会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 85. 发明授权
    • Process for manufacturing a plurality of strip lead frame semiconductor
devices
    • 用于制造多个带状引线框半导体器件的工艺
    • US5661086A
    • 1997-08-26
    • US584299
    • 1996-01-11
    • Takashi NakashimaKeiji TakaiKouji Tateishi
    • Takashi NakashimaKeiji TakaiKouji Tateishi
    • H01L21/48H01L23/13H01L23/31H01L23/498H01L21/52H01L21/58H01L21/60
    • H01L23/49811H01L21/4803H01L21/4846H01L23/13H01L23/3128H01L2224/45144H01L2224/48091H01L2224/73265H01L24/45H01L24/48H01L2924/00014H01L2924/01078H01L2924/01079H01L2924/07802H01L2924/14H01L2924/15153H01L2924/1517H01L2924/15311H01L2924/1532H01L2924/181Y10T29/49121
    • Method for producing semiconductor devices comprises a first step in which a plurality of metal substrates each of which is provided with a die mounting region at a central portion thereof are connected in series to produce a train of connected metal substrates by means of first connecting tabs and a pair of first side rails each of which is provided with first positioning pilot apertures are connected to the train by means of second connecting tabs to produce a metal substrate frame, a second step in which a plurality of circuit substrates each of which is provided with a lead pattern around an opening formed at the central portion thereof are connected in series by means of third connecting tabs to produce a train of connected circuit substrates and a pair of second side rails each of which is provided with second positioning pilot apertures are connected by fourth connecting tabs to produce a circuit substrate frame, a third step in which both frames are alinged with each other making use of the first and second positioning pilot apertures and are adhered with each other to produce a die mounting substrate frame, and a fourth step in which a semiconductor die is received in a cavity defined by the die mounting region and the opening of each die mounting substrate and solder balls are connected to terminal pads which form one ends of the lead pattern while pads of the semiconductor die are connected to wire bonding pads which form other ends of the lead pattern, and connecting tabs are removed so as to produce separate semiconductor devices.
    • 用于制造半导体器件的方法包括:第一步骤,其中在其中心部分设置有管芯安装区域的多个金属基板串联连接,以通过第一连接突片和 一对第一侧轨,每个第一侧轨设置有第一定位导向孔,通过第二连接翼连接到列上,以产生金属基底框架;第二步,其中多个电路基板设置有 围绕其中心部分形成的开口周围的引线图案通过第三连接突片串联连接,以产生一系列连接的电路基板和一对第二侧轨,每个第二侧轨设置有第二定位导向孔, 第四连接片以产生电路衬底框架,第三步骤,其中两个框架彼此相互嵌合 使用第一和第二定位导向孔并彼此粘合以产生模具安装基板框架,以及第四步骤,其中半导体管芯被容纳在由管芯安装区域和每个管芯的开口限定的空腔中 安装基板和焊球连接到形成引线图案的一端的端子焊盘,而半导体管芯的焊盘连接到形成引线图案的另一端的引线接合焊盘,并且连接接线片被移除以产生单独的半导体 设备。
    • 89. 发明授权
    • Shared buffer memory type ATM communication system and method with a
broadcast facility
    • 共享缓冲存储器类型ATM通信系统和方法与广播设施
    • US5394397A
    • 1995-02-28
    • US38615
    • 1993-03-29
    • Junichirou YanagiYoshihiro AshiTakahiko KozakiAkihiko TakaseTakashi Nakashima
    • Junichirou YanagiYoshihiro AshiTakahiko KozakiAkihiko TakaseTakashi Nakashima
    • H04M3/42H04L12/18H04L12/761H04L12/931H04L12/951H04Q3/52H04Q11/04H04L12/56H04J3/26H04L12/48
    • H04L12/5601H04L49/108H04L49/203H04L49/309
    • An ATM switching system which includes an input interface which is provided every incoming line and serves to convert header information of each input cell into internal routing information, a shared buffer memory and a cell writing control unit which forms normal cell list structures, which are prepared in correspondence to outgoing lines and in which a plurality of normal cells are chained together with their next addresses, and a broadcast cell list structure, in which a plurality of broadcast cells are chained together with their next addresses, in the shared buffer memory, and serves to add successively the input cells to ones of the list structures, which are selected in correspondence to respective internal routing information. The invention also includes a cell reading control unit which serves to fetch selectively the cell from the list structures formed in the shared buffer memory to distribute the cell thus fetched to the associated outgoing lines. The cell reading control unit includes a broadcast destination table for "storing broadcast destination specifying information for specifying the outgoing lines, through which the broadcast cell is to be output, using a bit pattern, in correspondence to the internal routing information of the broadcast cell".
    • 一种ATM交换系统,其包括为每条输入线路提供的输入接口,用于将每个输入单元的头信息转换为内部路由信息,共享缓冲存储器和形成正常小区列表结构的小区写入控制单元,其被准备 对应于输出线,并且其中多个正常小区与其下一个地址一起链接在一起,以及广播小区列表结构,其中多个广播小区与其下一个地址一起连接在共享缓冲存储器中,以及 用于将输入单元连续地添加到与各个内部路由信息相对应地选择的列表结构中的一个。 本发明还包括一个单元读取控制单元,用于从形成在共享缓冲存储器中的列表结构中选择性地提取单元,以将由此提取的单元分配到相关联的输出行。 小区读取控制单元包括:广播目的地表,用于根据广播小区的内部路由信息,使用位模式存储用于指定要输出广播小区的出行的广播目的地指定信息; 。
    • 90. 发明授权
    • Integrated semiconductor memory device utilizing a test circuit
    • 利用测试电路的集成半导体存储器件
    • US5351213A
    • 1994-09-27
    • US843260
    • 1992-02-28
    • Takashi Nakashima
    • Takashi Nakashima
    • G01R31/28G11C17/00G11C29/00G11C29/04G11C29/12G11C29/34G11C29/38G11C29/56H01L21/66H01L27/10G11C13/00
    • G11C29/12G11C29/04G11C29/38H01L2924/0002
    • A semiconductor memory device of the type having a test circuit incorporated integrally therewith generates test data to be batch written into the device's memory cells. The memory device includes at least one memory block to which there may be connected sense amplifiers through which read/write operations can be effected. A test circuit is also provided which function is to test each memory block. A peripheral circuit is formed electrically connected to any memory blocks. Accordingly, memory blocks as well as the peripheral circuit are formed on a semiconductor substrate onto which there is formed a `single` layer having both high (undoped thin poly-Si current paths-108CH) and low (doped thin poly-Si joint path-108SD) resistivity regions therein. The inherent properties of the undoped high-resistivity current paths 108 CH are such that in response to control signals from control gate electrodes, an electrical conductance of the current paths can be altered. The resultant structure yields improvements in manufacturing costs, test time and ancillary costs associated with memory block testing.
    • 具有整体结合的测试电路的类型的半导体存储器件产生批量写入器件的存储单元的测试数据。 存储器件包括至少一个存储器块,可以通过该存储器块连接读出放大器,通过该读出放大器可以实现读/写操作。 还提供了测试电路,其功能是测试每个存储器块。 外围电路形成为电连接到任何存储器块。 因此,存储块以及外围电路形成在半导体衬底上,在半导体衬底上形成具有高(未掺杂的多晶硅半导体电极108CH)和低掺杂的薄多晶硅结合路径的“单”层 -108SD)电阻率区域。 未掺杂的高电阻率电流路径108CH的固有特性使得响应于来自控制栅电极的控制信号,可以改变电流路径的电导。 所得到的结构产生了与记忆块测试相关的制造成本,测试时间和辅助成本的改进。