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    • 68. 发明授权
    • Electromagnetic wave detection device
    • 电磁波检测装置
    • US08993967B2
    • 2015-03-31
    • US13583675
    • 2011-02-01
    • Yoichi KawadaTakashi YasudaHironori TakahashiToru Matsumoto
    • Yoichi KawadaTakashi YasudaHironori TakahashiToru Matsumoto
    • G01N21/35G01N21/3581G01N21/21
    • G01N21/3581G01N21/21G01N21/636
    • Probe light pulses output from a light source are input to an optical effect unit after the beam diameter is changed by a beam diameter changing optical system, the pulse front is tilted by a pulse front tilting unit, and the beam diameter is adjusted by a beam diameter adjusting optical system. To the optical effect unit, probe light pulses output from the beam diameter adjusting optical system are input, and an electromagnetic wave being an object to be detected is also input. Optical characteristics of the optical effect unit change due to propagation of the electromagnetic wave, and probe light pulses affected by the change in optical characteristics are output from the optical effect unit. The probe light pulses output from the optical effect unit are detected by a photodetector.
    • 在光束直径由光束直径变化光学系统改变后,从光源输出的探测光脉冲输入到光学效果单元,脉冲前端由脉冲前倾斜单元倾斜,光束直径由光束 直径调整光学系统。 输入光束直径调整光学系统输出的探测光脉冲到光学效果单元,并且还输入作为被检测物体的电磁波。 从光学效果单元输出由于电磁波的传播引起的光学效应单元的光学特性,以及受光学特性变化影响的探测光脉冲。 从光学效果单元输出的探测光脉冲由光电检测器检测。