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    • 63. 发明授权
    • Semiconductor memory device and its operation method
    • 半导体存储器件及其操作方法
    • US07558134B2
    • 2009-07-07
    • US11715413
    • 2007-03-08
    • Makoto Kitagawa
    • Makoto Kitagawa
    • G11C7/00
    • G11C11/405G11C7/12G11C7/18G11C8/16G11C11/4094G11C11/4097G11C2207/005G11C2207/2281G11C2207/229
    • A semiconductor memory device includes a memory-cell array, a read bit line, a write bit line, a sense amplifier, a first sense line, a second sense line, a first bit line switch, and a second bit line switch. The memory-cell array is laid out to form an array. The read bit line is shared by plural memory cells and connected to a data output node. The write bit line is shared by plural memory cells and connected to a data input node. The sense amplifier is configured to sense a difference in electric potential. The first sense line is connected to one of the input terminals. The second sense line is connected to the other input terminal. The first bit line switch is configured to control electrical connection and disconnection. The second bit line switch is configured to control electrical connection and disconnection.
    • 半导体存储器件包括存储单元阵列,读位线,写位线,读出放大器,第一感测线,第二感测线,第一位线开关和第二位线开关。 存储单元阵列被布置成形成阵列。 读位线由多个存储器单元共享并连接到数据输出节点。 写位线由多个存储器单元共享并连接到数据输入节点。 感测放大器被配置为感测电位差。 第一感测线连接到输入端之一。 第二感测线连接到另一输入端。 第一位线开关配置为控制电气连接和断开。 第二位线开关被配置为控制电气连接和断开。
    • 64. 发明申请
    • Semiconductor device
    • 半导体器件
    • US20090086536A1
    • 2009-04-02
    • US12230283
    • 2008-08-27
    • Makoto KitagawaMitsuo Soneda
    • Makoto KitagawaMitsuo Soneda
    • G11C11/34G11C7/00G11C8/00
    • G11C11/39
    • A semiconductor device includes a memory cell including a thyristor element with a gate having a pnpn structure formed in a semiconductor substrate, and a plurality of access transistors formed on the semiconductor substrate and each connected at a first terminal thereof to a storage node at one terminal of the thyristor element such that a potential at the storage node can be transmitted to bit lines different from each other, the gate of the thyristor element and the gates of the plurality of access transistors of the memory cell being connected to word lines different from one another.
    • 一种半导体器件包括:存储单元,具有在半导体衬底中形成有pnpn结构的栅极的晶闸管元件和形成在半导体衬底上并分别在其第一端部连接到一个端子处的存储节点的多个存取晶体管 的晶闸管元件,使得存储节点处的电位可以传输到彼此不同的位线,晶闸管元件的栅极和存储单元的多个存取晶体管的栅极连接到不同于一个的字线 另一个。
    • 67. 发明授权
    • Drive circuit for display apparatus
    • 显示装置的驱动电路
    • US06483496B2
    • 2002-11-19
    • US09348709
    • 1999-07-07
    • Mitsugu KobayashiMakoto Kitagawa
    • Mitsugu KobayashiMakoto Kitagawa
    • G09G336
    • G09G3/3611G09G2320/0606G09G2320/0626G09G2320/066G09G2320/0673
    • A reference voltage control circuit is provided and includes a reference voltage data generator circuit for generating reference voltage data PD from brightness data BD, and a selector for selecting, in accordance with a timing control signal Tc, a reference voltage data CD and digital R, G, and B data. By varying the reference voltage level in accordance with the brightness level, the DC component of the voltage signal obtained by clamping the reference voltage level is controlled. Furthermore, when controlling the brightness for every R, G, and B color, the reference voltage data CD (CDR, CDG, CDB) for the R, G, and B colors are generated by adding the brightness data BD and the sub-brightness data SB (SBR, SBG, SBB) for every R, G, and B color.
    • 提供了参考电压控制电路,并且包括用于从亮度数据BD产生参考电压数据PD的参考电压数据发生器电路,以及用于根据定时控制信号Tc选择参考电压数据CD和数字R的选择器, G和B数据。 通过根据亮度电平改变参考电压电平,控制通过钳位参考电压电平获得的电压信号的直流分量。 此外,当控制每个R,G和B颜色的亮度时,通过将亮度数据BD和子亮度相加来产生用于R,G和B颜色的参考电压数据CD(CDR,CDG,CDB) 数据SB(SBR,SBG,SBB)对于每种R,G和B颜色。