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51. 发明申请

US20130143229A1 REAGENT FOR ASSAYING ANTI-TREPONEMA PALLIDUM ANTIBODY 有权
标题翻译：用于测定抗真菌药物抗体的试剂
公开(公告)号：US20130143229A1
公开(公告)日：2013-06-06
申请号：US13638622
申请日：2011-03-31
申请人： Yasuyuki Hara , Tetsuya Ota , Michiko Kawamoto , Shinya Sato , Shigehisa Iwamoto , Tatsuro Shimaoka , Shigeo Sudo
发明人： Yasuyuki Hara , Tetsuya Ota , Michiko Kawamoto , Shinya Sato , Shigehisa Iwamoto , Tatsuro Shimaoka , Shigeo Sudo
IPC分类号： C07K14/20 , G01N33/68
CPC分类号： C07K14/20 , G01N33/545 , G01N33/571 , G01N33/6854 , G01N2333/20 , G01N2469/20
摘要： To provide a reagent for assaying anti-Treponema pallidum antibody which reagent contains a polypeptide antigen and which reagent provides high assay sensitivity and high specificity, and to provide an assay method employing the assay reagent.The reagent for assaying anti-Treponema pallidum antibody, for use in an assay of anti-Treponema pallidum antibody on the basis of antigen-antibody reaction is characterized in that the reagent contains, as an antigen, a recombinant polypeptide containing at least domain C and domain D of Treponema pallidum 47 kDa antigen but containing no domain A1 of the 47 kDa antigen.
摘要翻译：提供用于测定抗梅毒螺旋体抗体的试剂，该试剂含有多肽抗原，该试剂提供高测定灵敏度和高特异性，并提供使用测定试剂的测定方法。基于抗原 - 抗体反应用于测定抗梅毒螺旋体抗体的抗梅毒螺旋体抗体的试剂的特征在于，所述试剂含有至少含有结构域C和梅毒螺旋体47kDa抗原的结构域D，但不包含47kDa抗原的结构域A1。

52. 发明授权

US08414828B2 Ni-based corrosion resistant alloy and corrosion resistant member for supercritical ammonia reactor made of the alloy 有权
标题翻译： Ni合金耐腐蚀合金和超临界氨反应器耐腐蚀材料
公开(公告)号：US08414828B2
公开(公告)日：2013-04-09
申请号：US12064297
申请日：2006-08-22
申请人： Yoshihiko Yamamura , Shinya Sato , Shinichi Nishiya
发明人： Yoshihiko Yamamura , Shinya Sato , Shinichi Nishiya
IPC分类号： C22C19/05
CPC分类号： B01J3/008 , B01J19/02 , B01J2219/0236 , B01J2219/0277 , B01J2219/029 , C22C19/052 , C22C19/053 , C22C19/055 , C22C19/056 , Y02P20/544
摘要： A material is presented that exhibits excellent corrosion resistance to supercritical ammonia and is suitable for a supercritical ammonia reactor. An Ni-based corrosion resistant alloy includes from 15% or more to 50% or less by mass of Cr and any one or both of Mo and W, wherein a [(content of Mo)+0.5×(content of W)] is from 1.5% or more to 8.5% or less by mass, a value of 1.8×[% content of Cr]/{[% content of Mo]+0.5×[% content of W]} is from 3.0 or more to 70.0 or less and the balance is Ni and an unavoidable impurity. The alloy may be used to configure a supercritical ammonia reactor or the material is coated on a surface that contacts with a supercritical ammonia fluid. The alloy exhibits excellent corrosion resistance to supercritical ammonia and a mineralizer added the supercritical ammonia. The safety and reliability of an apparatus can be improved, the producing cost can be reduced, the apparatus lifetime can be extended and the running cost can be reduced.
摘要翻译：对超临界氨表现出优异的耐腐蚀性，适用于超临界氨反应器的材料。镍基耐腐蚀合金包含15质量％以上至50质量％以下的Cr和Mo和W中的任一种或两种，其中[（Mo含量）+ 0.5×（W含量）]为从1.5％以上至8.5％以下，1.8×[Cr含量％] [{Mo含量] + 0.5×[W含量％]的值为3.0以上〜70.0以上较少，平衡是Ni和不可避免的杂质。该合金可用于构造超临界氨反应器，或者该材料涂覆在与超临界氨流体接触的表面上。该合金对超临界氨表现出优异的耐腐蚀性，并且矿化剂加入超临界氨。可以提高设备的安全性和可靠性，可以降低生产成本，延长设备使用寿命，降低运行成本。

