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    • 81. 发明授权
    • Duty cycle correction circuit whose operation is largely independent of operating voltage and process
    • 工作循环校正电路的工作原理很大程度上与工作电压和工艺无关
    • US07675338B2
    • 2010-03-09
    • US12140335
    • 2008-06-17
    • David W. BoerstlerEskinder HailuJieming Qi
    • David W. BoerstlerEskinder HailuJieming Qi
    • H03K3/017
    • H03K5/1565
    • A Duty Cycle Correction (DCC) circuit is provide in which pairs of field effect transistors (FETs) in known DCC circuit topologies are replaced with linear resistors coupled to switches of the DCC circuit such that when the switch is open, the input signal is routed through the linear resistors. The linear resistors are more tolerant of process, voltage and temperature (PVT) fluctuations than FETs and thus, the resulting DCC circuit provides a relatively smaller change in DCC correction range with PVT fluctuations than the known DCC circuit topology that employs FETs. The linear resistors may be provided in parallel with the switches and in series with a pair of FETs having relatively large resistance values. The linear resistors provide resistance that pulls-up or pulls-down the pulse width of the input signal so as to provide correction to the duty cycle of the input signal.
    • 提供了一种占空比校正(DCC)电路,其中已知DCC电路拓扑中的成对的场效应晶体管(FET)被连接到DCC电路的开关的线性电阻器代替,使得当开关断开时,输入信号被路由 通过线性电阻。 线性电阻器比FET更容忍工艺,电压和温度(PVT)波动,因此,所得到的DCC电路与使用FET的已知DCC电路拓扑结构相比,具有PVT波动的DCC校正范围相对较小的变化。 线性电阻器可以与开关并联设置并且与具有相对较大电阻值的一对FET串联。 线性电阻器提供上拉或下拉输入信号的脉冲宽度的电阻,以便对输入信号的占空比提供校正。
    • 83. 发明授权
    • Thermal sensing method and apparatus using existing ESD devices
    • 使用现有ESD器件的热感测方法和设备
    • US07519498B2
    • 2009-04-14
    • US11242675
    • 2005-10-04
    • David W. BoerstlerEskinder HailuKazuhiko MikiJieming Qi
    • David W. BoerstlerEskinder HailuKazuhiko MikiJieming Qi
    • G06F3/00
    • G01K7/01G01K2217/00
    • The present invention provides a method, an apparatus, and a computer program product for measuring the temperature of a microprocessor through the use of ESD circuitry. The present invention uses diodes and an I/O pad within ESD circuits to determine the temperature at the location of the ESD circuitry. First, a current measuring device connects to a diode. A user or a computer program disables the protected component or circuitry, and subsequently applies a predetermined voltage to the I/O pad. This creates a reverse saturation current through the diode, which is measured by the current measuring device. From this current the user or a computer program determines the temperature of the microprocessor at the diode through the use of a graphical representation of diode reverse saturation current and corresponding temperature.
    • 本发明提供了一种通过使用ESD电路来测量微处理器的温度的方法,装置和计算机程序产品。 本发明在ESD电路中使用二极管和I / O焊盘来确定ESD电路位置处的温度。 首先,电流测量装置连接到二极管。 用户或计算机程序禁用受保护的组件或电路,然后将预定电压施加到I / O焊盘。 这通过二极管产生反向饱和电流,由电流测量装置测量。 从该电流,用户或计算机程序通过使用二极管反向饱和电流和相应温度的图形表示来确定微处理器在二极管处的温度。