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    • 79. 发明授权
    • Floating source line architecture for non-volatile memory
    • 用于非易失性存储器的浮动源线架构
    • US08004872B2
    • 2011-08-23
    • US12272507
    • 2008-11-17
    • Chulmin JungYong LuHarry Hongyue Liu
    • Chulmin JungYong LuHarry Hongyue Liu
    • G11C11/10
    • G11C13/0002G11C7/12G11C11/16G11C11/1673G11C11/1675G11C13/0069
    • A method and apparatus for writing data to a non-volatile memory cell, such as an RRAM memory cell. In some embodiments, a semiconductor array of non-volatile memory cells comprises a resistive sense element (RSE) and a switching device. A RSE of a plurality of memory cells is connected to a bit line while the switching device of a plurality of memory cells is connected to a word line and operated to select a memory cell. A source line is connected to the switching device and connects a series of memory cells together. Further, a driver circuit is connected to the bit line and writes a selected RSE of a selected source line to a selected resistive state by passing a write current along a write current path that passes through the selected RSE and through at least a portion of the remaining RSE connected to the selected source line.
    • 一种将数据写入诸如RRAM存储单元的非易失性存储单元的方法和装置。 在一些实施例中,非易失性存储单元的半导体阵列包括电阻感测元件(RSE)和开关器件。 多个存储单元的RSE连接到位线,而多个存储单元的开关器件连接到字线并被操作以选择存储器单元。 源极线连接到开关器件,并将一系列存储器单元连接在一起。 此外,驱动器电路连接到位线,并且通过使写入电流沿着通过所选择的RSE的写入电流路径并且通过至少一部分所述选择的RSE而将所选择的源极线的选定RSE写入所选择的电阻状态 剩余的RSE连接到所选择的源线。
    • 80. 发明授权
    • Compensating for variations in memory cell programmed state distributions
    • 补偿存储单元编程状态分布的变化
    • US07830708B1
    • 2010-11-09
    • US12428002
    • 2009-04-22
    • Chulmin JungYong LuHarry Hongyue Liu
    • Chulmin JungYong LuHarry Hongyue Liu
    • G11C16/00
    • G11C11/5642G11C16/0483G11C2211/5631G11C2211/5632
    • Method and apparatus for compensating for variations in memory cell programmed state distributions, such as but not limited to a non-volatile memory formed of NAND configured Flash memory cells. In accordance with various embodiments, a memory block is formed from a plurality of memory cells that are arranged into rows and columns within the memory block, each memory cell configured to have a programmed state. A selected row of the memory block is read by concurrently applying a stepped sequence of threshold voltages to each memory cell along the selected row while sequentially decoupling read current from groups of memory cells along the selected row as the programmed states of said groups of cells are successively determined.
    • 用于补偿存储器单元编程状态分布的变化的方法和装置,例如但不限于由NAND配置的闪存单元形成的非易失性存储器。 根据各种实施例,存储器块由多个存储器单元形成,多个存储器单元被布置成存储器块内的行和列,每个存储器单元被配置为具有编程状态。 存储器块的选定行通过沿着所选择的行并行地向每个存储器单元施加阶梯式序列来读取,同时沿着所选行的顺序地将读取电流与存储器单元组分离,因为所述单元组的编程状态为 先后确定。