53. 发明授权

US08247841B2 Semiconductor device and method for manufacturing semiconductor device 有权
标题翻译：半导体装置及半导体装置的制造方法
公开(公告)号：US08247841B2
公开(公告)日：2012-08-21
申请号：US12627510
申请日：2009-11-30
申请人： Takayuki Saiki , Shinya Sato , Hiroyuki Takamiya
发明人： Takayuki Saiki , Shinya Sato , Hiroyuki Takamiya
IPC分类号： H01L29/66 , H01L21/00
CPC分类号： H01L25/0657 , H01L23/481 , H01L23/60 , H01L24/73 , H01L27/0266 , H01L2224/04042 , H01L2224/16225 , H01L2224/48227 , H01L2225/06513 , H01L2225/06527 , H01L2225/06541 , H01L2924/15311 , H01L2924/181 , H01L2924/00
摘要： A semiconductor device includes: a plurality of semiconductor substrates that are layered; a through electrode penetrating through a predetermined semiconductor substrate of the semiconductor substrates and electrically connected with an external terminal of the semiconductor device; a circuit element provided on the predetermined semiconductor substrate; and an electrostatic discharge protection circuit also provided on the predetermined semiconductor substrate. In the device, wiring resistance between the electrostatic discharge protection circuit and the through electrode is smaller than wiring resistance between the circuit element and the through electrode.
摘要翻译：半导体器件包括：层叠的多个半导体衬底; 穿透电极，穿过半导体衬底的预定半导体衬底并与半导体器件的外部端子电连接; 设置在所述预定半导体衬底上的电路元件; 以及也设置在预定半导体衬底上的静电放电保护电路。在该装置中，静电放电保护电路与贯通电极之间的布线电阻小于电路元件与贯通电极之间的布线电阻。

54. 发明授权

US08057927B2 Magnetic recording medium and information storage apparatus 失效
标题翻译：磁记录介质和信息存储装置
公开(公告)号：US08057927B2
公开(公告)日：2011-11-15
申请号：US12497819
申请日：2009-07-06
申请人： Satoshi Igarashi , Tohru Horie , Ryo Kurita , Isatake Kaitsu , Akira Kikuchi , Shinya Sato
发明人： Satoshi Igarashi , Tohru Horie , Ryo Kurita , Isatake Kaitsu , Akira Kikuchi , Shinya Sato
IPC分类号： G11B5/66
CPC分类号： G11B5/667 , G11B5/65 , G11B5/82
摘要： A magnetic recording medium includes a nonmagnetic granular layer that has a granular structure in which a plurality of nonmagnetic grains made of a nonmagnetic material are separated from one another by a Cr oxide. The magnetic recording medium further includes a magnetic granular layer that is formed on the nonmagnetic granular layer and has a granular structure in which a plurality of magnetic grains made of a magnetic material are separated from one another by a nonmagnetic material.
摘要翻译：磁记录介质包括具有颗粒结构的非磁性颗粒层，其中由非磁性材料制成的多个非磁性颗粒通过Cr氧化物彼此分离。磁记录介质还包括磁性颗粒层，其形成在非磁性颗粒层上，并且具有颗粒结构，其中由磁性材料制成的多个磁性颗粒通过非磁性材料彼此分离。

55. 发明授权

US07945826B2 Test apparatus and test method 有权
标题翻译：试验装置及试验方法
公开(公告)号：US07945826B2
公开(公告)日：2011-05-17
申请号：US12487615
申请日：2009-06-18
申请人： Satoshi Kameda , Masaru Doi , Shinya Sato
发明人： Satoshi Kameda , Masaru Doi , Shinya Sato
IPC分类号： G11C29/00
CPC分类号： G11C29/56 , G06F11/1068 , G11C29/56008 , G11C2029/5606
摘要： Provided is a test apparatus having a bad block memory for storing a plurality of pieces of fail information in association with blocks of a memory under test, each piece of fail information indicating whether there is a defect in the associated block. The test apparatus writes a test data sequence to a page under test of the memory under test, reads the test data sequence written to the page under test, and compares the read data sequence to the written data sequence. The test apparatus includes an allocation register that stores allocation information for setting which of the plurality of fail conditions for judging whether there is a defect in the page under test are allocated to the plurality of pieces of fail information. The test apparatus detects whether there is a defect corresponding to each of a plurality of fail conditions, outputs the detection result as a fail signal, and updates a plurality of pieces of fail information associated with the block including the page under test using the fail signal corresponding to the allocated fail conditions.
摘要翻译：提供一种具有坏块存储器的测试装置，用于与被测存储器的块相关联地存储多条故障信息，每条失败信息指示相关块中是否存在缺陷。测试装置将测试数据序列写入正在测试的存储器的被测页面，读取写入被测页面的测试数据序列，并将读取的数据序列与写入的数据序列进行比较。该测试装置包括一个分配寄存器，该分配寄存器存储分配信息，用于设置用于判断被测页面中是否存在缺陷的多个故障条件中的哪一个被分配给多个故障信息。测试装置检测是否存在与多个故障条件中的每一个相对应的缺陷，将检测结果输出为故障信号，并使用故障信号更新与包括被测页的块相关联的多条故障信息对应于分配的失败条件。

