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    • 81. 发明申请
    • Novel 1, 3, 5 tris (arylamino) benzenes
    • 新的1,3,5-三(芳基氨基)苯
    • US20060173216A1
    • 2006-08-03
    • US10549166
    • 2004-03-15
    • Hiroshi InadaNobutaka AkashiTomoko Hayashi
    • Hiroshi InadaNobutaka AkashiTomoko Hayashi
    • C07C211/50
    • C07C211/58H01L51/0059H01L51/006H01L51/5048
    • The invention provides 1,3,5-tris(arylamino)benzenes represented by the general formula (I) wherein A is naphthyl, anthryl or phenanthryl group, and R is hydrogen atom or diarylamino group. These 1,3,5-tris(arylamino)benzenes have oxidation potentials in the range of about 0.5-0.6V, excellent reversibility in oxidation-reduction process, high glass transition temperatures and high heat resistance, so that they can form practicable organic semiconductor film readily by a coating method or a vacuum deposition method. In addition, they are capable of forming stable and durable amorphous film useful as high performance organic semiconductors at normal temperatures or higher with no aid of binder resins, that is, by themselves.
    • 本发明提供由通式(I)表示的1,3,5-三(芳氨基)苯,其中A为萘基,蒽基或菲基,R为氢原子或二芳基氨基。 这些1,3,5-三(芳基氨基)苯具有在约0.5-0.6V的范围内的氧化电位,氧化还原过程的优异可逆性,高玻璃化转变温度和高耐热性,使得它们可以形成可行的有机半导体 通过涂布方法或真空沉积方法容易地制备薄膜。 此外,它们能够在常温或更高温度下形成稳定且耐用的无定形薄膜,无需粘合剂树脂,即本身就可以使用。
    • 82. 发明申请
    • Clamping jig for semiconductor laser bars
    • 半导体激光棒夹紧夹具
    • US20050000451A1
    • 2005-01-06
    • US10843976
    • 2004-05-11
    • Nobuyuki MitsuiHiroshi Inada
    • Nobuyuki MitsuiHiroshi Inada
    • C23C14/24C23C14/32C23C14/34C23C14/50C23C16/00H01S5/028
    • C23C14/505
    • A clamping jig for mounting semiconductor laser bars includes: multiple supporting bars for holding laser bars therebetween; a pair of supporting plates each of which has a mounting face for mounting the supporting bars in a row; a pressing member for pressing the supporting bars for holding the laser bar; pressing cover members for covering both ends of each supporting bar to prevent supporting bars from falling from the supporting plate; and a supporting frame for detachably supporting the supporting plates and pressing cover members. Each supporting bar is formed with a longitudinal length greater than the laser bar, within a predetermined length so as to be mounted within the supporting frame. Both of the pair of supporting plates may be mounted so as to face one another, or just one may be mounted with the pressing cover members being mounted on the supporting frame instead of the other supporting plate.
    • 用于安装半导体激光棒的夹紧夹具包括:用于在其间保持激光棒的多个支撑杆; 一对支撑板,每个支撑板具有用于将支撑杆安装成一排的安装面; 用于按压用于保持激光棒的支撑杆的按压构件; 按压用于覆盖每个支撑杆的两端的盖构件,以防止支撑杆从支撑板掉落; 以及用于可拆卸地支撑支撑板和按压盖构件的支撑框架。 每个支撑杆形成为具有大于激光棒的纵向长度,并且在预定长度内被安装在支撑框架内。 一对支撑板可以彼此相对地安装,或者只有一个可以安装有按压盖构件而不是另一个支撑板安装在支撑框架上。
    • 83. 发明授权
    • Method for manufacturing superconducting device having a reduced
thickness of oxide superconducting layer and superconducting device
manufactured thereby
    • 制造具有减小的氧化物超导层厚度的超导装置的方法和由此制造的超导装置
    • US5714767A
    • 1998-02-03
    • US551366
    • 1995-11-01
    • Takao NakamuraHiroshi InadaMichitomo Iiyama
    • Takao NakamuraHiroshi InadaMichitomo Iiyama
    • H01L39/14H01L29/06
    • H01L39/146
    • For manufacturing a superconducting device, a compound layer which is composed of the same constituent elements of an oxide superconductor is formed on a surface of the substrate, and a gate electrode is formed on a portion of the compound layer. Portions of the compound layer at both sides of die gate electrode are etched using die gate electrode as a mask, so that a shallow step is formed on an upper surface of the compound layer and side surfaces of the step exposed. After that electric power is applied to the gate electrode to heat the gate electrode so as to carry out a heat-treatment on the portion of die compound layer under the gate electrode locally, so that a gate insulator formed directly under the the gate electrode and a superconducting channel which is constituted an extremely thin superconducting region composed of the oxide superconductor and formed under die gate insulator are produced in a self alignment to die gate electrode.
