会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 73. 发明申请
    • Memory device and memory programming method
    • 存储器和存储器编程方法
    • US20090296486A1
    • 2009-12-03
    • US12382351
    • 2009-03-13
    • Jae Hong KimKyoung Lae ChoYong June KimDong Hyuk Chae
    • Jae Hong KimKyoung Lae ChoYong June KimDong Hyuk Chae
    • G11C16/06
    • G11C16/10G11C11/5628G11C2211/5621
    • Memory devices and/or memory programming methods are provided. A memory device may include: a memory cell array including a plurality of memory cells; a programming unit configured to apply a plurality of pulses corresponding to a program voltage to a gate terminal of each of the plurality of memory cells, and to apply a program condition voltage to a bit line connected with a memory cell having a threshold voltage lower than a verification voltage from among the plurality of memory cells; and a control unit configured to increase the program voltage during a first time interval by a first increment for each pulse, and to increase the program voltage during a second time interval by a second increment for each pulse. Through this, it may be possible to reduce a width of a distribution of threshold voltages of a memory cell.
    • 提供存储器件和/或存储器编程方法。 存储器件可以包括:包括多个存储器单元的存储单元阵列; 编程单元,被配置为将与编程电压相对应的多个脉冲施加到所述多个存储单元中的每一个的栅极端子,并且将编程状态电压施加到与具有低于阈值电压的阈值电压的存储单元连接的位线 来自所述多个存储单元中的验证电压; 以及控制单元,被配置为在每个脉冲的第一时间间隔期间增加编程电压的第一增量,并且在第二时间间隔期间增加每个脉冲的第二增量的编程电压。 由此,可以减小存储单元的阈值电压分布的宽度。
    • 80. 发明授权
    • Memory device and method of controlling read level
    • 存储器件和控制读取电平的方法
    • US07889563B2
    • 2011-02-15
    • US12453974
    • 2009-05-28
    • Kyoung Lae ChoDonghun Yu
    • Kyoung Lae ChoDonghun Yu
    • G11C16/06
    • G11C16/26G11C7/06G11C11/5642G11C16/349G11C2207/068G11C2211/5634G11C2211/5644
    • Provided are memory devices and read level controlling methods. A memory device may include: a memory cell array that includes a plurality of memory cells; a counter that counts a number of memory cells with a threshold voltage included in a reference threshold voltage interval among the plurality of memory cells; a first decision unit that compares the counted number of memory cells with a threshold value to thereby decide whether to set a read level based on the reference threshold voltage interval; and a second decision unit that generates a new reference threshold voltage interval based on the comparison result between the counted number of memory cells and the threshold value.
    • 提供了存储器件和读取电平控制方法。 存储器装置可以包括:包括多个存储器单元的存储单元阵列; 在所述多个存储器单元之间用参考阈值电压间隔中包含的阈值电压对多个存储单元进行计数的计数器; 第一判定单元,其将计数的存储单元数与阈值进行比较,从而基于参考阈值电压间隔决定是否设置读取电平; 以及第二判定单元,其基于计数的存储单元数与阈值之间的比较结果生成新的参考阈值电压间隔。