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    • 61. 发明申请
    • Laser processing device
    • 激光加工装置
    • US20080011722A1
    • 2008-01-17
    • US11822972
    • 2007-07-11
    • Yutaka KobayashiKouichi NehashiHiroshi Morikazu
    • Yutaka KobayashiKouichi NehashiHiroshi Morikazu
    • B23K26/08B23K26/02B23K26/067
    • B23K26/0853B23K26/0622B23K26/705B23K2101/40
    • Disclosed a laser processing device capable of recognizing a failure of pulsed laser beam irradiation during a process of pulsed laser beam irradiation and taking appropriate measures. A first judgment section and a second judgment section monitor respectively whether a pulsed laser beam is actually irradiated by an oscillation of a laser oscillator at the timing when a pulse signal is output from a pulse signal output section and whether the pulse signal output section outputs the pulse signal as setting to the laser oscillator at the timing when the pulse signal is output based on the preset pulse number. When there is a failure of the pulsed laser beam irradiation during the processing, the occurrence of failure is recognized and it can be recognized whether the failure is caused by a laser beam irradiating unit or a controller including the pulse signal output section.
    • 公开了一种能够识别在脉冲激光束照射过程中脉冲激光束照射失败并采取适当措施的激光加工装置。 第一判断部分和第二判断部分分​​别监视在从脉冲信号输出部分输出脉冲信号的时刻脉冲激光束是否被激光振荡器的振荡实际照射,以及脉冲信号输出部分是否输出 脉冲信号作为在基于预设脉冲数输出脉冲信号的定时的激光振荡器的设置。 当在处理期间发生脉冲激光束照射失败时,识别故障的发生,并且可以识别是否由激光束照射单元或包括脉冲信号输出部的控制器引起故障。
    • 64. 发明授权
    • Optical device wafer processing method
    • 光器件晶圆加工方法
    • US08759195B2
    • 2014-06-24
    • US13331554
    • 2011-12-20
    • Hiroshi MorikazuYoko Nishino
    • Hiroshi MorikazuYoko Nishino
    • H01L21/30
    • H01L33/0079B23K26/364B23K26/40B23K26/57B23K2103/172
    • An optical device layer (ODL) in an optical device wafer is transferred to a transfer substrate. The ODL is formed on the front side of an epitaxy substrate through a buffer layer. The ODL is partitioned by a plurality of crossing streets to define regions where a plurality of optical devices are formed. The transfer substrate is bonded to the front side of the ODL, and the epitaxy substrate is cut along crossing streets into a plurality of blocks. A laser beam is applied to the epitaxy substrate from the back side of the epitaxy substrate to the unit of the optical device wafer and the transfer substrate in the condition where the focal point of the laser beam is set in the buffer layer, thereby decomposing the buffer layer. The epitaxy substrate divided into the plurality of blocks is peeled off from the ODL.
    • 光学器件晶片中的光学器件层(ODL)被转移到转移衬底。 ODL通过缓冲层形成在外延基板的正面上。 ODL被多个交叉街道划分,以限定形成多个光学装置的区域。 转印衬底粘合到ODL的前侧,并且将外延衬底沿着交叉街道切割成多个块。 在激光束的焦点设置在缓冲层中的状态下,将激光束从外延基板的背面施加到外延基板的单元到光学器件晶片和转印基板的单元,从而将激光束分解 缓冲层。 被划分成多个块的外延衬底从ODL剥离。
    • 66. 发明授权
    • Laser processing apparatus
    • 激光加工设备
    • US08404999B2
    • 2013-03-26
    • US12899757
    • 2010-10-07
    • Ken TogashiKeiji NomaruHiroshi Morikazu
    • Ken TogashiKeiji NomaruHiroshi Morikazu
    • B23K26/38B23K26/067
    • B23K26/0853B23K26/0673C03B33/0222
    • A laser processing apparatus including a laser applying unit. The laser applying unit includes a first laser oscillating unit, a second laser oscillating unit, a first laser branching unit for branching a laser beam oscillated from the first laser oscillating unit into three optical paths, a second laser branching unit for branching a laser beam oscillated from the second laser oscillating unit into three optical paths, three first focusing units for respectively focusing the laser beams through the three optical paths obtained by the first laser branching unit toward a glass substrate, and three second focusing units for respectively focusing the laser beams through the three optical paths obtained by the second laser branching unit. The first focusing units and the second focusing units are alternately arranged in a line in an indexing direction.
    • 一种激光加工设备,包括激光施加单元。 激光施加单元包括第一激光振荡单元,第二激光振荡单元,用于将从第一激光振荡单元振荡的激光束分支为三个光路的第一激光分支单元,用于分支激光束振荡的第二激光分支单元 从第二激光振荡单元到三个光路中,三个第一聚焦单元,用于分别将激光束通过由第一激光分支单元获得的三个光路聚焦到玻璃基板,以及三个第二聚焦单元,用于分别聚焦激光束 由第二激光分支单元获得的三个光路。 第一聚焦单元和第二聚焦单元沿分度方向交替布置成一行。
    • 67. 发明申请
    • METHOD OF PROCESSING OPTICAL DEVICE WAFER
    • 处理光学器件波形的方法
    • US20130017640A1
    • 2013-01-17
    • US13546219
    • 2012-07-11
    • Hiroshi MorikazuYoko Nishino
    • Hiroshi MorikazuYoko Nishino
    • H01L33/32
    • B23K26/00B23K26/40H01L23/00H01L33/0095H01L2924/0002H01L2924/00
    • A method of processing an optical device wafer having an optical device layer including an n-type semiconductor layer and a p-type semiconductor layer stacked over a sapphire substrate, a buffer layer therebetween, allowing peeling of the sapphire substrate. The method includes joining a transfer substrate to the optical device layer, breaking the buffer layer by irradiation with a pulsed laser beam from the sapphire substrate side of the wafer with the transfer substrate joined to the optical device layer, and peeling the sapphire substrate from the optical device wafer with the buffer layer broken, transferring the optical device layer onto the transfer substrate. The pulsed laser beam has a wavelength longer than an absorption edge of the sapphire substrate and shorter than an absorption edge of the buffer layer, and a pulse width set so that a thermal diffusion length will be not more than 200 nm.
    • 一种处理具有包括层叠在蓝宝石衬底上的n型半导体层和p型半导体层的光学器件层的光学器件晶片的方法,其间的缓冲层允许蓝宝石衬底的剥离。 该方法包括将转印衬底接合到光学器件层,通过用晶片的蓝宝石衬底侧的脉冲激光束照射缓冲层,转印衬底接合到光学器件层,并将蓝宝石衬底从 光学器件晶片,缓冲层破裂,将光学器件层转移到转印衬底上。 脉冲激光束具有比蓝宝石衬底的吸收边长长的波长,并且比缓冲层的吸收边短的脉冲宽度,并且设定为使热扩散长度不超过200nm的脉冲宽度。