    • 为了制造超导装置,在衬底的表面上形成由氧化物超导体的相同组成元素组成的化合物层,并且在化合物层的一部分上形成栅电极。 使用模具栅电极作为掩模来蚀刻在栅极电极的两侧的化合物层的部分,从而在化合物层的上表面和暴露的台阶的侧表面上形成浅的台阶。 在栅电极施加电力加热栅电极之后,局部地对栅电极下的管芯复合层部分进行热处理,从而形成在栅电极正下方的栅极绝缘体和 制造由氧化物超导体构成的非常薄的超导区域并形成在栅极绝缘体下方的超导通道以对准栅极电极的自对准的方式制造。
    • 84. 发明授权
    • Method for manufacturing a superconducting device
    • 制造超导装置的方法
    • US5683968A
    • 1997-11-04
    • US521736
    • 1995-08-31
    • Takao NakamuraHiroshi InadaMichitomo Iiyama
    • Takao NakamuraHiroshi InadaMichitomo Iiyama
    • H01L39/14H01L39/24
    • H01L39/146Y10S505/702
    • A superconducting device or a super-FET has a pair of superconducting electrode regions (20b, 20c) consisting of a thin film (20) oxide superconductor being deposited on a substrate (5) and a weak/ink region (20a), the superconducting electrode regions (20b, 20c) being positioned at opposite sides of the weak link region (20a), these superconducting electrode regions (20b, 20c) and the weak link region (20a) being formed on a common plane surface of the substrate (5). The weak link region (20a) is produced by local diffusion of constituent element(s) of the substrate (5) and/or a gate electrode insulating layer (16) into the thin film (20) of the oxide superconductor in such a manner that a substantial wall thickness of the thin film (20) of the oxide superconductor is reduced at the weak link region (20a) so as to leave a weak link or superconducting channel (10) in the thin film (20) of oxide superconductor over a non-superconducting region (50) which is produced by the diffusion.
    • 超导器件或超FET具有一对超导电极区域(20b,20c),其由沉积在衬底(5)和弱/墨区域(20a)上的薄膜(20)氧化物超导体组成,超导 电极区域(20b,20c)位于弱连接区域(20a)的相对侧,这些超导电极区域(20b,20c)和弱连接区域(20a)形成在基板(5)的公共平面上 )。 通过将衬底(5)的构成元件和/或栅电极绝缘层(16)以这种方式局部扩散到氧化物超导体的薄膜(20)中而产生弱连接区域(20a) 氧化物超导体的薄膜(20)的实质壁厚在弱连接区域(20a)处减小,以便在氧化物超导体的薄膜(20)中留下弱连接或超导通道(10),超过 通过扩散产生的非超导区域(50)。
    • 85. 发明授权
    • Superconducting device having a reduced thickness of oxide
superconducting layer and method for manufacturing the same
    • 具有减小氧化物超导层厚度的超导装置及其制造方法
    • US5621223A
    • 1997-04-15
    • US515701
    • 1995-08-16
    • Takao NakamuraHiroshi InadaMichitomo Iiyama
    • Takao NakamuraHiroshi InadaMichitomo Iiyama
    • H01L39/14H01L29/06
    • H01L39/146Y10S505/702Y10S505/728
    • A superconducting device includes first and second oxide superconducting regions of a relatively thick thickness, formed directly on a principal surface of a substrate to be separate from each other, and a third oxide superconducting region of an extremely thin thickness which is formed directly on the principal surface of the substrate so as to bridge the first and second oxide superconducting regions. A barrier layer and a diffusion source layer are formed on the third oxide superconducting region, and an isolation region is formed to cover an upper portion or both side surfaces of the diffusion source layer. The first, second and third oxide superconducting regions and the isolation region are formed of the same oxide superconductor material, and the isolation region is diffused with a material of the diffusion source layer, so that the isolation region does not show superconductivity. Therefore, a superconducting current can flow between the first and second oxide superconducting regions through only the third oxide superconducting region. For formation of the superconducting device, a first oxide superconductor thin film having a very thin thickness is formed on the principal surface of the substrate, and a barrier layer and a diffusion source layer are formed on a portion of the first oxide superconductor thin film. A second oxide superconductor thin film is grown on an exposed surface of the first oxide superconductor thin film until the two layers are embedded in the second oxide superconductor thin film, so that a material of the diffusion source layer is diffused into the second oxide superconductor thin film on an upper portion or both side surfaces of the diffusion source layer.
