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    • 52. 发明专利
    • A FERROELECTRIC DATA PROCESSING DEVICE
    • CA2301283A1
    • 1999-03-11
    • CA2301283
    • 1998-08-13
    • THIN FILM ELECTRONICS ASA
    • GUDESEN HANS GUDELEISTAD GEIRR INORDAL PER-ERIK
    • G11C11/22H01L21/8246H01L27/06H01L27/105H01L27/115H03K19/177H03K19/185
    • In a ferroelectric data-processing device for processing and/or storage of data with active or passive electrical addressing a data-carrying medium are used in the form of a thin film (1) of ferroelectric material which by an applied electric field is polarized to determined polarization states or switched therebetween and is provided as a continuous or patterned layer above and adjacent to electrode structures in the form of a matrix, the electrode structures being mutually isolated by an electrical isolating material (6). A logic element (4) is formed in the thin film (1) along the side edges of an y electrode (3) and down to the x electrode (2) at the overlap. The logic element (4) is addressed by applying to the electrodes (2,3) a voltage greater than the coercivity field of the ferroelectric material. Dependent on the polarization state and the form of the hysteresis loop of the ferroelectric material a distinct detection of the polarization state in the logic element (4) is obtained and it may also be; possible to switch between the polarization states of the logic element, which hence may be used for implementing a bistable switch or a memory cell. The data-processing device according to the invention may be stacked layerwise if the separate layers are separated by an electricalinsulating layer and hence be used for implementing volumetric data-processing devices.
    • 57. 发明专利
    • DK1364372T3
    • 2006-10-30
    • DK02700903
    • 2002-02-15
    • THIN FILM ELECTRONICS ASA
    • NORDAL PER-ERIKGUDESEN HANS GUDELEISTAD GEIRR I
    • G11C7/12G11C8/08G11C11/16G11C11/22G11C11/401
    • In a method for determining the logic state of memory cells in a passive matrix-addressable data storage device with word and bit lines, components of current response are detected and correlated with a probing voltage, and a time-dependent potential is applied on selected word and bit lines or groups thereof, said potentials being mutually coordinated in magnitude and time such that the resulting voltages across all or some of the non-addressed cells at the crossing points between inactive word lines and active bit lines are brought to contain only negligible voltage components that are temporally correlated with the probing voltage. A first apparatus according to the invention for performing the method provides sequential readout of all memory cells on an active word line (AWL) by means of detection circuits ( 3; 4 ). An active word line (AWL) is selected by a multiplexer ( 7 ), while inactive word lines (IWL) are clamped to ground during readout. A second apparatus for performing the method is rather similar, but has only a single detection circuit ( 3, 4 ). An active word line (AWL) is selected by multiplexer ( 7 ) and a bit line (ABL) is selected by a multiplexer ( 9 ) provided between one end of the bit lines (BL) and the input of the detection circuit ( 3, 4 ), while inactive word and bit lines (IWL; IBL) are clamped to ground during readout.