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    • 71. 发明申请
    • APPARATUS FOR PLASMA PROCESSING SYSTEM WITH TUNABLE CAPACITANCE
    • 用于具有可调电容的等离子体处理系统的装置
    • US20140034243A1
    • 2014-02-06
    • US14058101
    • 2013-10-18
    • Rajinder DhindsaAlexei Marakhtanov
    • Rajinder DhindsaAlexei Marakhtanov
    • H01J37/21
    • H01J37/21H01J37/32091H01J37/32642H01J37/32697
    • A plasma processing system having a plasma processing chamber configured for processing a substrate is provided. The substrate is disposed above a chuck and surrounded by an edge ring, which is electrically isolated from the chuck. The system includes a RF power, which provides power to the chuck. The system also includes a tunable capacitance arrangement, which is coupled to the edge ring to provide RF coupling to the edge ring, resulting in the edge ring having an edge ring potential. The system further includes the plasma processing chamber configured to strike plasma to process the substrate, which is processed while the tunable capacitance arrangement is configured to cause the edge ring potential to be dynamically tunable to a DC potential of the substrate while processing the substrate.
    • 提供了一种等离子体处理系统,其具有用于处理基板的等离子体处理室。 基板设置在卡盘上方并被与卡盘电隔离的边缘环包围。 该系统包括向卡盘供电的RF功率。 该系统还包括可调电容布置,其耦合到边缘环以提供与边缘环的RF耦合,导致边缘环具有边缘环电位。 该系统还包括等离子体处理室,该等离子体处理室被配置成撞击等离子体以处理衬底,该处理在可调谐电容布置被配置成使得边缘环电位在处理衬底的同时能够动态调节到衬底的DC电位。
    • 77. 发明申请
    • Pulsed Plasma Chamber in Dual Chamber Configuration
    • 脉冲等离子室双腔配置
    • US20130059448A1
    • 2013-03-07
    • US13227404
    • 2011-09-07
    • Alexei MarakhtanovRajinder DhindsaEric HudsonAndrew D. Bailey, III
    • Alexei MarakhtanovRajinder DhindsaEric HudsonAndrew D. Bailey, III
    • H01L21/3065H01L21/306C23F1/08
    • Embodiments for processing a substrate in a pulsed plasma chamber are provided. A processing apparatus with two chambers, separated by a plate fluidly connecting the chambers, includes a continuous wave (CW) controller, a pulse controller, and a system controller. The CW controller sets the voltage and the frequency for a first radio frequency (RF) power source coupled to a top electrode. The pulse controller is operable to set voltage, frequency, ON-period duration, and OFF-period duration for a pulsed RF signal generated by a second RF power source coupled to the bottom electrode. The system controller is operable to set parameters to regulate the flow of species between the chambers to assist in the negative-ion etching, to neutralize excessive positive charge on the wafer surface during afterglow in the OFF period, and to assist in the re-striking of the bottom plasma during the ON period.
    • 提供了用于在脉冲等离子体室中处理衬底的实施例。 具有两个腔室的处理装置,由流体连接腔室的板分开,包括连续波(CW)控制器,脉冲控制器和系统控制器。 CW控制器设置耦合到顶部电极的第一射频(RF)电源的电压和频率。 脉冲控制器可操作地为耦合到底部电极的第二RF电源产生的脉冲RF信号设置电压,频率,接通周期持续时间和关闭周期持续时间。 系统控制器可操作以设定参数以调节室之间的物质流动,以辅助负离子蚀刻,以在关闭期间中止余辉期间晶片表面上的过多正电荷,并且辅助重击 在ON期间的底部等离子体。