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    • 51. 发明申请
    • Pyrazole derivatives and process for the production thereof
    • 吡唑衍生物及其制备方法
    • US20050215797A1
    • 2005-09-29
    • US10521593
    • 2003-07-31
    • Masao NakataniMinoru ItoMasahiro Miyazaki
    • Masao NakataniMinoru ItoMasahiro Miyazaki
    • C07D231/20C07D231/22A61K31/4152C07D231/18
    • C07D231/20C07D231/22
    • The present invention provides pyrazole derivatives useful as production intermediates for isoxazoline derivatives having an excellent herbicidal effect and selectivity between crops and weeds as well as processes for producing the same. The pyrazole derivatives or pharmaceutically acceptable salts thereof which are inventive compounds are represented by the general formula [I] or a salt thereof: wherein R1 represents a C1 to C6 alkyl group, R2 represents a C1 to C3 haloalkyl group, R3 represents a hydrogen atom, a C1 to C3 alkyl group which may be substituted with one or more substituents selected from the following substituent group α, or a formyl group, R4 represents a hydrogen atom or a C1 to C3 haloalkyl group, provided that R4 represents a C1 to C3 haloalkyl group in the case that R3 is a hydrogen or a formyl group, and R4 is a hydrogen group or a C1 to C3 haloalkyl group in the case that R3 is a C1 to C3 alkyl group which may be substituted with one or more substituents selected from the following substituent group α.
    • 本发明提供了可用作具有优异的除草效果和作物和杂草之间的选择性的异恶唑啉衍生物的生产中间体的吡唑衍生物及其制备方法。 作为本发明化合物的吡唑衍生物或其药学上可接受的盐由通式[I]或其盐表示:其中R 1表示C 1至C 6烷基,R 2, / SUP>表示C1至C3卤代烷基,R 3表示氢原子,可被一个或多个选自以下取代基组α的取代基取代的C1至C3烷基,或 甲酰基,R 4表示氢原子或C 1至C 3卤代烷基,条件是R 4表示C 1至C 3卤代烷基, 3是氢或甲酰基,R 4是氢或C1至C3卤代烷基,在R 3是C1的情况下 可以被一个或多个选自以下取代基组α的取代基取代的C 3烷基。
    • 52. 发明授权
    • Signal transfer circuit
    • US06646471B2
    • 2003-11-11
    • US10075392
    • 2002-02-15
    • Minoru Ito
    • Minoru Ito
    • H03K19094
    • H03K19/01855
    • A transmission side circuit and a reception side circuit are connected to each other via a signal transfer path. An output transistor of the transmission side circuit has an open drain type structure, and the reception side circuit is provided with a reception transistor that is connected to the signal transfer path. There are provided a precharge transistor for supplying a voltage to a node extending from the reception transistor to an internal circuit, and a selector circuit connected to the gate of the reception transistor. The selector circuit receives a bias voltage Vbi and a ground voltage Vss, and switches the voltage to be applied to the gate of the reception transistor between the bias voltage Vbi and the ground voltage Vss according to the mode switching signal Smd. It is possible to suppress the voltage amplitude of a signal along the signal transfer path, and thus to reduce the electromagnetic interference occurring along the signal transfer path.
    • 53. 发明授权
    • Method for manufacturing semiconductor circuit
    • 制造半导体电路的方法
    • US06596612B2
    • 2003-07-22
    • US10085107
    • 2002-03-01
    • Minoru ItoTakafumi NakamuraMasanori Harada
    • Minoru ItoTakafumi NakamuraMasanori Harada
    • H01L2120
    • H01L21/02686H01L21/02532H01L21/2026H01L29/66757H01L29/78675H01L29/78696
    • An object of the present invention is to provide with a method for manufacturing a semiconductor circuit by which a TFT including particles having a different threshold value is prevented from being operated even if such a TFT is locally formed. According to the present invention, after forming an amorphous silicon layer on a glass substrate, heat treatment and the like is performed to convert the amorphous silicon layer into a polycrystalline silicon layer. At this time, a particle having an abnormal grain diameter is generated in a polycrystalline silicon layer under the influence of foreign particles in a glass substrate, and a TFT having a different threshold value may be possibly formed. In this case, when the particle having an abnormal grain diameter is irradiated with a laser beam to be turned into a granule and a high resistance is given therearound, the TFT having a different threshold value is prevented from being operated, and a leak current does not flow during the off state of the original TFT, thereby improving the display characteristic.
