-selected state, and the voltage of the plate line is changed into the first voltage after the voltage of the word line has been changed into the fourth voltage.
    • 85. 发明专利
    • DE102008021348A1
    • 2008-11-27
    • DE102008021348
    • 2008-04-29
    • ELPIDA MEMORY INC
    • KAJIGAYA KAZUHIKO
    • G11C7/22G06F13/14G06F13/18
    • In order to provide a semiconductor memory apparatus which can flexibly change the priority of reading requests when the reading request is issued and which do not exclusively use the memory bus, a semiconductor memory apparatus includes: a main memory which stores data at an address while maintaining a corresponding relationship between the data and the address; a read request input portion receiving a read request which maintains a corresponding relationship between address information that is referred to when reading the data and priority information that indicates priority for reading the data; a read data storing portion which stores the data and priority while maintaining a corresponding relationship thereof; a data reading portion reads the data corresponding to address information which is input by the read request input portion from the main memory; a read data registration portion storing both the priority information input by the read request input and the data read by the data reading portion to the read data storing portion while maintaining a corresponding relationship between the priority information and the data read; and a priority operation control portion which chooses and outputs the data with a highest priority among the priority information and the data that are stored in the read data storing portion while maintaining a corresponding relationship between the priority information and the data.
    • 87. 发明专利
    • DE102007040577A1
    • 2008-04-10
    • DE102007040577
    • 2007-08-28
    • ELPIDA MEMORY INC
    • FUJISAWA HIROKITAKISHITA RYUJI
    • G11C11/4076G06F1/06G11C11/407H03K5/13
    • A DLL circuit includes a first delay adjusting circuit that adjusts an amount of delay of a frequency-divided signal CK1, a second delay adjusting circuit that adjusts an amount of delay of a frequency-divided signal CK2, a synthesizing circuit that synthesizes outputs of these delay adjusting circuits to generate an internal clock signal, and supplies the internal clock signal to a real path, a clock driver that receives the output of the first delay adjusting circuit and supplies the output to a replica path, and a clock driver that receives the output of the second delay adjusting circuit. These clock drivers have substantially the same circuit configuration. Accordingly, even when the power supply voltage fluctuates, influences of the fluctuations on the respective frequency-divided signals are almost equal. Thus, deterioration of the function of the DLL circuit due to fluctuations of the power supply voltage can be prevented.