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51. 发明授权

US6066822A Semiconductor device testing apparatus and semiconductor device testing system having a plurality of semiconductor device testing apparatus 失效
标题翻译：具有多个半导体器件测试装置的半导体器件测试装置和半导体器件测试系统
公开(公告)号：US6066822A
公开(公告)日：2000-05-23
申请号：US809702
申请日：1997-03-27
申请人： Shin Nemoto , Yoshihito Kobayashi , Hiroo Nakamura , Takeshi Onishi , Hiroki Ikeda
发明人： Shin Nemoto , Yoshihito Kobayashi , Hiroo Nakamura , Takeshi Onishi , Hiroki Ikeda
IPC分类号： G01R31/26 , G01R31/28 , G01R31/319 , B07C5/344
CPC分类号： G01R31/31907 , G01R31/2834 , G01R31/2887 , G01R31/31912
摘要： A semiconductor device testing system is provided efficiently utilizes a plurality of semiconductor device testing apparatus. More particularly, a host computer controls a plurality of semiconductor device testing apparatuses and a dedicated classifying machine. A storage information memory stores storage information of each semiconductor device such as a number assigned to each tested semiconductor device such as a number assigned to each tested semiconductor device, the test results of each semiconductor device, and is provided in the host computer. Without sorting the tested devices or with the sorting operation of the tested devices into only two categories in a handler part of each testing apparatus, the tested devices are transferred from the test tray to a general-purpose tray, and during this transfer operation, the storage information of each device is stored in the storage information memory. When all of the tests are completed, the storage information of each device stored in the storage information memory is transmitted to the dedicated classifying machine by which the tested devices are sorted out.
摘要翻译： PCT No.PCT / JP96 / 02130 Sec。 371日期：1997年5月27日 102（e）日期1997年5月27日PCT提交1996年7月29日PCT公布。出版物WO97 / 05496 日期1997年2月13日提供半导体器件测试系统有效地利用多个半导体器件测试装置。更具体地，主计算机控制多个半导体器件测试装置和专用分选机。存储信息存储器存储每个半导体器件的存储信息，例如分配给每个测试的半导体器件的数量，例如分配给每个测试的半导体器件的数量，每个半导体器件的测试结果，并且设置在主计算机中。在每个测试设备的处理器部分中，如果不对被测试的设备进行分类或将被测试设备的分类操作分成两类，则测试设备从测试托盘传送到通用托盘，并且在该传送操作期间，每个设备的存储信息被存储在存储信息存储器中。当所有测试完成时，存储在存储信息存储器中的每个设备的存储信息被发送到专用分类机，通过该专用分类机对被测试的设备进行整理。

52. 发明授权

US5909657A Semiconductor device testing apparatus 失效
标题翻译：半导体器件测试仪器
公开(公告)号：US5909657A
公开(公告)日：1999-06-01
申请号：US867750
申请日：1997-06-03
申请人： Takeshi Onishi , Katsuhiko Suzuki
发明人： Takeshi Onishi , Katsuhiko Suzuki
IPC分类号： G01R31/28 , G01R31/3193 , G11C29/56 , G06F19/00
CPC分类号： G11C29/56 , G01R31/2834 , G01R31/31935
摘要： A semiconductor device testing apparatus in which ICs to be tested are loaded on a test tray in a loader section, the test tray is transported into a test section to test the ICs, after the completion of the test, the tested ICs on the test tray are transferred from the test tray onto a general-purpose tray in an unloader section, the test tray which has been emptied of the tested ICs is transported to the loader section, and the above operation is repeated, and which can detect a failure of an IC carrier mounted to the test tray independently of detection of a failure IC socket is provided. An IC carrier failure analysis memory is provided which has storage addresses the number of which is equal to the number of IC carriers mounted to each of the test trays, and the number of ICs as determined to be defective is stored and accumulated in each of the storage addresses of the IC carrier failure analysis memory. When the accumulated value exceeds a setting value, a decision is rendered that the associated IC carrier on which the ICs as determined to be defective have been loaded is defective.
摘要翻译：将要测试的IC装载在加载器部分的测试托盘上的半导体器件测试装置，将测试托盘运送到测试部分以测试IC，在测试完成之后，测试托盘上的测试IC 从试纸盘传送到卸载器部分的通用托盘中，已经将被测试的IC排空的测试托盘被运送到加载器部分，并重复上述操作，并且可以检测到提供安装在测试托架上的独立于故障IC插座的检测的IC载体。提供了IC载波故障分析存储器，其具有的数量等于安装到每个测试托盘的IC载波的数量的存储地址，并且被确定为有缺陷的IC的数量被存储并累积在每个存储地址的IC载波故障分析存储器。当累积值超过设定值时，作出判断为被确定为有缺陷的IC已经被加载的相关联的IC载体是有缺陷的。

53. 发明授权

US5788084A Automatic testing system and method for semiconductor devices 失效
标题翻译：半导体器件自动测试系统和方法
公开(公告)号：US5788084A
公开(公告)日：1998-08-04
申请号：US648060
申请日：1996-07-01
申请人： Takeshi Onishi , Tadashi Kainuma , Katsumi Kojima , Bannai Kuniaki , Tanaka Koichi , Yamada Naruhito
发明人： Takeshi Onishi , Tadashi Kainuma , Katsumi Kojima , Bannai Kuniaki , Tanaka Koichi , Yamada Naruhito
IPC分类号： G01R31/04 , G01R31/28 , B07C5/344
CPC分类号： G01R31/043 , G01R31/04 , G01R31/2893
摘要： An automatic testing system and method for inspecting the contact characteristics of the contact pins of each of sockets of an IC tester disposed in the testing zone of an IC handler in an automatic and efficient fashion prior to testing semiconductor devices under test is provided. A test device which is identical in shape to semiconductor devices to be tested and the electric characteristics of which are known is provided and is carried on a test tray and conveyed from the loader section to the testing zone where the test device is brought into contact with a socket to measure the contact characteristics of the socket. Upon completion of the measurement, the test device is transferred from the test tray to the customer tray, and the customer tray with the test device thereon is then temporarily stored in a tray storing means in the unloader section. Thereafter, the customer tray is conveyed to the loader section where the test device is transferred from the customer tray to the test tray. Then, the test tray with the test device thereon is conveyed from the loader section back to the test section. These procedures are repeated until all of the sockets in the test section are automatically checked for their contact characteristics.
摘要翻译： PCT No.PCT / JP95 / 01751 Sec。 371日期：1996年7月1日 102（e）日期1996年7月1日PCT提交1995年9月4日PCT公布。第WO96 / 09556号公报日期1996年3月28日在测试半导体器件被测试之前，自动测试系统和方法，用于以自动高效的方式检测IC处理器的测试区域中设置的IC测试器的每个插座的接触针的接触特性。被提供。提供了与被测试的半导体器件的形状相同的测试装置及其电气特性已知的测试装置，并且被携带在测试托盘上并从装载器部分传送到测试装置与测试装置接触的测试区域一个插座来测量插座的接触特性。测量完成后，将测试装置从测试盘传送到客户托盘，然后将其上具有测试装置的顾客托盘临时存储在卸载机部分中的托盘存放装置中。此后，客户托盘被传送到装载部分，其中测试装置从顾客托盘传送到测试托盘。然后，其上具有测试装置的测试托盘从装载器部分返回到测试部分。重复这些步骤，直到测试部分的所有插座自动检查其接触特性。

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