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    • 82. 发明专利
    • PURE WATER FEEDING METHOD FOR SEMICONDUCTOR MANUFACTURING DEVICE
    • JPH0257304A
    • 1990-02-27
    • JP20842588
    • 1988-08-24
    • HITACHI LTDHITACHI YONEZAWA DENSHI KK
    • MATSUURA TAKAO
    • B28D7/00H01L21/301H01L21/304H01L21/78
    • PURPOSE:To lower specific resistance of pure water stably by setting a piping of pure water meandering after a section where CO2 gas is injected by an injection mechanism and feeding the pure water passed through said piping. CONSTITUTION:When pure water is fed from an inlet 11 side of a piping 2, CO2 gas in a tank 3 is passed through a feeding pipe 8 by way of an injection mechanism 4 in order to set the given specific resistance value. CO2 gas flows in the piping 2 in the foaming shape together with pure water, and as the piping 2 meanders and the flow speed of respective sections on the cross section, the direction crossing the flow direction of respective sections, is different, a part of the flow of pure water makes vortex when the piping 2 flows in the bending sections, and CO2 gas is agitated. The piping 2 bends at a plurality of sections, and at every bending, CO2 gas is agitated and fed to a semiconductor manufacturing device through an outlet 12. In case the flow of pure water is varied, specific resistance sensing value of a specific resistance sensing sensor 10 is varied, and said value is compared with a desired value in a comparison section 9, and feeding volume of CO2 gas is set by operating the adjusting mechanism 7 according to the sensed value to maintain specific resistance almost constant.
    • 84. 发明专利
    • METHOD AND DEVICE FOR ELECTROSTATIC DETECTION
    • JPH0236366A
    • 1990-02-06
    • JP18564488
    • 1988-07-27
    • HITACHI LTDHITACHI YONEZAWA DENSHI KK
    • TAKAHASHI TOSHIRO
    • G01R29/12G01R29/24H01L21/66H05F3/00
    • PURPOSE:To preclude abnormal output even when an unexpected voltage which is higher than specific is detected by detecting static electricity and outputting abnormality when the frequency of the detection of static electricity exceeding the specific voltage level exceeds a frequency within a specific time or within the specific number of times of detection. CONSTITUTION:The output of the sensor 1 which includes a detection electrode 2, a rotary sector 4, a motor 5, and a shift 6 is connected to the operational amplification part 7 including a counter 14. When a semiconductor device 21 as a body to be detected passes below the electrode 2 while the sector 4 is rotated by the motor 5 through the shaft 6, lines of electric force are generated intermittently between the device 21 and electrode 2 when the package 22 of the device 21 is charged electrostatically, and an AC signal is amplified and rectified by the amplification part 7 to obtain a DC voltage proportional to the charged voltage of the device 21. This voltage is held by a peak holding circuit 9 for a constant period, fetched to a comparator 13, and compared with a set voltage by a comparison voltage source 12, and when a voltage of >=100V is detected >=2 times in a period of 30 seconds wherein the preset signal of a rate generator 15 is generated, the device 21 is stopped urgently with the output of the counter 14.
    • 86. 发明专利
    • BONDING METHOD AND DEVICE
    • JPS6454741A
    • 1989-03-02
    • JP21012287
    • 1987-08-26
    • HITACHI LTDHITACHI YONEZAWA DENSHI KK
    • YAMAGUCHI YOSHIHIKOHASEGAWA TAKESHI
    • H01L21/607H01L21/60
    • PURPOSE:To reduce the resonance of a lead frame, to improve the sliding efficiency of a wire on a joint surface and to prevent a mistake on joining by giving two kinds or more of vibrations to one of a body to be joined or another member. CONSTITUTION:When a bonding arm 1 is lowered and a wire projected from the tip of a capillary 8 is brought into contact with a body to be joined, a power supply 9 drives a piezoelectric element 2, a power supply 11 controls a piezoelectric element 3, the length and volume of the arm 1 are adjusted, vibrations of 40kHz are transmitted over the wire 13 through the capillary 8 efficiently, and the wire 13 is slid at 40kHz on the body to be joined. Likewise, vibrations of 40, 50 and 60kHz are applied at one interface. A bonding body is not resonated and the wire is joined in vibrations of 40 or 50kHz when the natural frequency of the bonding body is 60kHz, and no wire is peeled because the bonding body and the wire are resonated even when 60kHz is applied subsequently. According to the constitution, the bonding body and a body to be bonded can be joined when other frequency is applied even when the bonding body and the body to be bonded have resonance points, thus joining both bodies more positively than only the case of one kind of vibrations.
    • 88. 发明专利
    • METHOD AND APPARATUS FOR DICING
    • JPS6427904A
    • 1989-01-30
    • JP18338887
    • 1987-07-24
    • HITACHI LTDHITACHI YONEZAWA DENSHI KK
    • TSUCHIDA KIYOSHIABE YOSHIO
    • B28D5/00H01L21/301H01L21/78
    • PURPOSE:To reduce scattering of cutting scraps falling with washing water and to reduce adhesion of the cut scraps on a wafer, by facing a cut groove forming face of the wafer downward and carrying out dicing by rotating a rotating blade from the bottom of the wafer. CONSTITUTION:A wafer 2 is held under such a condition that the cut groove forming face is faced downward, and dicing is carried out under such a condition that a rotating blade 4 is rotated and washing water is sprayed from a nozzle 7 around the part of the wafer 2 where the cut groove should be formed. Cut scraps produced by dicing are scattered in the opposite direction to the forwarding direction of the rotating blade 4 by the flow of the washing water 8 and the centrifugal force of the rotating blade 4. The cut scraps fall down due to the dead weight but do not fall down on the wafer 2 because the wafer 2 is positioned above the rotating blade 4. Even if the cut scraps with water drops of the washing water adhere on the main surface of the wafer 2, the cut scraps fall down by the dead weight owing to vibration of dicing and so on, and remaining of the cut scraps on the main surface of the wafer 2 is thereby reduced.
    • 90. 发明专利
    • LEAD FRAME
    • JPS641267A
    • 1989-01-05
    • JP15548687
    • 1987-06-24
    • HITACHI LTDHITACHI YONEZAWA DENSHI KK
    • KIMURA HIDEAKI
    • H01L23/50
    • PURPOSE:To reduce the deformation of a lead and to decrease a malfunction, such as a wire short-circuit by forming a section formed thinner than other lead over its longitudinal direction at the outer frame of a lead frame. CONSTITUTION:A lead frame in which part of the outer frame 2 of a lead frame 1 is thinned is prepared. (This thinned recess 9 is treated by etching or the like). Then, a pellet 10 is bonded (placed) by Ag paste on a tab 3. Then, a wire 11 is bonded by thermal press-bonding or the like. Even if a force F as shown in the drawing is applied in this state, since the recess 9 is formed thinner than the other section, the recess 9 is deformed due to its weak strength. If the force F is absorbed by the deformation of the recess 9, the deformation of inner leads 6 can be reduced. Thus, the deformation of the wire 11 upon deformation of the inner leads can be decreased.