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    • 63. 发明授权
    • Carrier for transferring plate-like objects one by one, a handling
apparatus for loading or unloading the carrier, and a wafer probing
machine fitted with the handling apparatus for the wafer carrier
    • 用于一个接一个地转移板状物体的载体,用于装载或卸载载体的处理装置,以及装配有用于晶片载体的处理装置的晶片探测机
    • US4901011A
    • 1990-02-13
    • US267375
    • 1988-11-04
    • Hisashi KoikeSumi Tanaka
    • Hisashi KoikeSumi Tanaka
    • G01R31/28H01L21/673H01L21/677
    • H01L21/67346G01R31/2851G01R31/2893H01L21/67778Y10S414/137
    • A carrier for transferring a semiconductor wafer one by one includes a tray portion to load the wafer thereon the wafer submitted for processing, the tray portion having a groove which is formed therein for unloading the wafer therefrom, and mechanism for positioning the tray portion relative to a predetermined location of the drawer. A handling apparatus for the carrier includes a sampling case mounted to the frame of a wafer probing machine and having formed therein a first opening communicating with the outside of the machine and a second opening communicating with the interior of the machine, a drawer adapted to go into and come out of the case through the first opening and plural pairs of guide-rollers to guide the drawer between the first and second openings of the case. To take a sample from among the wafers in the machine, the carrier is loaded on the drawer, the carrier held on the drawer is pushed through the second opening into the case, wafer is picked out by a full-automatic transferring apparatus from a wafer storage, the wafer is inserted through the second opening into the case, the wafer is placed on the carrier by guiding it through the groove of the carrier and the drawer is pulled out.
    • 用于一个接一个地转移半导体晶片的载体包括托盘部分,用于将晶片装载在其上用于处理的晶片上,托盘部分具有形成在其中的用于从其中卸载晶片的槽,以及用于相对于托盘部分定位托盘部分的机构 抽屉的预定位置。 用于载体的处理装置包括安装在晶片探测机的框架上的取样壳体,其中形成有与机器的外部连通的第一开口和与机器的内部连通的第二开口,适于移动的抽屉 通过第一开口和多对导向辊从外壳中进出并引导箱体的第一和第二开口之间的抽屉。 为了从机器中的晶片中取出样品,载体被装载在抽屉上,保持在抽屉上的载体被推入第二开口进入壳体,晶片由全自动转印装置从晶片 存储时,将晶片通过第二开口插入壳体中,通过将晶片引导通过载体的凹槽并将抽屉拉出来将晶片放置在载体上。
    • 65. 发明授权
    • Image reading apparatus, server apparatus, and image processing system
    • 图像读取装置,服务器装置和图像处理系统
    • US07933048B2
    • 2011-04-26
    • US11275737
    • 2006-01-26
    • Hisashi Koike
    • Hisashi Koike
    • H04N1/00
    • G06K9/00449G06K9/2054G06K2209/01
    • A control method of an image reading apparatus for transferring image information obtained by reading an original to a server apparatus has: a reading step of reading the original; a forming step of forming electronic data corresponding to the original read in the reading step; a designation step of designating an attribute of the original; a decision step of deciding a page whose electronic data is to be formed in the forming step in accordance with the designated original attribute; and a transmission step of transmitting the electronic data formed in the forming step to the server apparatus.
    • 用于将通过读取原稿获得的图像信息传送到服务器装置的图像读取装置的控制方法具有:读取原稿的读取步骤; 在读取步骤中形成对应于原稿读取的电子数据的形成步骤; 指定原件属性的指定步骤; 决定步骤,根据指定的原始属性,在形成步骤中决定要形成电子数据的页面; 以及将在形成步骤中形成的电子数据发送到服务器装置的发送步骤。
    • 68. 发明授权
    • Electric probing test machine
    • 电探测试机
    • US4950982A
    • 1990-08-21
    • US471696
    • 1990-01-26
    • Tadashi ObikaneHisashi KoikeSumi Tanaka
    • Tadashi ObikaneHisashi KoikeSumi Tanaka
    • G01R31/28H01L21/66
    • G01R31/2831
    • An electric probing test machine including a test stage unit which is constructed as an independent component of at least one system and used to test the electrical characteristics of a wafer by having the wafer on the stage contacted by a multitude of probes and a loading/unloading unit which is constructed as an independent component of at least one system and used to bring a wafer from a wafer cassette to the stage of the test stage unit or from the stage of the test stage unit to the wafer cassette. The loading/unloading unit is combined with the test stage unit in such a way that the loading/unloading unit can be separated and moved away from the test stage unit.
    • 一种电探测试验机,其包括测试台单元,其被构造为至少一个系统的独立部件,并且用于通过使晶片在与多个探针接触的台上并且装载/卸载来测试晶片的电特性 单元,其被构造为至少一个系统的独立部件,并用于将晶片从晶片盒带到测试台单元的阶段或从测试台单元的阶段到晶片盒。 加载/卸载单元与测试台单元结合,使得装载/卸载单元可以被分离并远离测试台单元移动。