    • 超导装置包括直接形成在彼此分离的基板的主表面上的相对较厚厚度的第一和第二氧化物超导区域,以及直接形成在主体上的极薄厚度的第三氧化物超导区域 表面以便桥接第一和第二氧化物超导区域。 在第三氧化物超导区域上形成阻挡层和扩散源层,形成隔离区以覆盖扩散源层的上部或两侧表面。 第一,第二和第三氧化物超导区域和隔离区域由相同的氧化物超导体材料形成,并且隔离区域与扩散源层的材料扩散,使得隔离区域不显示超导性。 因此,超导电流可以仅通过第三氧化物超导区域在第一和第二氧化物超导区域之间流动。 为了形成超导装置,在基板的主表面上形成具有非常薄的厚度的第一氧化物超导体薄膜,并且在第一氧化物超导体薄膜的一部分上形成阻挡层和扩散源层。 在第一氧化物超导体薄膜的暴露表面上生长第二氧化物超导体薄膜,直到两层嵌入到第二氧化物超导体薄膜中,使得扩散源层的材料扩散到第二氧化物超导体薄膜 膜在扩散源层的上部或两侧表面上。
    • 86. 发明授权
    • Process for cleaning a surface of thin film of oxide superconductor
    • 清洁氧化物超导体薄膜表面的工艺
    • US5607900A
    • 1997-03-04
    • US551702
    • 1995-11-01
    • Hiroshi InadaTakao NakamuraMichitomo IiyamaSo Tanaka
    • Hiroshi InadaTakao NakamuraMichitomo IiyamaSo Tanaka
    • H01L39/24B05D5/12B08B5/04
    • H01L39/247Y10S505/742
    • A process for removing contaminants from a surface of a thin film of oxide superconductor deposited on a substrate. The thin film of oxide superconductor is heat-treated in ultra-high vacuum at a temperature which is within a range of -100.degree. C. to +100.degree. C. of the temperature at which oxygen enter into the oxide superconductor.The process is used for removing photo-resist from a surface of thin film of oxide superconductor and for producing a layered structure containing at least one thin film of oxide superconductor such as Y.sub.1 Ba.sub.2 Cu.sub.3 O.sub.7-x having a contaminated surface. On the cleaned surface, another thin film of oxide superconductor or non-superconductor is deposited. The resulting structure of layered thin films is used for fabricating superconducting transistor, Josephson junctions, superconducting circuits or the like.
    • 用于从沉积在基底上的氧化物超导体薄膜的表面去除污染物的方法。 氧化物超导体的薄膜在超高真空中在氧进入氧化物超导体的温度在-100℃至+ 100℃的温度范围内进行热处理。 该方法用于从氧化物超导体的薄膜的表面去除光致抗蚀剂,并且用于生产含有至少一种具有污染表面的Y1Ba2Cu3O7-x氧化物超导体薄膜的层状结构。 在清洁的表面上,沉积另一薄膜的氧化物超导体或非超导体。 所得到的层状薄膜结构用于制造超导晶体管,约瑟夫森结,超导电路等。
    • 87. 发明授权
    • Superconducting device with c-axis channel and a-axis source and drain
having a continuous crystal structure
    • 具有c轴通道和a轴源极和漏极的超导器件具有连续的晶体结构
    • US5447907A
    • 1995-09-05
    • US989787
    • 1992-12-10
    • Takao NakamuraHiroshi InadaMichitomo Iiyama
    • Takao NakamuraHiroshi InadaMichitomo Iiyama
    • H01L39/14H01B12/00H01L39/22
    • H01L39/146Y10S505/701Y10S505/703Y10T29/41
    • A superconducting device comprising a substrate having a principal surface, a superconducting source region and a superconducting drain region formed of an oxide superconductor on the principal surface of the substrate separated from each other, a superconducting channel formed of the oxide superconductor between the superconducting source region and the superconducting drain region. The superconducting channel electrically connects the superconducting source region to a superconducting drain region, so that a superconducting current can flow through the superconducting channel between the superconducting source region and the superconducting drain region. The superconducting device comprises a gate electrode through a gate insulator on the superconducting channel for controlling the superconducting current flowing through the superconducting channel, and non-superconducting oxide layers having a similar crystal structure to that of the oxide superconductor. The non-superconducting oxide layers contact with at least the superconducting source region and the superconducting drain region. In the superconducting device, the superconducting channel, the superconducting source region and the superconducting drain region are formed of one oxide superconductor thin film of which the center portion is c-axis oriented and the both ends are a-axis oriented.
    • 一种超导装置,包括具有主表面的衬底,超导源极区和由衬底的主表面上的氧化物超导体形成的超导漏极区,所述超导源区彼此分离的由氧化物超导体形成的超导通道在超导源极区域 和超导漏区。 超导通道将超导源极区域电连接到超导漏极区域,使得超导电流可以流过超导源极区域和超导漏极区域之间的超导通道。 超导装置包括通过超导通道上的栅极绝缘体的栅极电极,用于控制流过超导通道的超导电流,以及具有与氧化物超导体相似的晶体结构的非超导氧化物层。 非超导氧化物层与至少超导源极区域和超导漏极区域接触。 在超导装置中,超导通道,超导源极区域和超导漏极区域由一个氧化物超导体薄膜形成,其中心部分为c轴取向并且两端为a轴取向。