56. 发明授权

US07930614B2 Test apparatus and test method 有权
标题翻译：试验装置及试验方法
公开(公告)号：US07930614B2
公开(公告)日：2011-04-19
申请号：US11714071
申请日：2007-03-05
申请人： Shinya Sato
发明人： Shinya Sato
IPC分类号： H03M13/00
CPC分类号： G11C29/42 , G11C29/44
摘要： A test apparatus is provided for testing memory under test which stores a data string including an error correction code in the form of additional data. The test apparatus comprises: a logic comparator which compares each of the data sets included in a data string read out from the memory under test with a corresponding anticipated value created beforehand; a data error count unit which counts the number of data sets that do not match the respective anticipated values; and a defect detection unit which provides a function whereby, in a case that the count value counted by the error count unit exceeds a predetermined upper limit number which is equal to or greater than 1, determination is made that the memory under test is defective.
摘要翻译：提供一种测试装置，用于测试测试存储器，该存储器以附加数据的形式存储包括纠错码的数据串。测试装置包括：逻辑比较器，将包括在从被测存储器读出的数据串中的每个数据集与预先创建的对应的预期值进行比较; 数据错误计数单元，其计数与各个预期值不匹配的数据集的数量; 以及缺陷检测单元，其提供如下功能：在由误差计数单元计数的计数值超过等于或大于1的预定上限值的情况下，确定被测存储器有缺陷。

57. 发明授权

US07679372B2 Test apparatus 有权
标题翻译：测试仪器
公开(公告)号：US07679372B2
公开(公告)日：2010-03-16
申请号：US11945276
申请日：2007-11-27
申请人： Yasushi Kurihara , Shinya Sato
发明人： Yasushi Kurihara , Shinya Sato
IPC分类号： G01R31/00
CPC分类号： G01R31/31924 , G01R31/31926 , G11C29/56 , G11C29/56004 , G11C2029/5602
摘要： A driver for supplying a test signal to a device under test is shared by a plurality of terminals. In this way, the cost and time required for the test of the device under test can be reduced.A testing apparatus 10 relating to the present invention includes a test signal generating section 130 that generates a test signal to be supplied to a device under test 20, a driver 140 that outputs the test signal, a switch 150 that is disposed on a wire between the driver 140 and a first terminal of the device under test 20, a switch 160 that is disposed on a wire between the driver 140 and a second terminal of the device under test 20, and a connection control section 100 that (i) turns on the switch 150 and turns off the switch 160 when the test signal is supplied to the first terminal of the device under test 20, and (ii) turns off the switch 150 and turns on the switch 160 when the test signal is supplied to the second terminal of the device under test 20.
摘要翻译：用于向被测设备提供测试信号的驱动器由多个终端共享。以这种方式，可以减少被测设备的测试所需的成本和时间。本发明的测试装置10包括测试信号产生部分130，该测试信号产生部分130产生要提供给测试装置20的测试信号，输出测试信号的驱动器140，设置在线路上的开关150 驱动器140和被测器件20的第一端子，设置在驱动器140和被测器件20的第二端子之间的导线上的开关160以及（i）接通的连接控制部100 当测试信号被提供给被测器件20的第一端子时，开关150断开开关160，并且（ii）当测试信号被提供给第二个时，关断开关150并接通开关160 被测设备的终端20。

58. 发明申请

US20090145114A1 EXHAUST EMISSION CONTROL DEVICE 审中-公开
标题翻译：排气排放控制装置
公开(公告)号：US20090145114A1
公开(公告)日：2009-06-11
申请号：US11719373
申请日：2005-11-17
申请人： Shinya Sato , Takatoshi Furukawa
发明人： Shinya Sato , Takatoshi Furukawa
IPC分类号： F01N9/00
CPC分类号： C01C1/086 , B01D53/9431 , B01D2251/2062 , B01D2251/2067 , B01D2259/12 , B01D2259/818 , B01J2219/00006 , B01J2219/0894 , F01N3/2066 , F01N3/36 , F01N2240/25 , F01N2240/28 , F01N2610/02 , F01N2610/06 , F01N2610/14 , F02B37/00 , Y02A50/2325 , Y02T10/24
摘要： Even in a vehicle with travel pattern of continuing operational status with low exhaust temperature, a satisfactory NOx reduction effect can be attained even at exhaust temperature lower than that required conventionally therefor.In an exhaust emission control device with selective reduction catalyst 10 incorporated in an exhaust pipe 9, ammonia being added upstream of the catalyst 10 for reduction and purification of NOx, the device comprises an ammonia generator 12 with a vessel 15 for holding urea water 23a and with an electrode 16 for generation of ammonia 13a, 13b through action of plasma on the urea water 23a in the vessel, the ammonia 13a, 13b generated in the generator 12 being fed upstream of the catalyst 10.
摘要翻译：即使在具有低排气温度的持续运行状态的行驶模式的车辆中，即使在低于通常情况下的排气温度下也能够获得令人满意的NOx还原效果。在具有结合在排气管9中的选择还原催化剂10的废气排放控制装置中，在催化剂10上游添加氨以还原和净化NOx，该装置包括氨发生器12，其具有用于容纳尿素水23a的容器15和具有通过等离子体在容器中的尿素水23a上产生氨13a，13b的电极16，在发生器12中产生的氨13a，13b被供给到催化剂10的上游。