    • 本发明的目的是提供一种用于制造半导体电路的方法,即使局部形成这样的TFT,也可以防止包含具有不同阈值的颗粒的TFT被运行。根据本发明,在成形 进行玻璃基板上的非晶硅层,热处理等,将非晶硅层转换为多晶硅层。 此时,在玻璃基板中的异物的影响下,在多晶硅层中产生具有异常晶粒直径的粒子,并且可能形成具有不同阈值的TFT。 在这种情况下,当用激光束照射具有异常晶粒直径的颗粒成为颗粒并且在其周围提供高电阻时,防止具有不同阈值的TFT被操作,并且泄漏电流 在原始TFT的关闭状态期间不流动,从而提高显示特性。
    • 56. 发明授权
    • Gas flow monitoring system
    • 气体流量监测系统
    • US08826935B2
    • 2014-09-09
    • US13602719
    • 2012-09-04
    • Akiko NakadaYoji MoriNaoya ShiroyamaMinoru Ito
    • Akiko NakadaYoji MoriNaoya ShiroyamaMinoru Ito
    • F16K31/02G05D7/06G01F1/00
    • G05D7/0635G01F1/00Y10T137/7759Y10T137/7761Y10T137/87917
    • A gas flow monitoring system is provided in process gas lines each arranged to supply gas to a predetermined process chamber via a flow control device, the system being configured to measure lowering or rising of gas pressure before and after the flow control device to monitor a flow rate of the flow control device. The system includes a first flow monitoring unit placed upstream of the flow control device in a selected one of the process gas lines, a second flow monitoring unit placed in a discharge passage upstream of the process chamber, and a controller that constantly monitors the flow rate of the flow control device with the first flow monitoring unit and, when the first flow monitoring unit detects the flow-rate abnormality two or more times, commands the second flow monitoring unit to re-verify whether flow-rate abnormality is present or not in the flow control device.
    • 气体流量监测系统设置在处理气体管线中,每个气体管线布置成经由流量控制装置将气体供应到预定的处理室,该系统被配置为测量流量控制装置之前和之后的气体压力的下降或上升以监测流量 流量控制装置的速率。 该系统包括:第一流量监测单元,其位于处理气体管线中所选择的一个流量控制装置的上游,放置在处理室上游的排放通道中的第二流量监测单元,以及不断监测流量的控制器 的流量控制装置,并且当第一流量监视单元检测到流量异常两次以上时,命令第二流量监视单元重新验证流量异常是否存在于 流量控制装置。
    • 58. 发明授权
    • Semiconductor integrated circuit apparatus and electronic apparatus
    • 半导体集成电路装置及电子设备
    • US07994842B2
    • 2011-08-09
    • US12482044
    • 2009-06-10
    • Minoru Ito
    • Minoru Ito
    • H01J19/82H02M7/00
    • H03K19/00384
    • Semiconductor integrated circuit apparatus and electronic apparatus having a leakage current detection circuit where arbitrarily set leakage current detection ratio does not depend on power supply voltage, temperature, or manufacturing variations, and where leakage current detection is straightforward. Semiconductor integrated circuit apparatus extracts a stable potential from the center of two NchMIS transistors, amplifies drain current of an NchMOS transistor taking this potential as a gate potential to a current value of an arbitrary ratio using current mirror circuit, makes this current value flow through NchMOS transistor with the gate and drain connected, and applies drain potential of this NchMOS transistor to the gate of leakage current detection NchMOS transistor.
    • 具有泄漏电流检测电路的半导体集成电路装置和电子设备,其中任意设置的漏电流检测率不依赖于电源电压,温度或制造变化,并且其中泄漏电流检测是直接的。 半导体集成电路装置从两个NchMIS晶体管的中心提取稳定电位,使用电流镜电路将NchMOS晶体管的漏极电流放大到任意比例的电流值,使该电位作为栅极电位,使该电流值流过NchMOS 晶体管与栅极和漏极连接,并将NchMOS晶体管的漏极电压施加到漏电流检测NchMOS晶体管的栅极。