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    • 61. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US4562555A
    • 1985-12-31
    • US535232
    • 1983-09-23
    • Yoshiaki OuchiMasamichi IshiharaTetsuro MatsumotoKazuyuki Miyazawa
    • Yoshiaki OuchiMasamichi IshiharaTetsuro MatsumotoKazuyuki Miyazawa
    • G11C11/401G11C7/00G11C7/10G11C8/04
    • G11C7/10G11C7/1033G11C8/04
    • An address multiplex type system for a dynamic RAM includes a memory cell array having a plurality of memory cells which are simultaneously selected by signals output from an address decoder, a decoder, and a shift register. The dynamic RAM further includes a selecting circuit which receives a plurality of address signals applied externally through one of a plurality of pins of a package in a time-sharing manner and makes it possible to write or read data into or from one memory cell of the plurality of memory cells selected. The dynamic RAM can read out or write in serially data of a plurality of memory cells selected from the memory cell array when a shift register operates. The dynamic RAM can also read or write data serially into or from a plurality of memory cells selected from the memory cell array simply by connecting the pin to a predetermined potential. When the data is written or read serially, the pin arrangement of the package of a 256K bit dynamic RAM can be substantially the same as that of the package of a 64K bit dynamic RAM. Hence, compatibility can be established between the 256K bit dynamic RAM and a 64K bit dynamic RAM.
    • 用于动态RAM的地址多路复用类型系统包括具有多个存储单元的存储单元阵列,这些存储单元通过从地址解码器,解码器和移位寄存器输出的信号同时选择。 动态RAM还包括选择电路,其以分时方式接收通过封装的多个引脚之一施加到外部的多个地址信号,并且使得可以将数据写入或从其中的一个存储器单元读取数据 选择多个存储单元。 当移位寄存器操作时,动态RAM可以读出或写入从存储单元阵列中选择的多个存储单元的串行数据。 动态RAM也可以简单地通过将引脚连接到预定电位,来将数据串行读取或写入从存储单元阵列中选择的多个存储单元中。 当数据被串行写入或读取时,256K位动态RAM的封装的引脚排列可以与64K位动态RAM的封装基本相同。 因此,可以在256K位动态RAM和64K位动态RAM之间建立兼容性。
    • 62. 发明授权
    • Memory array with larger memory capacitors at row ends
    • 存储阵列在行末端具有较大的存储电容
    • US4118794A
    • 1978-10-03
    • US851691
    • 1977-11-15
    • Fumio MizunoMasamichi Ishihara
    • Fumio MizunoMasamichi Ishihara
    • G11C11/404G11C11/4097H01L27/105H01L27/108G11C11/24
    • H01L27/10805G11C11/404G11C11/4097H01L27/105
    • A memory cell of a dynamic storage device is composed of a MOSFET and a capacitor. On a single semiconductor substrate, a plurality of such memory cells are regularly arranged so as to form a plurality of columns, with the result that they constitute a memory cell array or a memory cell mat. The capacitor for the memory cell is made up of a semiconductor region of the type which possesses a conductivity opposite to that of the semiconductor substrate, and a conductor film which is formed of polycrystalline silicon or the like on the semiconductor region through a comparatively thin insulating film. The areas of the capacitors in the memory cell column situated at an end portion of the memory cell mat are made larger than those of the capacitors of the memory cells at an inner or central portion of the memory cell mat. The memory cells at the end portion of the memory cell mat come to have information holding times equivalent to those of the memory cells at the central portion of the memory cell mat.
    • 动态存储装置的存储单元由MOSFET和电容器组成。 在单个半导体衬底上,多个这样的存储单元被规则地排列以形成多个列,结果它们构成存储单元阵列或存储单元垫。 用于存储单元的电容器由具有与半导体衬底的导电性相反的导电性的半导体区域和由半导体区域上的多晶硅等形成的导体膜构成,该导体膜通过较薄的绝缘 电影。 位于存储单元垫的端部的存储单元列中的电容器的面积比在存储单元垫的内部或中央部分的存储单元的电容器的面积大。 存储单元垫的端部处的存储单元具有与存储单元垫的中央部分的存储单元相同的信息保持时间。