会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 53. 发明授权
    • Devices and methods for measurements of barrier properties of coating arrays
    • 用于测量涂层阵列阻隔性能的装置和方法
    • US06383815B1
    • 2002-05-07
    • US09681432
    • 2001-04-04
    • Radislav Alexandrovich Potyrailo
    • Radislav Alexandrovich Potyrailo
    • G01N2164
    • G01N21/7703
    • Methods and devices are disclosed for measuring barrier properties of a barrier coating or coating arrays where each barrier coating has a small cross section. To reduce the edge effects in the measurements of barrier properties, measurements are made using a waveguide structure that includes at least one waveguide coated with a chemically sensitive layer and an array of barrier coatings. The coated waveguide is exposed to a material of interest that has the ability to produce an analyzable variation in the chemically sensitive layer, thereby providing the ability to detect an impact of the material of interest on the barrier coatings. In one variation, an initial light wave is propagated within the waveguide structure, a resulting wave associated with the initial wave and each barrier coating is detected, and any impacts on the coatings by the material of interest are correlated to a value of a barrier property for each of the array of barrier coatings.
    • 公开了用于测量阻挡涂层或涂层阵列的阻挡性能的方法和装置,其中每个阻挡涂层具有小的横截面。 为了减少阻挡特性的测量中的边缘效应,使用波导结构进行测量,波导结构包括至少一个涂覆有化学敏感层的波导管和阻挡涂层阵列。 涂覆的波导暴露于感兴趣的材料,其具有在化学敏感层中产生可分析变化的能力,从而提供检测感兴趣的材料对阻挡涂层的影响的能力。 在一个变型中,初始光波在波导结构内传播,检测到与初始波和每个阻挡涂层相关联的所得波,并且感兴趣的材料对涂层的任何影响与屏障性质的值相关 对于每个屏障涂层阵列。
    • 54. 发明授权
    • Method and system for improved wireless sensing
    • 无线传感技术的改进方法和系统
    • US09195925B2
    • 2015-11-24
    • US13558499
    • 2012-07-26
    • Radislav Alexandrovich PotyrailoIan James Forster
    • Radislav Alexandrovich PotyrailoIan James Forster
    • H04Q5/22G01R27/00G06K19/07G01N33/00G01N27/02
    • G06K19/0716G01N27/026G01N33/0073
    • In one embodiment, a RF sensor comprising a sensing antenna and a reference antenna, wherein a sensing material is disposed upon said sensing antenna and wherein the sensing antenna is configured to test for specific analyte by measurement of the resonant impedance spectra, and the reference antenna is configured to mitigate and correct for environmental parameters and positionn. In a further embodiment, a method for sensing comprising; utilizing an RF sensor, wherein the RF sensor comprises a sensing antenna and a reference antenna, wherein said RF sensor is configured to test for a specific analyte; and, measuring a resonant impedance spectra of the sensing antenna and reference antennaat multiple frequencies to provide a subsequent multivariate analysis of a signal response from the RF sensor.
    • 在一个实施例中,包括感测天线和参考天线的RF传感器,其中感测材料设置在所述感测天线上,并且其中感测天线被配置为通过测量谐振阻抗谱测试特定分析物,并且参考天线 被配置为减轻和纠正环境参数和位置。 在另一实施例中,一种感测方法,包括: 利用RF传感器,其中所述RF传感器包括感测天线和参考天线,其中所述RF传感器被配置为测试特定分析物; 并且测量感测天线和参考天线的多个频率的谐振阻抗谱,以提供来自RF传感器的信号响应的后续多变量分析。
    • 56. 发明授权
    • Methods and systems for calibration of RFID sensors
    • RFID传感器校准方法和系统
    • US07911345B2
    • 2011-03-22
    • US12118950
    • 2008-05-12
    • Radislav Alexandrovich PotyrailoWilliam Guy Morris
    • Radislav Alexandrovich PotyrailoWilliam Guy Morris
    • G08B13/00
    • G06K19/0723G01N33/0006G01N33/0073G06K7/0095G06K19/0716
    • Methods and systems for calibration of RFID sensors used in manufacturing and monitoring systems are provided. The methods include measuring impedance of an RFID sensor antenna, relating the measurement of impedance to one or more parameters (such as physical, chemical and biological properties), computing one or more analytical fit coefficients, and storing the one or more analytical fit coefficients on a memory chip of the RFID sensor. Measuring impedance of the RFID sensor may comprise measuring complex impedance which involves measuring complex impedance spectrum, phase angle and magnitude of the impedance, at least one of frequency of the maximum of the real part of the complex impedance, magnitude of the real part of the complex impedance, zero-reactance frequency, resonant frequency of the imaginary part of the complex impedance, and antiresonant frequency of the imaginary part of the complex impedance. Also provided are manufacturing or monitoring systems comprised of an RFID sensor wherein the RFID sensor comprises, a memory chip, an antenna, and a sensing film wherein analytical fit coefficients are stored on the memory chip to allow calibration of the RFID sensor. Also provided are manufacturing or monitoring systems comprised of an RFID sensor wherein the RFID sensor comprises, a memory chip, an antenna, and a complementary sensor attached to the antenna where the complementary sensor in a pre-calibrated fashion predictably affects the impedance of the antenna.
    • 提供了用于制造和监控系统中使用的RFID传感器校准的方法和系统。 所述方法包括测量RFID传感器天线的阻抗,将阻抗测量与一个或多个参数(诸如物理,化学和生物特性)相关联,计算一个或多个分析拟合系数,以及将一个或多个分析拟合系数存储在 RFID传感器的存储芯片。 RFID传感器的测量阻抗可以包括测量复阻抗,其包括测量复阻抗谱,阻抗的相位角和幅度,复阻抗的实部的最大值的频率中的至少一个, 复阻抗,零电抗频率,复阻抗的虚部的谐振频率以及复阻抗的虚部的反谐振频率。 还提供了包括RFID传感器的制造或监控系统,其中RFID传感器包括存储器芯片天线和感测膜,其中分析拟合系数存储在存储器芯片上以允许RFID传感器的校准。 还提供了由RFID传感器组成的制造或监测系统,其中RFID传感器包括存储芯片天线和附接到天线的互补传感器,其中预校准方式的互补传感器可预测地影响天线的阻抗 。