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    • 82. 发明授权
    • Instrument device
    • 仪器设备
    • US08988888B2
    • 2015-03-24
    • US13518773
    • 2010-12-14
    • Satoshi SanoYuichiro NakamuraKatsuhito Umezawa
    • Satoshi SanoYuichiro NakamuraKatsuhito Umezawa
    • H05K7/06B60K35/00
    • B60K35/00B60K2350/1064G01D11/24
    • A meter device which can be mounted and removed easier than conventional meter devices. A meter device is provided with a display plate, a circuit board, a middle case which is disposed on the front surface side of the circuit board and on which the display plate is mounted, an upper case which is disposed on the front surface side of the middle case and through which the front surface can be seen, and a lower case which covers the middle case and the circuit board. A flange section which is sandwiched and held between the upper and lower cases is provided to the peripheral edge of the middle case. One of the upper case and the lower cases is provided with engagement sections, and engagement sections which engage with the engagement sections are provided to the other of cases so as to correspond to the engagement sections.
    • 可以比常规仪表装置更容易安装和拆卸的仪表装置。 仪表装置设置有显示板,电路板,中间壳体,其设置在电路板的前表面侧并且安装有显示板的上壳体设置在电路板的前表面侧 可以看到前表面的中间壳体和覆盖中间壳体和电路板的下壳体。 被夹持并保持在上壳体和下壳体之间的凸缘部分设置在中间壳体的周边边缘。 上壳体和下壳体中的一个设置有接合部分,并且与接合部分接合的接合部分被设置到另一个壳体中以对应于接合部分。
    • 84. 发明申请
    • NOISE PROCESSING APPARATUS
    • 噪音处理装置
    • US20130022209A1
    • 2013-01-24
    • US13483350
    • 2012-05-30
    • Hideki TOMIMORIKen SasakiYasuhiko NakanoSatoshi SanoYoshio Ishida
    • Hideki TOMIMORIKen SasakiYasuhiko NakanoSatoshi SanoYoshio Ishida
    • H04R29/00
    • A61B5/0245A61B5/18A61B5/6893A61B5/7214
    • A noise processing apparatus measures a first potential difference signal, between a first electrode and a second electrode that is used as a reference electrode, and measures a second potential difference signal, between the second electrode and a third electrode that is arranged on the steering unit in the apparatus. The apparatus calculates the difference between the intensities of the first potential difference signal and the second potential difference signal calculated at the predetermined intervals. The apparatus corrects the first potential difference signal or the second potential difference signal by using the calculated difference such that the intensities of the first potential difference signal and the second potential difference signal are canceled out. The apparatus calculates a differential signal indicating the difference between the first potential difference signal and the second potential difference signal by using the corrected potential difference signal, and outputs the differential signal.
    • 噪声处理装置测量在用作参考电极的第一电极和第二电极之间的第一电位差信号,并测量第二电极和布置在转向单元上的第三电极之间的第二电位差信号 在装置中。 该装置计算第一电位差信号的强度与以预定间隔计算的第二电位差信号之间的差。 该装置通过使用计算出的差值来校正第一电位差信号或第二电位差信号,使得第一电位差信号和第二电位差信号的强度被抵消。 该装置通过使用校正的电位差信号来计算指示第一电位差信号和第二电位差信号之间的差的差分信号,并输出该差分信号。
    • 86. 发明授权
    • Method and program for operating test apparatus
    • 操作试验装置的方法和程序
    • US08319514B2
    • 2012-11-27
    • US12851817
    • 2010-08-06
    • Satoshi SanoShinji Kojima
    • Satoshi SanoShinji Kojima
    • G01R31/26
    • G01R31/2894G01R31/2831
    • Disclosed is a method for operating a test apparatus in which the testing efficiency is drastically increased. The test apparatus has a plurality of stages for testing wafers by using operation buttons displayed on the operating screens of each of a plurality of monitors. Exclusion condition buttons for excluding operation buttons are set in at least one monitor using exclusion condition data prepared by combining data required to perform various functions of the test apparatus and an exclusion condition pattern prepared by combining the exclusion condition of the exclusion condition data into data for deciding whether the operating button configured to operate each function can be pressed or not. Also, display of the screen that satisfies the exclusion condition for at least one monitor is prevented.
    • 公开了一种操作测试设备的方法,其中测试效率大大提高。 测试装置具有多个阶段,用于通过使用显示在多个监视器中的每一个的操作屏幕上的操作按钮来测试晶片。 用于排除操作按钮的排除条件按钮被设置在至少一个监视器中,使用通过组合执行测试装置的各种功能所需的数据和通过将排除条件数据的排除条件组合为排除条件数据而形成的数据而准备的排除条件数据 决定是否可以按下配置成操作各功能的操作按钮。 此外,防止满足至少一个监视器的排除条件的屏幕的显示。
    • 88. 发明授权
    • Inspection method and program for inspecting electrical characteristics of a semiconductor wafer
    • 用于检查半导体晶片的电特性的检查方法和程序
    • US08013621B2
    • 2011-09-06
    • US12358796
    • 2009-01-23
    • Satoshi SanoDaiki Kurihara
    • Satoshi SanoDaiki Kurihara
    • G01R31/308
    • G01R31/2891
    • Disclosed is an inspection method capable of performing an inspection of high reliability even for very fine and thin-film electrode pads of a target object, by using needle traces formed on the electrode pads and making the electrode pads repeatedly contact the probes at high accuracy. In the inspection method, under the control of a control unit 15 of an inspection apparatus 10, by using old needle traces formed on the respective pads P of the target object such as a semiconductor wafer W, contactable regions S for the probes 12A in preparation for a present inspection, so that each of the probes 12A contact each of the electrode pad P in the contactable region S and within an empty area with no needle trace.
    • 公开了一种能够通过使用形成在电极焊盘上的针迹并使电极焊盘以高精度反复接触探针的方式,即使对于目标物体的非常细小的薄膜电极焊盘也可以进行高可靠性的检查。 在检查方法中,在检查装置10的控制部15的控制下,通过使用形成在目标物体(例如半导体晶片W)的各个焊盘P上的旧针状迹线,准备探针12A的可接触区域S 为了进行现在的检查,使得每个探针12A接触可接触区域S中的电极焊盘P的每一个并且在没有针痕迹的空白区域内。