59. 发明申请

US20090110961A1 MAGNETIC RECORDING MEDIUM, METHOD OF MANUFACTURING THE SAME, AND MAGNETIC STORAGE DEVICE 审中-公开
标题翻译：磁记录介质，其制造方法和磁存储装置
公开(公告)号：US20090110961A1
公开(公告)日：2009-04-30
申请号：US12260431
申请日：2008-10-29
申请人： Hisato Shibata , Hideaki Takahoshi , Shinya Sato , Isatake Kaitsu , Akira Kikuchi
发明人： Hisato Shibata , Hideaki Takahoshi , Shinya Sato , Isatake Kaitsu , Akira Kikuchi
IPC分类号： G11B5/62
CPC分类号： G11B5/66 , G11B5/65
摘要： A magnetic recording medium used for a hard disc drive and the like, a method of manufacturing the same, and a magnetic storage device. The magnetic recording medium that includes a substrate, a first ferromagnetic layer formed on the substrate, a non-magnetic layer formed on the first ferromagnetic layer and including a ferromagnetic element and a second ferromagnetic layer formed on the non-magnetic layer, wherein the first ferromagnetic layer and the second ferromagnetic layer are magnetically coupled through the non-magnetic layer.
摘要翻译：用于硬盘驱动器等的磁记录介质，其制造方法和磁存储装置。磁记录介质包括基板，形成在基板上的第一铁磁层，形成在第一铁磁层上的非磁性层，并且包括铁磁元件和形成在非磁性层上的第二铁磁层，其中第一铁磁层和第二铁磁层通过非磁性层磁耦合。

60. 发明授权

US07359822B2 Testing device 有权
标题翻译：测试装置
公开(公告)号：US07359822B2
公开(公告)日：2008-04-15
申请号：US11196020
申请日：2005-08-03
申请人： Yuichi Fujiwara , Shinya Sato
发明人： Yuichi Fujiwara , Shinya Sato
IPC分类号： G06F19/00
CPC分类号： G11C29/56 , G11C16/04
摘要： A testing device that tests an electronic device includes a test pattern outputting unit operable to output a test pattern to the electronic device, a deciding unit operable to decide whether an output signal from the electronic device satisfies a predetermined condition, an instruction storing unit operable to store a plurality of instruction codes, a first instruction pipeline operable to generate a condition satisfaction instruction stream including a plurality of instructions that causes the test pattern outputting unit to output the test pattern to be supplied to the electronic device when the output signal satisfies the condition based on the plurality of instruction codes, a second instruction pipeline operable to generate a condition non-satisfaction instruction stream including a plurality of instructions that causes the test pattern outputting unit to output the test pattern to be supplied to the electronic device when the output signal does not satisfy the condition based on the plurality of instruction codes, and a selection unit operable to select which of the condition satisfaction instruction stream or the condition non-satisfaction instruction stream is supplied to the test pattern outputting unit based on the result decided by the deciding unit.
摘要翻译：测试电子设备的测试设备包括：测试模式输出单元，用于向电子设备输出测试模式;判定单元，用于判断来自电子设备的输出信号是否满足预定条件;指令存储单元，存储多个指令代码;第一指令流水线，其可操作以产生条件满足指令流，所述条件满足指令流包括多个指令，当所述输出信号满足所述条件时，使所述测试图案输出单元输出要提供给所述电子设备的测试图案基于所述多个指令代码，第二指令流水线，其可操作以产生条件不满足指令流，所述条件不满足指令流包括多个指令，所述多个指令使得所述测试图案输出单元输出所述要提供给所述电子设备的所述测试图案，不符合条件的所述多个指令代码，以及选择单元，用于根据由所述判定单元确定的结果，选择所述条件满足指令流或所述条件不满足指令流中的哪一个被提供给所述测试图案输出单元。

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