会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 72. 发明授权
    • Systems and methods for enhanced flaw scan in a data processing device
    • 用于在数据处理设备中增强缺陷扫描的系统和方法
    • US08176400B2
    • 2012-05-08
    • US12556180
    • 2009-09-09
    • Weijun TanShaohua YangHongwei SongRichard Rauschmayer
    • Weijun TanShaohua YangHongwei SongRichard Rauschmayer
    • H03M13/00
    • H04L1/0057H04L1/0045
    • Various embodiments of the present invention provide systems and methods for flaw scan in a data processing system. As one example, a data processing system is disclosed that includes a data detector circuit, a bit sign inverting circuit, and an LDPC decoder circuit. The data detector circuit receives a verification data set that is an invalid LDPC codeword, and applies a data detection algorithm to the verification data set to yield a detected output. The bit sign inverting circuit modifies the sign of one or more elements of a first derivative of the detected output to yield a second derivative of the detected output. The second derivative of the detected output is an expected valid LDPC codeword. The LDPC decoder circuit applies a decoding algorithm to the second derivative of the detected output to yield a decoded output.
    • 本发明的各种实施例提供了在数据处理系统中的缺陷扫描的系统和方法。 作为一个示例,公开了包括数据检测器电路,位符号反相电路和LDPC解码器电路的数据处理系统。 数据检测器电路接收作为无效LDPC码字的验证数据集,并将数据检测算法应用于验证数据集以产生检测到的输出。 位符号反相电路修改检测输出的一阶导数的一个或多个元素的符号,以产生检测到的输出的二阶导数。 所检测的输出的二阶导数是期望的有效LDPC码字。 LDPC解码器电路将解码算法应用于检测输出的二阶导数,以产生解码输出。
    • 73. 发明授权
    • Systems and methods for storage channel testing
    • 存储通道测试的系统和方法
    • US07990642B2
    • 2011-08-02
    • US12425757
    • 2009-04-17
    • Yuan Xing LeeGeorge MathewShaohua YangHongwei SongWeijun TanHao Zhong
    • Yuan Xing LeeGeorge MathewShaohua YangHongwei SongWeijun TanHao Zhong
    • G11B27/36
    • G11B20/182G11B2220/2516
    • Various embodiments of the present invention provide systems and methods for validating elements of storage devices. A an example, various embodiments of the present invention provide semiconductor devices that include a write path circuit, a read path circuit and a validation circuit. The write path circuit is operable to receive a data input and to convert the data input into write data suitable for storage to a storage medium. The read path circuit is operable to receive read data and to convert the read data into a data output. The validation circuit is operable to: receive the write data, augment the write data with a first noise sequence to yield a first augmented data series; and augment a derivative of the first augmented data series with a second noise sequence to yield the read data.
    • 本发明的各种实施例提供用于验证存储设备的元件的系统和方法。 作为示例,本发明的各种实施例提供包括写入路径电路,读取路径电路和验证电路的半导体器件。 写入路径电路可操作用于接收数据输入并将数据输入转换成适合于存储的写数据到存储介质。 读路径电路可操作以接收读数据并将读数据转换为数据输出。 验证电路可操作以:接收写入数据,用第一噪声序列增加写入数据以产生第一增强数据序列; 并且用第二噪声序列来增加第一增强数据序列的导数以产生读取的数据。
    • 75. 发明申请
    • Method for detecting short burst errors in LDPC system
    • 用于检测LDPC系统中短脉冲串错误的方法
    • US20100091629A1
    • 2010-04-15
    • US12287959
    • 2008-10-15
    • Weijun TanShaohua YangHongwei Song
    • Weijun TanShaohua YangHongwei Song
    • G11B27/36
    • H03M13/1128H03M13/17
    • The present invention is a device for detecting short burst errors. The device includes a first signal input, wherein the first signal input is configured to receive a first signal. The device includes a second signal input, wherein the second signal input is configured to receive a second signal. The device includes a logic gate, wherein the logic gate is operable for receiving the first signal vial the first signal input, receiving the second signal via the second signal input, and generating a logic output gate signal based on the received first signal and the second signal. Furthermore, the device includes a filter, wherein the filter is configured for receiving the logic output gate signal from the logic gate and generates a filter output signal based upon the received logic output gate signal, wherein the filter output signal is operable for flagging errors.
    • 本发明是用于检测短脉冲串错误的装置。 该设备包括第一信号输入,其中第一信号输入被配置为接收第一信号。 该设备包括第二信号输入,其中第二信号输入被配置为接收第二信号。 该装置包括逻辑门,其中逻辑门可操作用于接收第一信号输入端,第一信号输入端,经由第二信号输入端接收第二信号,并根据接收到的第一信号和第二信号产生逻辑输出门信号 信号。 此外,该器件包括滤波器,其中滤波器被配置为从逻辑门接收逻辑输出门信号,并且基于接收的逻辑输出门信号产生滤波器输出信号,其中滤波器输出信号可用于标记误差。
    • 77. 发明授权
    • Systems and methods for idle clock insertion based power control
    • 基于空闲时钟插入的功率控制系统和方法
    • US08972761B2
    • 2015-03-03
    • US13364217
    • 2012-02-01
    • Shaohua YangChangyou XuFan Zhang
    • Shaohua YangChangyou XuFan Zhang
    • G06F1/32
    • G06F1/324G06F1/3268G11B19/02G11B19/209Y02D10/126Y02D10/154
    • The present inventions are related to systems and methods for data processing, and more particularly to systems and methods for power governance in a data processing system. In one particular case, a system is disclosed that includes a first data processing circuit operable to apply a data detection algorithm to a data input synchronous to a first clock, and a second data processing circuit operable to apply a subsequent data processing algorithm to an output derived from the first data processing circuit synchronous to a second clock, and an idle time enforcement circuit operable to modify an average frequency of at least one of the first clock and the second clock.
    • 本发明涉及用于数据处理的系统和方法,更具体地涉及用于数据处理系统中的功率治理的系统和方法。 在一个具体情况下,公开了一种系统,其包括可操作以将数据检测算法应用于与第一时钟同步的数据输入的第一数据处理电路,以及可操作以将后续数据处理算法应用于输出的第二数据处理电路 来自与第二时钟同步的第一数据处理电路,以及空闲时间执行电路,其可操作以修改第一时钟和第二时钟中的至少一个的平均频率。
    • 79. 发明授权
    • Systems and methods for short media defect detection
    • 用于短介质缺陷检测的系统和方法
    • US08887034B2
    • 2014-11-11
    • US13088119
    • 2011-04-15
    • Fan ZhangShaohua Yang
    • Fan ZhangShaohua Yang
    • G06F7/02H03M13/00G06F11/07
    • G06F11/0754
    • Various embodiments of the present invention provide systems and methods for media defect detection. As an example, a data processing circuit is disclosed that includes a defect detector circuit and a comparator circuit. The defect detector circuit is operable to calculate a correlation value combining at least three of a data input derived from a medium, a detector extrinsic output, a detector intrinsic output and a decoder output. The comparator circuit is operable to compare the correlation value to a threshold value and to assert a media defect indicator when the correlation value is less than the threshold value.
    • 本发明的各种实施例提供了用于介质缺陷检测的系统和方法。 作为示例,公开了包括缺陷检测器电路和比较器电路的数据处理电路。 缺陷检测器电路可操作以计算组合从介质导出的数据输入,检测器外在输出,检测器本征输出和解码器输出中的至少三个的相关值。 比较器电路可操作以将相关值与阈值进行比较,并且当相关值小于阈值时断言介质缺陷指示符。